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Applications of a mechanistic yield model for MOSIC chips

[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems, 1991, p.60-62

Drum, C.M.

1991

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Electron Microscopy of Dislocations and Other Defects in Sapphire and in Silicon Carbide, Thinned by Sputtering

physica status solidi (b), 1965, Vol.9 (2), p.635-642

Drum, C. M.

1965

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Ion-implantation-damage gettering effect in silicon photodiode array camera target

Applied physics letters, 1973-01, Vol.22 (5), p.238-240

1973

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Correlation of quantitative computed tomographic subchondral bone density and ash density in horses

Bone (New York, N.Y.), 2009-02, Vol.44 (2), p.316-319

2009

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Comparison of mean bone densities of three preparations of the distal portion of the equine third metacarpal bone measured by use of quantitative computed tomography

American journal of veterinary research, 2008-07, Vol.69 (7), p.891-893

2008

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Applications of a mechanistic yield model for MOSIC chips

Electron Microscopy of Dislocations and Other Defects in Sapphire and in Silicon Carbide, Thinned by Sputtering

Ion-implantation-damage gettering effect in silicon photodiode array camera target

Correlation of quantitative computed tomographic subchondral bone density and ash density in horses

Comparison of mean bone densities of three preparations of the distal portion of the equine third metacarpal bone measured by use of quantitative computed tomography

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