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Investigation of negative differential resistance in metal-edge-contact MoS2 field effect transistor

Journal of applied physics, 2024-02, Vol.135 (6)

2024

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Proposal for Capacitance Matching in Negative Capacitance Field-Effect Transistors

IEEE electron device letters, 2019-03, Vol.40 (3), p.463-466

2019

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Fast Multi-ANN Composite Models for Repeater Optimization in Presence of Parametric Uncertainty for on-Chip Hybrid Copper-Graphene Interconnects

IEEE access, 2023, Vol.11, p.131191-131204

2023

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Compact Modeling of Parasitic Capacitances in GAAFETs for Advanced Technology Nodes

IEEE journal of the Electron Devices Society, 2023, Vol.11, p.510-517

2023

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BSIM-CMG Compact Model for IC CAD: from FinFET to Gate-All-Around FET Technology

Journal of microelectronic manufacturing, 2020-12, Vol.3 (4), p.1-8

2020

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Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node

IEEE electron device letters, 2019-06, Vol.40 (6), p.985-988

2019

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A Deep Learning Space Mapping Based Enhancement of Compact Models for Accurate Prediction of Trapping in GaN HEMTs from DC to mm-Wave Frequency

2023 IEEE/MTT-S International Microwave Symposium - IMS 2023, 2023, p.89-92

2023

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Compact Modeling of Surface Potential, Drain Current and Terminal Charges in Negative Capacitance Nanosheet FET including Quasi-Ballistic Transport

IEEE journal of the Electron Devices Society, 2020, Vol.8, p.1168-1176

2020

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Gate-All-Around FET Design Rule for Suppression of Excess Non-Linearity

IEEE electron device letters, 2020-12, Vol.41 (12), p.1750-1753

2020

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Compact Modeling of Flicker Noise in HEMTs

IEEE journal of the Electron Devices Society, 2014-11, Vol.2 (6), p.174-178

2014

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Compact Modeling of Temperature Effects in FDSOI and FinFET Devices Down to Cryogenic Temperatures

IEEE transactions on electron devices, 2021-09, Vol.68 (9), p.4223-4230

2021

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Characterization of RF Noise in UTBB FD-SOI MOSFET

IEEE journal of the Electron Devices Society, 2016-11, Vol.4 (6), p.379-386

2016

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Compact Modeling of Compound Semiconductor Memory ULTRARAM: A Universal Memory Device

2024 Device Research Conference (DRC), 2024, p.1-2

2024

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Impact of Doped Hafnium Oxides on Memory Window and Low-Frequency Noise in Ferroelectric FETs

IEEE transactions on electron devices, 2024-07, Vol.71 (7), p.4015-4020

2024

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Enhanced Optoelectronic Traits of Monolayer h-BAs for Augmented NOx (NO and NO2) Gas Sensing

IEEE sensors journal, 2024-07, Vol.24 (13), p.20504-20511

2024

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Enhanced Optoelectronic Traits of Monolayer h-BAs for Augmented NO x (NO and NO 2 ) Gas Sensing

IEEE sensors journal, 2024-07, Vol.24 (13), p.20504-20511

2024

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Unified Compact Model for Nanowire Transistors Including Quantum Effects and Quasi-Ballistic Transport

IEEE transactions on electron devices, 2017-04, Vol.64 (4), p.1837-1845

2017

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Machine Learning Augmented Compact Modeling for Simultaneous Improvement in Computational Speed and Accuracy

IEEE transactions on electron devices, 2024-01, Vol.71 (1), p.1-7

2024

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Analysis of 1/f and G–R noise in Phosphorene FETs

Solid-state electronics, 2023-02, Vol.200, p.108530, Article 108530

2023

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A Space Mapping Augmented Compact Model for Uncertainty Quantification of GaN HEMT Devices and Circuits in the Presence of Trap Effects

IEEE transactions on electron devices, 2024-11, Vol.71 (11), p.6581-6587

2024

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Deep Learning-Based Fast BSIM-CMG Parameter Extraction for General Input Dataset

IEEE transactions on electron devices, 2023-07, Vol.70 (7), p.1-5

2023

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Combining Prior Knowledge with Transfer Learning (PKID-TL) for Fast Neural Network Enabled Uncertainty Quantification of Graphene On-Chip Interconnects

IEEE transactions on components, packaging, and manufacturing technology (2011), 2024-07, p.1-1

2024

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Design Optimization Techniques in Nanosheet Transistor for RF Applications

IEEE transactions on electron devices, 2020-10, Vol.67 (10), p.4515-4520

2020

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Machine Learning-Assisted Multiobjective Optimization of Advanced Node Gate-All-Around Transistor for Logic and RF Applications

IEEE transactions on electron devices, 2024-02, Vol.71 (2), p.1-7

2024

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Modified Knowledge-Based Neural Networks Using Control Variates for the Fast Uncertainty Quantification of On-Chip MWCNT Interconnects

IEEE transactions on electromagnetic compatibility, 2023-08, Vol.65 (4), p.1-15

2023

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Investigation of negative differential resistance in metal-edge-contact MoS2 field effect transistor

Proposal for Capacitance Matching in Negative Capacitance Field-Effect Transistors

Fast Multi-ANN Composite Models for Repeater Optimization in Presence of Parametric Uncertainty for on-Chip Hybrid Copper-Graphene Interconnects

Compact Modeling of Parasitic Capacitances in GAAFETs for Advanced Technology Nodes

BSIM-CMG Compact Model for IC CAD: from FinFET to Gate-All-Around FET Technology

Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node

A Deep Learning Space Mapping Based Enhancement of Compact Models for Accurate Prediction of Trapping in GaN HEMTs from DC to mm-Wave Frequency

Compact Modeling of Surface Potential, Drain Current and Terminal Charges in Negative Capacitance Nanosheet FET including Quasi-Ballistic Transport

Gate-All-Around FET Design Rule for Suppression of Excess Non-Linearity

Compact Modeling of Flicker Noise in HEMTs

Compact Modeling of Temperature Effects in FDSOI and FinFET Devices Down to Cryogenic Temperatures

Characterization of RF Noise in UTBB FD-SOI MOSFET

Compact Modeling of Compound Semiconductor Memory ULTRARAM: A Universal Memory Device

Impact of Doped Hafnium Oxides on Memory Window and Low-Frequency Noise in Ferroelectric FETs

Enhanced Optoelectronic Traits of Monolayer h-BAs for Augmented NOx (NO and NO2) Gas Sensing

Enhanced Optoelectronic Traits of Monolayer h-BAs for Augmented NO x (NO and NO 2 ) Gas Sensing

Unified Compact Model for Nanowire Transistors Including Quantum Effects and Quasi-Ballistic Transport

Machine Learning Augmented Compact Modeling for Simultaneous Improvement in Computational Speed and Accuracy

Analysis of 1/f and G–R noise in Phosphorene FETs

A Space Mapping Augmented Compact Model for Uncertainty Quantification of GaN HEMT Devices and Circuits in the Presence of Trap Effects

Deep Learning-Based Fast BSIM-CMG Parameter Extraction for General Input Dataset

Combining Prior Knowledge with Transfer Learning (PKID-TL) for Fast Neural Network Enabled Uncertainty Quantification of Graphene On-Chip Interconnects

Design Optimization Techniques in Nanosheet Transistor for RF Applications

Machine Learning-Assisted Multiobjective Optimization of Advanced Node Gate-All-Around Transistor for Logic and RF Applications

Modified Knowledge-Based Neural Networks Using Control Variates for the Fast Uncertainty Quantification of On-Chip MWCNT Interconnects

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