UB Paderborn / Katalog / Suche / in CDI

Rapid turnaround scanning probe nanolithography

Nanotechnology, 2011-07, Vol.22 (27), p.275306-275306

2011

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Curved in-plane electromechanical relay for low power logic applications

Journal of micromechanics and microengineering, 2013-02, Vol.23 (2), p.25024-8

2013

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Higher modes of vibration increase mass sensitivity in nanomechanical microcantilevers

Nanotechnology, 2007-11, Vol.18 (44), p.445502-445502 (8)

2007

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Wide bandwidth room-temperature THz imaging array based on antenna-coupled MOSFET bolometer

Sensors and actuators. A. Physical., 2014-08, Vol.215, p.96-104

2014

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A Vibration Resistant Nanopositioner for Mobile Parallel-Probe Storage Applications

Journal of microelectromechanical systems, 2007-02, Vol.16 (1), p.130-139

2007

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IEEE_Xplore

2D MEMS scanner integrating a position feedback

MATEC Web of Conferences, 2015, Vol.32, p.1001

2015

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Nanoscale Three-Dimensional Patterning of Molecular Resists by Scanning Probes

Science (American Association for the Advancement of Science), 2010-05, Vol.328 (5979), p.732-735

2010

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Switchable cantilever for a time-of-flight scanning force microscope

Applied physics letters, 2004-03, Vol.84 (9), p.1558-1560

2004

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Thermal Probe Maskless Lithography for 27.5 nm Half-Pitch Si Technology

Nano letters, 2013-09, Vol.13 (9), p.4485-4491

2013

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Atomic Force Microscopy with Nanoscale Cantilevers Resolves Different Structural Conformations of the DNA Double Helix

Nano letters, 2012-07, Vol.12 (7), p.3846-3850

2012

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Low-cost AFM cantilever manufacturing technology

Journal of micromechanics and microengineering, 2008-11, Vol.18 (11), p.115013-115013 (8)

2008

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Encapsulated tips for reliable nanoscale conduction in scanning probe technologies

Nanotechnology, 2009-03, Vol.20 (10), p.105701-105701

2009

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Nanoscale PtSi Tips for Conducting Probe Technologies

IEEE transactions on nanotechnology, 2009-01, Vol.8 (1), p.128-131

2009

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IEEE_Xplore

Stable and compact RF-to-optical link using lithium niobate on insulator waveguides

APL photonics, 2021-12, Vol.6 (12)

2021

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Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy

Review of scientific instruments, 2009-08, Vol.80 (8), p.083701-083701

2009

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Switchable cantilever fabrication for a novel time-of-flight scanning force microscope

Microelectronic engineering, 2003-06, Vol.67, p.635-643

2003

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A micromechanical thermal displacement sensor with nanometre resolution

Nanotechnology, 2005-08, Vol.16 (8), p.1089-1094

2005

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Energy and Latency Optimization in NEM Relay-Based Digital Circuits

IEEE transactions on circuits and systems. I, Regular papers, 2014-08, Vol.61 (8), p.2348-2359

2014

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IEEE_Xplore

Wafer-scale microdevice transfer/interconnect: its application in an AFM-based data-storage system

Journal of microelectromechanical systems, 2004-12, Vol.13 (6), p.895-901

2004

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IEEE_Xplore

Selective Transfer Technology for Microdevice Distribution

Journal of microelectromechanical systems, 2008-02, Vol.17 (1), p.157-165

2008

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IEEE_Xplore

Atomic force microscope cantilevers for combined thermomechanical data writing and reading

Applied physics letters, 2001-02, Vol.78 (9), p.1300-1302

2001

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Design of atomic force microscope cantilevers for combined thermomechanical writing and thermal reading in array operation

Journal of microelectromechanical systems, 2002-12, Vol.11 (6), p.765-774

2002

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IEEE_Xplore

Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy

Review of scientific instruments, 2012-09, Vol.83 (9), p.096107-096107

2012

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Nanoscale phase transformation in Ge 2 Sb 2 Te 5 using encapsulated scanning probes and retraction force microscopy

Review of scientific instruments, 2009-08, Vol.80 (8), p.083701-083701-6

2009

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Controlled Thermophoresis as an Actuation Mechanism for Noncantilevered MEMS Devices

Journal of microelectromechanical systems, 2008-12, Vol.17 (6), p.1287-1293

2008

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IEEE_Xplore

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Rapid turnaround scanning probe nanolithography

Curved in-plane electromechanical relay for low power logic applications

Higher modes of vibration increase mass sensitivity in nanomechanical microcantilevers

Wide bandwidth room-temperature THz imaging array based on antenna-coupled MOSFET bolometer

A Vibration Resistant Nanopositioner for Mobile Parallel-Probe Storage Applications

2D MEMS scanner integrating a position feedback

Nanoscale Three-Dimensional Patterning of Molecular Resists by Scanning Probes

Switchable cantilever for a time-of-flight scanning force microscope

Thermal Probe Maskless Lithography for 27.5 nm Half-Pitch Si Technology

Atomic Force Microscopy with Nanoscale Cantilevers Resolves Different Structural Conformations of the DNA Double Helix

Low-cost AFM cantilever manufacturing technology

Encapsulated tips for reliable nanoscale conduction in scanning probe technologies

Nanoscale PtSi Tips for Conducting Probe Technologies

Stable and compact RF-to-optical link using lithium niobate on insulator waveguides

Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy

Switchable cantilever fabrication for a novel time-of-flight scanning force microscope

A micromechanical thermal displacement sensor with nanometre resolution

Energy and Latency Optimization in NEM Relay-Based Digital Circuits

Wafer-scale microdevice transfer/interconnect: its application in an AFM-based data-storage system

Selective Transfer Technology for Microdevice Distribution

Atomic force microscope cantilevers for combined thermomechanical data writing and reading

Design of atomic force microscope cantilevers for combined thermomechanical writing and thermal reading in array operation

Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy

Nanoscale phase transformation in Ge 2 Sb 2 Te 5 using encapsulated scanning probes and retraction force microscopy

Controlled Thermophoresis as an Actuation Mechanism for Noncantilevered MEMS Devices

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