UB Paderborn / Katalog / Suche / in CDI

A sub-ppm level formaldehyde gas sensor based on Zn-doped NiO prepared by a co-precipitation route

Journal of alloys and compounds, 2018-01, Vol.731, p.1188-1196

2018

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Dynamics of Molecular Impacts on Soft Materials: From Fullerenes to Organic Nanodrops

Analytical chemistry (Washington), 2009-08, Vol.81 (16), p.6676-6686

2009

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Atmospheric Pressure Plasma Deposition of Hydrophilic/Phobic Patterns and Thin Film Laminates on Any Surface

Langmuir, 2019-07, Vol.35 (30), p.9677-9683

2019

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Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

Analyst (London), 2013-11, Vol.138 (22), p.6801-6810

2013

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Computer Simulations of the Sputtering of Metallic, Organic, and Metal―Organic Surfaces with Bin and C60 Projectiles

Journal of physical chemistry. C, 2013-02, Vol.117 (6), p.2740-2752

2013

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Sputtering of polymers by keV clusters: Microscopic views of the molecular dynamics

International journal of mass spectrometry, 2014-09, Vol.370, p.29-38

2014

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Grafting of 4-pyrrolyphenyldiazonium in situ generated on NiTi, an adhesion promoter for pyrrole electropolymerisation?

Electrochimica acta, 2016-09, Vol.211, p.879-890

2016

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Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition

Analytical chemistry (Washington), 2002-10, Vol.74 (19), p.4955-4968

2002

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Plasma polymerization of C4Cl6 and C2H2Cl4 at atmospheric pressure

Polymer (Guilford), 2013-07, Vol.54 (16), p.4085-4092

2013

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Time-of-Flight Secondary Ion Mass Spectrometry Investigation of the Orientation of Adsorbed Antibodies on SAMs Correlated to Biorecognition Tests

Journal of physical chemistry. C, 2014-01, Vol.118 (4), p.2085-2092

2014

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Ni0.9Zn0.1O/ZnO nanocomposite prepared by malonate coprecipitation route for gas sensing

Sensors and actuators. B, Chemical, 2016-08, Vol.231, p.520-528

2016

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Probing the Orientation of β‑Lactoglobulin on Gold Surfaces Modified by Alkyl Thiol Self-Assembled Monolayers

Journal of physical chemistry. C, 2013-06, Vol.117 (22), p.11569-11577

2013

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Water nanodroplet impacts on surfaces: Effect of the substrate nature

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2013-05, Vol.303, p.179-183

2013

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Double protein functionalized poly-[epsi]-caprolactone surfaces: in depth ToF-SIMS and XPS characterization

Journal of materials science. Materials in medicine, 2012-02, Vol.23 (2), p.293

2012

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Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF–SIMS and XPS characterization

Journal of materials science. Materials in medicine, 2012-02, Vol.23 (2), p.293-305

2012

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Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Surface and interface analysis, 2014-11, Vol.46 (S1), p.54-57

2014

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A Route to Self-Organized Honeycomb Microstructured Polystyrene Films and Their Chemical Characterization by ToF-SIMS Imaging

Advanced functional materials, 2007-05, Vol.17 (7), p.1079-1084

2007

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Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

Analytical and bioanalytical chemistry, 2014, Vol.406 (1), p.201-211

2014

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Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles

Analytical chemistry (Washington), 2007-05, Vol.79 (10), p.3673-3689

2007

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Phosphine- and ammonium-functionalized ordered mesoporous carbons as supports for cluster-derived metal nanoparticles

Catalysis today, 2014-10, Vol.235, p.112-126

2014

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Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters

Surface and interface analysis, 2013-01, Vol.45 (1), p.163-166

2013

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The use of argon cluster bombardment for the surface preparation of paint cross-sections for analysis by ToF-SIMS

Surface and interface analysis, 2014-10, Vol.46 (10-11), p.781-785

2014

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Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection

Surface and interface analysis, 2013-01, Vol.45 (1), p.46-49

2013

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Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules: Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation

Analytical chemistry (Washington), 2003-12, Vol.75 (24), p.6875-6885

2003

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Interest of silver and gold metallization for molecular SIMS and SIMS imaging

Applied surface science, 2004-06, Vol.231, p.250-255

2004

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A sub-ppm level formaldehyde gas sensor based on Zn-doped NiO prepared by a co-precipitation route

Dynamics of Molecular Impacts on Soft Materials: From Fullerenes to Organic Nanodrops

Atmospheric Pressure Plasma Deposition of Hydrophilic/Phobic Patterns and Thin Film Laminates on Any Surface

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

Computer Simulations of the Sputtering of Metallic, Organic, and Metal―Organic Surfaces with Bin and C60 Projectiles

Sputtering of polymers by keV clusters: Microscopic views of the molecular dynamics

Grafting of 4-pyrrolyphenyldiazonium in situ generated on NiTi, an adhesion promoter for pyrrole electropolymerisation?

Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition

Plasma polymerization of C4Cl6 and C2H2Cl4 at atmospheric pressure

Time-of-Flight Secondary Ion Mass Spectrometry Investigation of the Orientation of Adsorbed Antibodies on SAMs Correlated to Biorecognition Tests

Ni0.9Zn0.1O/ZnO nanocomposite prepared by malonate coprecipitation route for gas sensing

Probing the Orientation of β‑Lactoglobulin on Gold Surfaces Modified by Alkyl Thiol Self-Assembled Monolayers

Water nanodroplet impacts on surfaces: Effect of the substrate nature

Double protein functionalized poly-[epsi]-caprolactone surfaces: in depth ToF-SIMS and XPS characterization

Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF–SIMS and XPS characterization

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

A Route to Self-Organized Honeycomb Microstructured Polystyrene Films and Their Chemical Characterization by ToF-SIMS Imaging

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga+, In+) and Fullerene Projectiles

Phosphine- and ammonium-functionalized ordered mesoporous carbons as supports for cluster-derived metal nanoparticles

Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters

The use of argon cluster bombardment for the surface preparation of paint cross-sections for analysis by ToF-SIMS

Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection

Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules: Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation

Interest of silver and gold metallization for molecular SIMS and SIMS imaging

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