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Electron spectroscopic characterization of oxygen adsorption on gold surfaces: II. Production of gold oxide in oxygen DC reactive sputtering

Surface science, 1984-06, Vol.141 (1), p.221-232

1984

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Sputtering deposition, XPS and X-ray diffraction characterization of hard nitrogen-platinum thin films

Journal of materials science, 1981-02, Vol.16 (2), p.407-412

1981

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Electron spectroscopic characterization of oxygen adsorption on gold surfaces: I. Substrate impurity effects on molecular oxygen adsorption in ultra high vacuum

Surface science, 1984-06, Vol.141 (1), p.211-220

1984

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Decomposition of HCOOH on Gold Studied by XPS and TDS Spectroscopies and its Behaviour Under Very Low Energy Electron Excitation

Physica scripta, 1983-01, Vol.1983, p.133-137

1983

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The use of a rapid nuclear reaction in the detection of carbon in platinum thin films

Thin solid films, 1982-01, Vol.87 (1), p.73-77

1982

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Spectroscopic study of metal/semimetal and metal/semiconductor interfaces

Applied surface science, 1990-01, Vol.41-42, p.201-206

1990

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The formation of the Al-InSb(110) interface

Surface science, 1988-01, Vol.193 (1-2), p.47-56

1988

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Double beam photoemission of d band metals: Rh, Pd, Ir, Pt

Journal of physics. F, Metal physics, 1979-08, Vol.9 (8), p.1579-1587

1979

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Evidence for different adsorption configurations of HCOOH on Au(111) and Au(110)

Surface science, 1985-01, Vol.162 (1), p.245-251

1985

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Deposition of indium on Sb(111) single crystal: A low energy electron diffraction, Auger, and x-ray photoelectron spectroscopy interface investigation

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1986-05, Vol.4 (3), p.754-757

1986

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X-Ray Photoelectron Spectroscopy Characterization of Thin Fluorine--Platinum Films

Thin solid films, 1980-10, Vol.72 (3), p.L19-L20

1980

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Comparative study of Nb and TiW barrier layers between Au and a -SiO2

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1984-04, Vol.2 (2), p.288-291

1984

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UPS, XPS and auger spectroscopies of tetrathiotetracene (TTT) and bis (tetrathiotetracene)-triiodide (TTT 2I 3) organic semiconductor surfaces

Physica B + C, 1983-01, Vol.117, p.623-625

1983

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Electron spectroscopic techniques applied to the study of InSb formation on heated Sb(111) surfaces

Fresenius' Zeitschrift für analytische Chemie, 1987-01, Vol.329 (2-3), p.370-373

1987

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Electronic structure and reduction processes in PtOx films

Chemical physics, 1980-05, Vol.48 (2), p.283-288

1980

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X-ray photoelectron spectroscopy of sputtered platinum thin films containing large amounts of carbon

Vacuum, 1981-10, Vol.31 (10-12), p.527-527

1981

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Sputtering deposition, XPS and X-ray diffraction characterization of oxygen-platinum compounds

Journal of the less-common metals, 1979-01, Vol.64 (2), p.P25-P37

1979

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Summary Abstract: Spectroscopic studies of the initial growth of AlSb on Sb(111) single crystals

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1988-05, Vol.6 (3), p.1565-1567

1988

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X-ray photoelectron spectroscopy of sputtered platinum thin films containing large amounts of carbon

Journal of vacuum science & technology, 1981-07, Vol.19 (2), p.257-259

1981

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On the study of sputtered C-Pt compounds and their behaviour in the CO oxidation reaction

Journal of the less-common metals, 1981-01, Vol.80 (2), p.P83-P89

1981

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X-ray photoelectron spectroscopy characterization of thin flourine-platinum films

Thin solid films, 1980, Vol.72 (3), p.L19-L20

1980

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Summary Abstract: An integrated UHV system for the preparation and characterization of thin metallic, semiconducting, and insulating films or compounds

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1984-04, Vol.2 (2), p.1208-1209

1984

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Interface Failure of Gold Covered SiO 2 Substrate With TiW and Nb Intermediate Adhesion Layers

MRS proceedings, 1984, Vol.40, Article 405

1984

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Interface Failure of Gold Covered SiO2 Substrate With TiW and Nb Intermediate Adhesion Layers

MRS proceedings, 1984, Vol.40

1984

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Hreels Study of Formic Acid Adsorption on Gold (110) and (111) Surfaces

Studies in Surface Science and Catalysis, 1983, Vol.14, p.293-299

1983

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Electron spectroscopic characterization of oxygen adsorption on gold surfaces: II. Production of gold oxide in oxygen DC reactive sputtering

Sputtering deposition, XPS and X-ray diffraction characterization of hard nitrogen-platinum thin films

Electron spectroscopic characterization of oxygen adsorption on gold surfaces: I. Substrate impurity effects on molecular oxygen adsorption in ultra high vacuum

Decomposition of HCOOH on Gold Studied by XPS and TDS Spectroscopies and its Behaviour Under Very Low Energy Electron Excitation

The use of a rapid nuclear reaction in the detection of carbon in platinum thin films

Spectroscopic study of metal/semimetal and metal/semiconductor interfaces

The formation of the Al-InSb(110) interface

Double beam photoemission of d band metals: Rh, Pd, Ir, Pt

Evidence for different adsorption configurations of HCOOH on Au(111) and Au(110)

Deposition of indium on Sb(111) single crystal: A low energy electron diffraction, Auger, and x-ray photoelectron spectroscopy interface investigation

X-Ray Photoelectron Spectroscopy Characterization of Thin Fluorine--Platinum Films

Comparative study of Nb and TiW barrier layers between Au and a -SiO2

UPS, XPS and auger spectroscopies of tetrathiotetracene (TTT) and bis (tetrathiotetracene)-triiodide (TTT 2I 3) organic semiconductor surfaces

Electron spectroscopic techniques applied to the study of InSb formation on heated Sb(111) surfaces

Electronic structure and reduction processes in PtOx films

X-ray photoelectron spectroscopy of sputtered platinum thin films containing large amounts of carbon

Sputtering deposition, XPS and X-ray diffraction characterization of oxygen-platinum compounds

Summary Abstract: Spectroscopic studies of the initial growth of AlSb on Sb(111) single crystals

X-ray photoelectron spectroscopy of sputtered platinum thin films containing large amounts of carbon

On the study of sputtered C-Pt compounds and their behaviour in the CO oxidation reaction

X-ray photoelectron spectroscopy characterization of thin flourine-platinum films

Summary Abstract: An integrated UHV system for the preparation and characterization of thin metallic, semiconducting, and insulating films or compounds

Interface Failure of Gold Covered SiO 2 Substrate With TiW and Nb Intermediate Adhesion Layers

Interface Failure of Gold Covered SiO2 Substrate With TiW and Nb Intermediate Adhesion Layers

Hreels Study of Formic Acid Adsorption on Gold (110) and (111) Surfaces

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