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Microelectronics and reliability, 2012-03, Vol.52 (3), p.489-496
2012
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1750-1754
2013
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IEEE journal of solid-state circuits, 2001-09, Vol.36 (9), p.1373-1381
2001
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Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1943-1947
2011
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Microelectronics and reliability, 2005-09, Vol.45 (9), p.1717-1722
2005
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2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2010, p.265-268
2010
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Microelectronics and reliability, 2009-09, Vol.49 (9), p.1341-1345
2009
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Microelectronics and reliability, 1998-06, Vol.38 (6), p.1353-1359
1998
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2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2007, p.86-89
2007
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Microelectronics and reliability, 2002-07, Vol.42 (7), p.1053-1058
2002
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IEEE journal of solid-state circuits, 1999-09, Vol.34 (9), p.1283-1289
1999
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IEEE transactions on electron devices, 1987-05, Vol.34 (5), p.1147-1156
1987
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Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545), 2004, p.111-116
2004
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Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 1996, p.81-88
1996
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2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC), 2007, p.141-144
2007
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EuroSimE 2005. Proceedings of the 6th International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005, 2005, p.390-393
2005
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International journal of heat and mass transfer, 1993, Vol.36 (9), p.2317-2326
1993
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2012 28th International Conference on Microelectronics Proceedings, 2012, p.251-254
2012
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2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2011, p.1/6-6/6
2011
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Microelectronics, 2000-10, Vol.31 (9-10), p.747-752
2000
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IEEE transactions on electron devices, 1985-03, Vol.32 (3), p.594-598
1985
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Solid-state electronics, 1981-01, Vol.24 (9), p.821-825
1981
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5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the, 2004, p.41-46
2004
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1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095), 1996, p.109-110
1996
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12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094), 2000, p.165-168
2000
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- Microelectronics And Reliability
- Ieee Transactions On Electron Devices
- Ieee Journal Of Solid-State Circuits
- Solid-State Electronics
- Ieee Transactions On Components, Packaging, And Manufacturing Technology. Part A
- International Journal Of Heat And Mass Transfer
- Microelectronics
- Microelectronics Reliability
- Numerical Heat Transfer
- Numerical Heat Transfer. Part B, Fundamentals