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Elastic characterizations of α-GaPO4 single crystals grown by the flux method

Journal of physics. Condensed matter, 2008-01, Vol.20 (2), p.025226-025226 (7)

2008

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Crystalline quality of the trigonal piezoelectric materials and effects of the extended defects

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2012-05, Vol.59 (5), p.1013-1022

2012

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Advances in crystal growth and characterizations of gallium orthophosphate, GaPO4

Journal of crystal growth, 2001-04, Vol.224 (3-4), p.294-302

2001

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Thickness-shear mode shapes and mass-frequency influence surface of a circular and electroded AT-cut quartz resonator

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 1992-09, Vol.39 (5), p.609-617

1992

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Elastic characterizations of α - GaPO 4 single crystals grown by the flux method

Journal of physics. Condensed matter, 2008-01, Vol.20 (2), p.25226

2008

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Piezoelectric characterization and thermal stability of a high-performance α -quartz-type material, gallium arsenate

Journal of applied physics, 2005-04, Vol.97 (7), p.074110-074110-7

2005

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New contrasts of piezoelectric devices using synchrotron stroboscopic section topography at ESRF

Journal of applied crystallography, 2001-10, Vol.34 (5), p.625-629

2001

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Zero temperature coefficients in overtone lithium-tantalate thickness-mode resonators

Electronics letters, 1977-01, Vol.13 (1), p.20-21

Detaint, J.

1977

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Stroboscopic X-ray topography of quartz resonators

Journal of applied crystallography, 1988-12, Vol.21 (6), p.967-971

1988

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Evaluation of high quality berlinite crystals grown in sulphuric acid medium

Journal of crystal growth, 1990, Vol.104 (3), p.713-726

1990

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Analysis of the Propagation Modes of Acoustic Waves in Piezoelectric Devices in Synchrotron White-Beam Topographs by Means of Simulations

Journal of applied crystallography, 1998-08, Vol.31 (4), p.574-582

1998

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Crystal growth and characterizations of quartz-like material: gallium phosphate (GaPO4)

Journal of crystal growth, 1996-09, Vol.166 (1-4), p.347-353

1996

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A quartz-like material: gallium phosphate (GaPO 4); crystal growth and characterization

Journal of crystal growth, 1993-05, Vol.130 (1), p.195-208

1993

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A review of langasite material constants from BAW and SAW data: toward an improved data set

Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218), 2001, p.278-286

2001

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Investigations by X-ray topography of quartz and langasite resonators

Journal de Physique IV (Proceedings), 2005-06, Vol.126, p.3-6

2005

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Direct and inverse energy trapping in the thin film resonators and optimization of their designs

2008 IEEE International Frequency Control Symposium, 2008, p.19-24

2008

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Determination of the mode shapes of energy trapping resonators using X-ray topography

2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum (FCS) Proceedings, 2011, p.1-6

2011

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Cristalogénèse et caractérisation de berlinite à haut facteur de surtension

Materials research bulletin, 1987, Vol.22 (8), p.1063-1071

1987

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Properties of AT cut gallium phosphate resonators

Annales de chimie (Paris. 1914), 2001-01, Vol.26 (1), p.151-160

Detaint, J

2001

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X-ray topography studies on the influence of the mass-loading effect on resonator parameters

Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218), 2001, p.609-615

2001

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Properties of AT cut gallium phosphate resonators

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052), 2000, p.145-157

2000

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Crystal growth of GaPO4, a very promising material for manufacturing baw devices

Annales de chimie (Paris. 1914), 2001-01, Vol.26 (1), p.79-84

Cambon, O

2001

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Direct mapping of the vibration modes of piezoelectric devices using white beam stroboscopic topography at ESRF

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052), 2000, p.430-433

2000

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Investigations on the langasite resonators by X-ray topography

IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003, 2003, p.637-641

2003

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Energy trapping thickness mode gyroscopes using high performance crystalline materials

2010 IEEE International Frequency Control Symposium, 2010, p.355-360

2010

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Elastic characterizations of α-GaPO4 single crystals grown by the flux method

Crystalline quality of the trigonal piezoelectric materials and effects of the extended defects

Advances in crystal growth and characterizations of gallium orthophosphate, GaPO4

Thickness-shear mode shapes and mass-frequency influence surface of a circular and electroded AT-cut quartz resonator

Elastic characterizations of α - GaPO 4 single crystals grown by the flux method

Piezoelectric characterization and thermal stability of a high-performance α -quartz-type material, gallium arsenate

New contrasts of piezoelectric devices using synchrotron stroboscopic section topography at ESRF

Zero temperature coefficients in overtone lithium-tantalate thickness-mode resonators

Stroboscopic X-ray topography of quartz resonators

Evaluation of high quality berlinite crystals grown in sulphuric acid medium

Analysis of the Propagation Modes of Acoustic Waves in Piezoelectric Devices in Synchrotron White-Beam Topographs by Means of Simulations

Crystal growth and characterizations of quartz-like material: gallium phosphate (GaPO4)

A quartz-like material: gallium phosphate (GaPO 4); crystal growth and characterization

A review of langasite material constants from BAW and SAW data: toward an improved data set

Investigations by X-ray topography of quartz and langasite resonators

Direct and inverse energy trapping in the thin film resonators and optimization of their designs

Determination of the mode shapes of energy trapping resonators using X-ray topography

Cristalogénèse et caractérisation de berlinite à haut facteur de surtension

Properties of AT cut gallium phosphate resonators

X-ray topography studies on the influence of the mass-loading effect on resonator parameters

Properties of AT cut gallium phosphate resonators

Crystal growth of GaPO4, a very promising material for manufacturing baw devices

Direct mapping of the vibration modes of piezoelectric devices using white beam stroboscopic topography at ESRF

Investigations on the langasite resonators by X-ray topography

Energy trapping thickness mode gyroscopes using high performance crystalline materials

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