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Microelectronics and reliability, 2018-09, Vol.88-90, p.1077-1082
2018
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Microelectronics and reliability, 2009-05, Vol.49 (5), p.468-473
2009
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2391-2396
2012
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Applied physics letters, 2012-09, Vol.101 (13)
2012
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1760-1765
2013
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Microelectronics and reliability, 2010-09, Vol.50 (9), p.1778-1782
2010
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1611-1616
2013
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Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2200-2206
2014
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Journal of instrumentation, 2015-01, Vol.10 (1), p.C01009-C01009
2015
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Features measurement and reliability considerations on a proposed main converter for LHC experiments
2015
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Solid-state electronics, 2011-09, Vol.63 (1), p.60-69
2011
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Robust snubberless soft-switching power converter using SiC power MOSFETs and bespoke thermal design
2014
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1486-1490
2013
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IEEE transactions on microwave theory and techniques, 2009-12, Vol.57 (12), p.3163-3170
2009
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Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1948-1953
2011
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2465-2470
2012
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Microelectronics and reliability, 2023-11, Vol.150, p.115094, Article 115094
2023
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Microelectronics and reliability, 2019-09, Vol.100-101, p.113466, Article 113466
2019
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Microelectronics and reliability, 2008-08, Vol.48 (8), p.1468-1472
2008
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Journal of instrumentation, 2014-02, Vol.9 (2), p.C02017-C02017
2014
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Microelectronics and reliability, 2006-09, Vol.46 (9), p.1760-1765
2006
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EPJ Web of conferences, 2013-01, Vol.40, p.17005-np
2013
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Microelectronics and reliability, 2022-11, Vol.138, p.114743, Article 114743
2022
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Microelectronics and reliability, 2018-09, Vol.88-90, p.812-816
2018
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Microelectronics and reliability, 2010-09, Vol.50 (9), p.1720-1724
2010
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