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Statistical integrated circuit design

IEEE journal of solid-state circuits, 1993-03, Vol.28 (3), p.193-202

1993

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Integrated circuit quality optimization using surface integrals

IEEE transactions on computer-aided design of integrated circuits and systems, 1993-12, Vol.12 (12), p.1868-1879

1993

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VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits

IEEE transactions on computer-aided design of integrated circuits and systems, 1986-10, Vol.5 (4), p.541-556

1986

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The schema-based approach to workflow management

IEEE transactions on computer-aided design of integrated circuits and systems, 1995-10, Vol.14 (10), p.1257-1267

1995

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A new methodology for the design centering of IC fabrication processes

IEEE transactions on computer-aided design of integrated circuits and systems, 1991-07, Vol.10 (7), p.895-903

1991

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VLSI Yield Prediction and Estimation: A Unified Framework

IEEE transactions on computer-aided design of integrated circuits and systems, 1986-01, Vol.5 (1), p.114-130

1986

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An efficient methodology for building macromodels of IC fabrication processes

IEEE transactions on computer-aided design of integrated circuits and systems, 1989-12, Vol.8 (12), p.1299-1313

1989

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Sensitivity computation in piecewise approximate circuit simulation

IEEE transactions on computer-aided design of integrated circuits and systems, 1991-02, Vol.10 (2), p.171-183

1991

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A Methodology for Worst-Case Analysis of Integrated Circuits

IEEE transactions on computer-aided design of integrated circuits and systems, 1986-01, Vol.5 (1), p.104-113

1986

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Automated design tool execution in the Ulysses design environment

IEEE transactions on computer-aided design of integrated circuits and systems, 1989-03, Vol.8 (3), p.279-287

1989

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FABRICS II: A Statistically Based IC Fabrication Process Simulator

IEEE transactions on computer-aided design of integrated circuits and systems, 1984-01, Vol.3 (1), p.40-46

1984

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An object oriented approach to CAD tool control within a design framework

26th ACM/IEEE Design Automation Conference, 1989, p.197-202

1989

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An efficient algorithm for parametric fault simulation of monolithic IC's

IEEE transactions on computer-aided design of integrated circuits and systems, 1991-08, Vol.10 (8), p.1049-1058, Article 1049

1991

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Reengineering the curriculum: design and analysis of a new undergraduate Electrical and Computer Engineering degree at Carnegie Mellon University

Proceedings of the IEEE, 1995-09, Vol.83 (9), p.1246-1269

1995

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The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability

IEEE transactions on computer-aided design of integrated circuits and systems, 1995-12, Vol.14 (12), p.1557-1568

1995

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Application of constraint-based heuristics in collaborative design

Annual ACM IEEE Design Automation Conference: Proceedings of the 38th conference on Design automation, 2001, p.395-400

2001

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Manufacturing-based simulation: An overview

IEEE circuits and devices magazine, 1987-09, Vol.3 (5), p.3-9

Director, S. W.

1987

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A Pattern Recognition Based Method for IC Failure Analysis

IEEE transactions on computer-aided design of integrated circuits and systems, 1985-01, Vol.4 (1), p.76-92

1985

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LASSIE: structure to layout for behavioral synthesis tools

26th ACM/IEEE Design Automation Conference, 1989, p.104-109

1989

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A novel methodology for statistical parameter extraction

International Conference on Computer Aided Design: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design; 05-09 Nov. 1995, 1995, p.696-699

1995

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