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Science (American Association for the Advancement of Science), 2016-04, Vol.352 (6283), p.353-358
2016
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Microelectronics and reliability, 2006, Vol.46 (1), p.1-23
2006
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Microelectronics and reliability, 2005, Vol.45 (1), p.83-98
2005
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2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.40-45
2004
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Microelectronics and reliability, 2006-09, Vol.46 (9), p.1464-1471
2006
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2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.471-477
2006
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Microelectronics and reliability, 2005-09, Vol.45 (9), p.1370-1375
2005
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Microelectronics and reliability, 2005-05, Vol.45 (5), p.841-844
2005
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Microelectronics and reliability, 2005-12, Vol.45 (12), p.1842-1854
2005
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2005 IEEE International Integrated Reliability Workshop, 2005, p.5 pp.
2005
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Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005, 2005, p.399-402
2005
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IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, 2004, p.109-112
2004
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Microelectronic engineering, 2004-04, Vol.72 (1), p.10-15
2004
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Solid-state electronics, 2006-04, Vol.50 (4), p.573-578
- Tavel, B.
- Duriez, B.
- Gwoziecki, R.
- Basso, M.T.
- Julien, C.
- Ortolland, C.
- Laplanche, Y.
- Fox, R.
- Sabouret, E.
- Detcheverry, C.
- Boeuf, F.
- Morin, P.
- Barge, D.
- Bidaud, M.
- Biénacel, J.
- Garnier, P.
- Cooper, K.
- Chapon, J.D.
- Trouiller, Y.
- Belledent, J.
- Broekaart, M.
- Gouraud, P.
- Denais, M.
- Huard, V.
- Rochereau, K.
- Difrenza, R.
- Planes, N.
- Marin, M.
- Boret, S.
- Gloria, D.
- Vanbergue, S.
- Abramowitz, P.
- Vishnubhotla, L.
- Reber, D.
- Stolk, P.
- Woo, M.
- Arnaud, F.
2006
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IEEE International Integrated Reliability Workshop Final Report, 2004, 2004, p.1-3
2004
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2005 IEEE International Integrated Reliability Workshop, 2005, p.5 pp.
2005
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IEEE International Integrated Reliability Workshop Final Report, 2004, 2004, p.4-6
2004
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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.377-380
2005
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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.61-66
2005
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2005 IEEE International Integrated Reliability Workshop, 2005, p.7 pp.
2005
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IEEE International Integrated Reliability Workshop Final Report, 2004, 2004, p.109-112
2004
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2005 IEEE International Integrated Reliability Workshop, 2005, p.4 pp.
2005
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Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005, 2005, p.423-426
- Tavel, B.
- Duriez, B.
- Gwoziecki, R.
- Basso, M.T.
- Julien, C.
- Ortolland, C.
- Laplanche, Y.
- Fox, R.
- Saboure, E.
- Detcheverry, C.
- Boeuf, F.
- Morin, P.
- Barge, D.
- Bidaud, M.
- Bienacel, J.
- Garnier, P.
- Cooper, K.
- Chapon, J.D.
- Trouille, Y.
- Belledent, J.
- Broekaart, M.
- Gouraud, P.
- Denais, M.
- Huard, V.
- Rochereau, K.
- Difrenza, R.
- Planes, N.
- Marin, M.
- Boret, S.
- Gloria, D.
- Vanbergue, S.
- Abramowitz, P.
- Vishnubhotla, L.
- Reber, D.
- Stolk, P.
- Woo, M.
- Arnaud, F.
2005
Volltextzugriff (PDF)
IEEE International Integrated Reliability Workshop Final Report, 2004, 2004, p.125-127
2004
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Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005, 2005, p.435-438
2005
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