UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Higher order tip effects in traceable CD-AFM-based linewidth measurements

Measurement science & technology, 2007-02, Vol.18 (2), p.448-455

2007

Volltextzugriff (PDF)

Three-nucleon charge radius: A precise laser determination using 3He

Physical review letters, 1995-05, Vol.74 (18), p.3553-3556

1995

Volltextzugriff (PDF)

Conformal oxides on Si surfaces

Applied physics letters, 1997-09, Vol.71 (11), p.1495-1497

1997

Volltextzugriff (PDF)

Precise measurement of the Lamb shift and fine structure of the 2S-2P transition in triplet helium

Physical review letters, 1994-03, Vol.72 (12), p.1802-1805

1994

Volltextzugriff (PDF)

Management approach for recurrent spontaneous pneumothorax in consecutive pregnancies based on clinical and radiographic findings

Journal of cardiothoracic surgery, 2006-10, Vol.1 (1), p.35-35, Article 35

2006

Volltextzugriff (PDF)

Immunohistochemical localization patterns for vimentin and other intermediate filaments in calcified ovarian fibrothecoma

Diagnostic pathology, 2006-09, Vol.1 (1), p.28-28

2006

Volltextzugriff (PDF)

The why, what, and how of endoscopic sinus surgery

Seminars in perioperative nursing, 2000-10, Vol.9 (4), p.163

Dixson, R K

2000

Volltextzugriff (PDF)

Measuring the fine structure constant using helium fine structure

IEEE transactions on instrumentation and measurement, 1995-04, Vol.44 (2), p.518-521

1995

Volltextzugriff (PDF)

Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks

IEEE transactions on semiconductor manufacturing, 2009-02, Vol.22 (1), p.72-79

2009

Volltextzugriff (PDF)

Comparison of SEM and HRTEM CD Measurements Extracted From Test Structures Having Feature Linewidths From 40 to 240 nm

IEEE transactions on instrumentation and measurement, 2008-01, Vol.57 (1), p.100-109

2008

Volltextzugriff (PDF)

The study of silicon stepped surfaces as atomic force microscope calibration standards with a calibrated AFM at NIST

AIP conference proceedings, 1998, Vol.449 (1)

1998

Volltextzugriff (PDF)

Traceable calibration of critical-dimension atomic force microscope linewidth measurements with nanometer uncertainty

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2005-11, Vol.23 (6), p.3028-3032

2005

Volltextzugriff (PDF)

Recent developments in electrical linewidth and overlay metrology for integrated circuit fabrication processes

Japanese Journal of Applied Physics, 1996-12, Vol.35 (12B), p.6597-6609

1996

Volltextzugriff (PDF)

Algorithms for calculating single-atom step heights

Nanotechnology, 1999-12, Vol.10 (4), p.428-433

1999

Volltextzugriff (PDF)

Line edge roughness metrology using atomic force microscopes

Measurement science & technology, 2005-11, Vol.16 (11), p.2147-2154

2005

Volltextzugriff (PDF)

Problems in surface metrology

International journal of machine tools & manufacture, 1998-05, Vol.38 (5), p.417-418

1998

Volltextzugriff (PDF)

A chopped high intensity muon beam at the Stopped Muon Channel at LAMPF

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1993-09, Vol.333 (2), p.260-264

1993

Volltextzugriff (PDF)

Traceable pico-meter level step height metrology

Wear, 2004-12, Vol.257 (12), p.1264-1269

2004

Volltextzugriff (PDF)

The role of periodic interferometer errors in the calibration of capacitance displacement sensors for nanometrology applications

Measurement science & technology, 2001-11, Vol.12 (11), p.2002-2008

2001

Volltextzugriff (PDF)

Comparison of measurement techniques for advanced photomask metrology

2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.35-39

2008

Volltextzugriff (PDF)

Study of Test Structures for Use as Reference Materials for Optical Critical Dimension Applications

2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.20-25

2007

Volltextzugriff (PDF)

Three-Nucleon Charge Radius: A Precise Laser Determination Using 3 He

Physical review letters, 1995-05, Vol.74 (18), p.3553-3556

1995

Volltextzugriff (PDF)

Precise measurement of the Lamb shift and fine structure of the 2[ital S]-2[ital P] transition in triplet helium

Physical review letters, 1994-03, Vol.72:12

1994

Volltextzugriff (PDF)

Precise measurement of the Lamb shift and fine structure of the 2 S -2 P transition in triplet helium

Physical review letters, 1994-03, Vol.72 (12), p.1802-1805

1994

Volltextzugriff (PDF)

Absolute differential cross sections for small-angle H+-He direct and charge-transfer scattering at keV energies

Physical review. A, General physics, 1989-10, Vol.40 (7), p.3626-3631

1989

Volltextzugriff (PDF)

1 – 25 von 170

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(150)
Mit Volltextzugriff
(139)

Publikationsform

Sprache

Englisch
(170)

Erscheinungsjahr

n.n

Thema

Science & Technology
(97)
Life Sciences & Biomedicine
(58)
Female
(28)
Physical Sciences
(28)
Humans
(25)
Animals
(23)
Technology
(21)
Male
(19)
Physics
(19)
Biological And Medical Sciences
(17)
Engineering
(16)
Social Sciences
(16)
Psychology
(14)
Fundamental And Applied Biological Sciences. Psychology
(13)
Ecology
(12)
Exact Sciences And Technology
(12)
Science & Technology - Other Topics
(12)
Adult
(11)
Behavioral Sciences
(11)
Environmental Sciences & Ecology
(11)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Higher order tip effects in traceable CD-AFM-based linewidth measurements

Three-nucleon charge radius: A precise laser determination using 3He

Conformal oxides on Si surfaces

Precise measurement of the Lamb shift and fine structure of the 2S-2P transition in triplet helium

Management approach for recurrent spontaneous pneumothorax in consecutive pregnancies based on clinical and radiographic findings

Immunohistochemical localization patterns for vimentin and other intermediate filaments in calcified ovarian fibrothecoma

The why, what, and how of endoscopic sinus surgery

Measuring the fine structure constant using helium fine structure

Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks

Comparison of SEM and HRTEM CD Measurements Extracted From Test Structures Having Feature Linewidths From 40 to 240 nm

The study of silicon stepped surfaces as atomic force microscope calibration standards with a calibrated AFM at NIST

Traceable calibration of critical-dimension atomic force microscope linewidth measurements with nanometer uncertainty

Recent developments in electrical linewidth and overlay metrology for integrated circuit fabrication processes

Algorithms for calculating single-atom step heights

Line edge roughness metrology using atomic force microscopes

Problems in surface metrology

A chopped high intensity muon beam at the Stopped Muon Channel at LAMPF

Traceable pico-meter level step height metrology

The role of periodic interferometer errors in the calibration of capacitance displacement sensors for nanometrology applications

Comparison of measurement techniques for advanced photomask metrology

Study of Test Structures for Use as Reference Materials for Optical Critical Dimension Applications

Three-Nucleon Charge Radius: A Precise Laser Determination Using 3 He

Precise measurement of the Lamb shift and fine structure of the 2[ital S]-2[ital P] transition in triplet helium

Precise measurement of the Lamb shift and fine structure of the 2 S -2 P transition in triplet helium

Absolute differential cross sections for small-angle H+-He direct and charge-transfer scattering at keV energies

Suchergebnisse filtern