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IEEE transactions on reliability, 2005-06, Vol.54 (2), p.310-317
2005
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Annals of operations research, 1999-01, Vol.91, p.137
1999
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Journal of manufacturing systems, 1995-01, Vol.14 (6), p.427-438
1995
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IEEE transactions on reliability, 1987-12, Vol.R-36 (5), p.568-572
1987
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IEEE transactions on reliability, 1995-03, Vol.44 (1), p.155-160
1995
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Nonlinear analysis, 1997-12, Vol.30 (7), p.4415-4423
1997
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Microelectronics and reliability, 1995-04, Vol.35 (4), p.637-656
1995
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Proceedings of 1996 Annual Reliability and Maintainability Symposium, 1996, p.90-96
1996
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Annual Reliability and Maintainability Symposium 1995 Proceedings, 1995, p.223-232
1995
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IEEE transactions on advanced packaging, 2000-05, Vol.23 (2), p.277-284
2000
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Alzheimer disease and associated disorders, 2009-04, Vol.23 (2), p.91-101
2009
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Alzheimer disease and associated disorders, 2009-01, Vol.23 (2), p.91-101
2009
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Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179), 2001, p.393-400
2001
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Computers and biomedical research, 1988-12, Vol.21 (6), p.503-511
1988
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Computers and biomedical research, 1988, Vol.21 (6), p.503-511
1988
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Nuclear technology, 1987-10, Vol.79 (1), p.1-5
- Rumble, Edmund T.
- Chu, Boyer B.
- Ronen, Yigal
- Leibson, Melvin J.
- Smith, Douglas R.
- Albrecht, Robert W.
- Jayanti, Sreenivas
- Christensen, Richard N.
- Yost, Nancy
- Wang, Chris
- van Deusen, David
- Miller, Don W.
- Atwood, Corwin L.
- Lloyd, Raymond C.
- Clayton, E. Duane
- Wilson, Robert E.
- McBroom, Robert C.
- Jones, Robert R.
- Berg, Heinz Peter
- Ehrlich, Dietrich
- Illi, Heinrich
- Thomauske, Bruno R.
- Horng, Tzing-Shenq
- Chieng, Cheng-Chang
- Shakila, Abdul Majeed
- Srinivasan, Thandangorai Ganapathi
- Sabharwal, Kanwal Nain
- Rao, Polur Rangarao Vasudeva
- Takeda, Yasushi
1987
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- Ieee Transactions On Reliability
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