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Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV–vis–NIR region

Materials science & engineering. B, Solid-state materials for advanced technology, 2007-02, Vol.137 (1-3), p.304-309

2007

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Preparation and characterization of highly (111)-oriented (Pb, La)(Zr, Ti)O3 thin films by sol-gel processing

Thin solid films, 2003, Vol.423 (1), p.13-17

2003

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Structural, dielectric and optical properties of Ba(Ti, Zr)O3 thin films prepared by chemical solution deposition

Thin solid films, 2004-07, Vol.460 (1-2), p.227-231

2004

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Optical and dielectric properties of (Zr0.8,Sn0.2)TiO4 thin films prepared by sol–gel process

Materials science & engineering. B, Solid-state materials for advanced technology, 2003-05, Vol.B99 (1-3), p.382-385

2003

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Processing effects on the microstructure and ferroelectric properties of Pb(Zr, Ti)O3 thin films prepared by sol-gel process

Surface & coatings technology, 2002-12, Vol.161 (2-3), p.169-173

2002

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Electrical transport properties of transparent PLZT ceramics: Bulk and grain boundaries

Solid state ionics, 2012-02, Vol.208, p.4-7

2012

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Structural, dielectric and optical properties of Ba(Ti, Zr)O 3 thin films prepared by chemical solution deposition

Thin solid films, 2004-07, Vol.460 (1), p.227-231

2004

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Optical properties of Pb(Zr x Ti 1− x )O 3 ( x = 0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry

Materials chemistry and physics, 2007-06, Vol.103 (2), p.329-333

2007

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Optical properties of Pb(ZrxTi1−x)O3 (x=0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry

Materials chemistry and physics, 2007-06, Vol.103 (2-3), p.329-333

2007

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Effect of zinc sources on the morphology of ZnO nanostructures and their photoluminescence properties

Applied physics. A, Materials science & processing, 2004-08, Vol.79 (3), p.453-456

2004

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Preparation and characterization of highly (1 1 1)-oriented (Pb,La)(Zr,Ti)O 3 thin films by sol–gel processing

Thin solid films, 2003, Vol.423 (1), p.13-17

2003

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Optical properties of Pb(Zr 0.53Ti 0.47)O 3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV–vis–NIR region

Materials science & engineering. B, Solid-state materials for advanced technology, 2007-02, Vol.137 (1), p.304-309

2007

Volltextzugriff (PDF)

Electrical properties of (Pb 0.76Ca 0.24)TiO 3 thin films on LaNiO 3 coated Si and fused quartz substrates prepared by a sol–gel process

Applied surface science, 2003-02, Vol.207 (1), p.63-68

2003

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Electrical properties of compositionally graded lead calcium titanate thin films

Solid state communications, 2003-09, Vol.127 (9), p.625-628

2003

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Preparation and characterisation of compositionally graded Ba x Sr 1-x TiO 3 thin films

Applied physics. A, Materials science & processing, 2002-11, Vol.75 (5), p.597-600

2002

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Surface morphology and chemical states of highly oriented PbZrO 3 thin films prepared by a sol–gel process

Applied surface science, 2001-04, Vol.174 (2), p.148-154

2001

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Growth and electrical properties of compositionally graded Pb(Zr xTi 1− x)O 3 thin films on PbZrO 3 buffered Pt/Ti/SiO 2/Si substrates

Journal of crystal growth, 2004, Vol.267 (1), p.117-122

2004

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Processing effects on the microstructure and ferroelectric properties of Pb(Zr,Ti)O 3 thin films prepared by sol–gel process

Surface & coatings technology, 2002-12, Vol.161 (2), p.169-173

2002

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The effect of thickness on the dielectric properties of highly (111) oriented Pb(Zr 0.53Ti 0.47)O 3 thin films prepared by a simple sol–gel route

Microelectronic engineering, 2003-05, Vol.65 (4), p.387-393

2003

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Growth and electrical properties of compositionally graded Pb(ZrxTi1-x)O3 thin films on PbZrO3 buffered Pt/Ti/SiO2/Si substrates

Journal of crystal growth, 2004-06, Vol.267 (1-2), p.117-122

2004

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Leakage current and pyroelectric properties of compositionally graded (Pb, Ca)TiO3 films

Applied physics. A, Materials science & processing, 2004-05, Vol.78 (8), p.1205-1209

2004

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Surface morphology and chemical states of highly oriented PbZrO3 thin films prepared by a sol-gel process

Applied surface science, 2001-04, Vol.174 (2), p.148-154

2001

Volltextzugriff (PDF)

The effect of thickness on the dielectric properties of highly (111) oriented Pb(Zr0.53Ti0.47)O3 thin films prepared by a simple sol-gel route

Microelectronic engineering, 2003-05, Vol.65 (4), p.387-393

2003

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Preparation and characterization of transparent PZN–PLZT ceramics

Journal of materials research, 2004-03, Vol.19 (3), p.729-732

2004

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Electrical properties of (Pb0.76Ca0.24)TiO3 thin films on LaNiO3 coated Si and fused quartz substrates prepared by a sol–gel process

Applied surface science, 2003-02, Vol.207 (1-4), p.63-68

2003

Volltextzugriff (PDF)

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Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV–vis–NIR region

Preparation and characterization of highly (111)-oriented (Pb, La)(Zr, Ti)O3 thin films by sol-gel processing

Structural, dielectric and optical properties of Ba(Ti, Zr)O3 thin films prepared by chemical solution deposition

Optical and dielectric properties of (Zr0.8,Sn0.2)TiO4 thin films prepared by sol–gel process

Processing effects on the microstructure and ferroelectric properties of Pb(Zr, Ti)O3 thin films prepared by sol-gel process

Electrical transport properties of transparent PLZT ceramics: Bulk and grain boundaries

Structural, dielectric and optical properties of Ba(Ti, Zr)O 3 thin films prepared by chemical solution deposition

Optical properties of Pb(Zr x Ti 1− x )O 3 ( x = 0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry

Optical properties of Pb(ZrxTi1−x)O3 (x=0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry

Effect of zinc sources on the morphology of ZnO nanostructures and their photoluminescence properties

Preparation and characterization of highly (1 1 1)-oriented (Pb,La)(Zr,Ti)O 3 thin films by sol–gel processing

Optical properties of Pb(Zr 0.53Ti 0.47)O 3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV–vis–NIR region

Electrical properties of (Pb 0.76Ca 0.24)TiO 3 thin films on LaNiO 3 coated Si and fused quartz substrates prepared by a sol–gel process

Electrical properties of compositionally graded lead calcium titanate thin films

Preparation and characterisation of compositionally graded Ba x Sr 1-x TiO 3 thin films

Surface morphology and chemical states of highly oriented PbZrO 3 thin films prepared by a sol–gel process

Growth and electrical properties of compositionally graded Pb(Zr xTi 1− x)O 3 thin films on PbZrO 3 buffered Pt/Ti/SiO 2/Si substrates

Processing effects on the microstructure and ferroelectric properties of Pb(Zr,Ti)O 3 thin films prepared by sol–gel process

The effect of thickness on the dielectric properties of highly (111) oriented Pb(Zr 0.53Ti 0.47)O 3 thin films prepared by a simple sol–gel route

Growth and electrical properties of compositionally graded Pb(ZrxTi1-x)O3 thin films on PbZrO3 buffered Pt/Ti/SiO2/Si substrates

Leakage current and pyroelectric properties of compositionally graded (Pb, Ca)TiO3 films

Surface morphology and chemical states of highly oriented PbZrO3 thin films prepared by a sol-gel process

The effect of thickness on the dielectric properties of highly (111) oriented Pb(Zr0.53Ti0.47)O3 thin films prepared by a simple sol-gel route

Preparation and characterization of transparent PZN–PLZT ceramics

Electrical properties of (Pb0.76Ca0.24)TiO3 thin films on LaNiO3 coated Si and fused quartz substrates prepared by a sol–gel process

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