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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Review of scientific instruments, 2012-10, Vol.83 (10), p.103105-103105

2012

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In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements

Review of scientific instruments, 2019-07, Vol.90 (7)

2019

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High energy resolution off-resonant spectroscopy for x-ray absorption spectra free of self-absorption effects

Physical review letters, 2014-05, Vol.112 (17), p.173003-173003, Article 173003

2014

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A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV

Review of scientific instruments, 2019-06, Vol.90 (6)

2019

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High-resolution Laue-type DuMond curved crystal spectrometer

Review of scientific instruments, 2013-09, Vol.84 (9), p.093104-093104

2013

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Distribution of aluminum over different T-sites in ferrierite zeolites studied with aluminum valence to core X-ray emission spectroscopy

Physical chemistry chemical physics : PCCP, 2017, Vol.19 (43), p.29271-29277

2017

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Cross section ratios of double-to-single K-shell ionization induced by electron impact in metallic Sc, Cr and Cu targets

Journal of electron spectroscopy and related phenomena, 2019-05, Vol.233, p.11-21

2019

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Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

Review of scientific instruments, 2014-04, Vol.85 (4), p.043101

2014

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Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

Journal of synchrotron radiation, 2010-05, Vol.17 (3), p.400-408

2010

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Physical mechanisms and scaling laws of K-shell double photoionization

Physical review letters, 2009-02, Vol.102 (7), p.073006-073006, Article 073006

2009

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Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Spectrochimica acta. Part B: Atomic spectroscopy, 2014-08, Vol.98, p.65-75

2014

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Experimental determination of the x-ray atomic fundamental parameters of nickel

Metrologia, 2018-02, Vol.55 (1), p.56-66

2018

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First observation of two-electron one-photon transitions in single-photon K-shell double ionization

Physical review letters, 2011-07, Vol.107 (5), p.053001-053001, Article 053001

2011

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Photoinduced K-shell hollow atoms

Journal of electron spectroscopy and related phenomena, 2013-06, Vol.188, p.62-70

2013

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Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

Journal of analytical atomic spectrometry, 2012-01, Vol.27 (9), p.1432-1438

2012

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High-energy-resolution grazing emission X-ray fluorescence applied to the characterization of thin Al films on Si

Spectrochimica acta. Part B: Atomic spectroscopy, 2013-10, Vol.88, p.136-149

2013

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Performance of a Ge-microstrip imaging detector and polarimeter

Review of scientific instruments, 2008-08, Vol.79 (8), p.083101-083101-8

2008

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Vacuum ultraviolet excitation luminescence spectroscopy of few-layered MoS 2

Journal of physics. Condensed matter, 2016-01, Vol.28 (1), p.15301

2016

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Communication: The electronic structure of matter probed with a single femtosecond hard x-ray pulse

Structural dynamics (Melville, N.Y.), 2014-03, Vol.1 (2), p.021101-021101

2014

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Two-photon absorption using off-resonant excitation with ultrashort X-ray pulses

Journal of physics. Conference series, 2015-09, Vol.635 (9), p.92147

2015

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X-ray two-photon absorption with high fluence XFEL pulses

Journal of physics. Conference series, 2015-09, Vol.635 (10), p.102009

2015

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Depth profiles of Al impurities implanted in Si wafers determined by means of the high-resolution grazing emission X-ray fluorescence technique

Spectrochimica acta. Part B: Atomic spectroscopy, 2010-06, Vol.65 (6), p.445-449

2010

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High energy resolution measurements of the radiative decay of double K-shell vacancies in 20 ≤ Z ≤ 29 elements bombarded by fast C and Ne ions

Journal of physics. Conference series, 2015-09, Vol.635 (2), p.22054

2015

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Depth profiling of dopants implanted in Si using the synchrotron radiation based high-resolution grazing emission technique

X-ray spectrometry, 2012-03, Vol.41 (2), p.98-104

2012

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High-resolution study of x-ray resonant Raman scattering at the K edge of silicon

Physical review letters, 2006-08, Vol.97 (7), p.073001-073001, Article 073001

2006

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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements

High energy resolution off-resonant spectroscopy for x-ray absorption spectra free of self-absorption effects

A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV

High-resolution Laue-type DuMond curved crystal spectrometer

Distribution of aluminum over different T-sites in ferrierite zeolites studied with aluminum valence to core X-ray emission spectroscopy

Cross section ratios of double-to-single K-shell ionization induced by electron impact in metallic Sc, Cr and Cu targets

Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

Physical mechanisms and scaling laws of K-shell double photoionization

Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Experimental determination of the x-ray atomic fundamental parameters of nickel

First observation of two-electron one-photon transitions in single-photon K-shell double ionization

Photoinduced K-shell hollow atoms

Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

High-energy-resolution grazing emission X-ray fluorescence applied to the characterization of thin Al films on Si

Performance of a Ge-microstrip imaging detector and polarimeter

Vacuum ultraviolet excitation luminescence spectroscopy of few-layered MoS 2

Communication: The electronic structure of matter probed with a single femtosecond hard x-ray pulse

Two-photon absorption using off-resonant excitation with ultrashort X-ray pulses

X-ray two-photon absorption with high fluence XFEL pulses

Depth profiles of Al impurities implanted in Si wafers determined by means of the high-resolution grazing emission X-ray fluorescence technique

High energy resolution measurements of the radiative decay of double K-shell vacancies in 20 ≤ Z ≤ 29 elements bombarded by fast C and Ne ions

Depth profiling of dopants implanted in Si using the synchrotron radiation based high-resolution grazing emission technique

High-resolution study of x-ray resonant Raman scattering at the K edge of silicon

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