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IEEE journal of the Electron Devices Society, 2022, Vol.10, p.1-1
2022
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Journal of applied physics, 2015-05, Vol.117 (17)
2015
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Journal of magnetism and magnetic materials, 2020-07, Vol.505, p.166647, Article 166647
2020
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Electronics letters, 2014-04, Vol.50 (8), p.585-587
2014
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Electronics letters, 2014-09, Vol.50 (19), p.1353-1355
2014
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2015 21st IEEE International Symposium on Asynchronous Circuits and Systems, 2015, p.139-146
2015
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Proceedings of the conference on Design, Automation & Test in Europe, 2014, p.1-1
2014
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Microelectronics and reliability, 2023-11, Vol.150, p.115167, Article 115167
2023
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Microelectronics and reliability, 2022-11, Vol.138, p.114677, Article 114677
2022
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Journal of applied physics, 2012-04, Vol.111 (7), p.07E350-07E350-3
2012
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2019 IEEE International Symposium on Circuits and Systems (ISCAS), 2019, p.1-5
2019
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe, 2020, p.394-399
2020
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2018 Conference on Design of Circuits and Integrated Systems (DCIS), 2018, p.1-6
2018
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2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, p.322-327
2019
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.394-399
2020
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2020 IEEE Symposium on VLSI Technology, 2020, p.1-2
2020
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2015 European Conference on Circuit Theory and Design (ECCTD), 2015, p.1-4
2015
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2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018, p.931-936
2018
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2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014, p.1-1
2014
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2023 IEEE European Test Symposium (ETS), 2023, p.1-4
2023
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2009 22nd International Conference on VLSI Design, 2009, p.561-566
2009
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2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), 2018, p.243-244
2018
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2013 International Semiconductor Conference Dresden - Grenoble (ISCDG), 2013, p.1-4
2013
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2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008, p.1-4
2008
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MELECON 2008 - The 14th IEEE Mediterranean Electrotechnical Conference, 2008, p.393-398
2008
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