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Advances in Scanning Force Microscopy for Dimensional Metrology

CIRP annals, 2006, Vol.55 (2), p.841-878

2006

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Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head

Review of scientific instruments, 2012-01, Vol.83 (1), p.013703-013703-6

2012

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A high-resolution, self-sensing and self-actuated probe for micro- and nano-coordinate metrology and scanning force microscopy

CIRP annals, 2010, Vol.59 (1), p.517-520

2010

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Oxide Layer Mass Determination at the Silicon Sphere of the Avogadro Project

IEEE transactions on instrumentation and measurement, 2009-04, Vol.58 (4), p.891-896

2009

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A hybrid scanning probe microscope (SPM) module based on a DVD optical head

Measurement science & technology, 2009-08, Vol.20 (8), p.084005

2009

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Determination of the Avogadro constant via the silicon route

Metrologia, 2003-10, Vol.40 (5), p.271-287

2003

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Simultaneous multiple degrees of freedom (DoF) measurement system

Measurement science & technology, 2016-08, Vol.27 (8), p.84011

2016

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Optical study of single InAs on In0.12Ga0.88As self-assembled quantum dots: biexciton binding energy dependence on the dots size

Applied physics. B, Lasers and optics, 2006-07, Vol.84 (1-2), p.317-322

2006

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Novel design for an ultra high precision 3D micro probe for CMM applications

Procedia engineering, 2010, Vol.5, p.705-712

2010

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Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size

Metrologia, 2019-01, Vol.56 (1A), p.4004

2019

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Oxide layer mass determination at the silicon sphere of the Avogadro Project

2008 Conference on Precision Electromagnetic Measurements Digest, 2008, p.408-409

2008

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Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures

Applied physics. A, Materials science & processing, 2003-04, Vol.76 (6), p.889-892

2003

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Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings

Metrologia, 2010-01, Vol.47, p.04006-04006

2010

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Low‐temperature scanning system for near‐ and far‐field optical investigations

Journal of microscopy (Oxford), 2003-03, Vol.209 (3), p.199-204

2003

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A compact sensor head for simultaneous scanning force and near-field optical microscopy

Precision engineering, 2002-04, Vol.26 (2), p.199-203

2002

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Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

Microelectronic engineering, 2001-09, Vol.57, p.721-728

2001

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Improving the performance of interferometers in metrological scanning probe microscopes

Measurement science & technology, 2004-02, Vol.15 (2), p.444-450

2004

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Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams

Journal of microscopy (Oxford), 1999-05, Vol.194 (2‐3), p.335-339

1999

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3D metrology with a compact scanning probe microscope based on self-sensing cantilever probes

Measurement science & technology, 2007-02, Vol.18 (2), p.328-333

2007

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Monolithic gallium arsenide cantilever for scanning near-field microscopy

Ultramicroscopy, 1998-03, Vol.71 (1), p.99-105

1998

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Status of the international effort on the x-ray crystal density work and its progress towards a measurement of the Avogadro constant

2008 Conference on Precision Electromagnetic Measurements Digest, 2008, p.300-301

2008

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Glass and silicon probes: A comparative theoretical study for near-field optical microscopy

Journal of applied physics, 1998-07, Vol.84 (1), p.52-57

1998

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Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

Measurement science & technology, 2003-12, Vol.14 (12), p.2139-2143

2003

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Near-field optoelectronic detector probes based on standard scanning force cantilevers

Applied physics letters, 1995-10, Vol.67 (14), p.1981-1983

1995

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Cantilever temperature characterization in low temperature vacuum atomic force microscope

Review of scientific instruments, 2006-04, Vol.77 (4), p.043704-043704-4

2006

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Advances in Scanning Force Microscopy for Dimensional Metrology

Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head

A high-resolution, self-sensing and self-actuated probe for micro- and nano-coordinate metrology and scanning force microscopy

Oxide Layer Mass Determination at the Silicon Sphere of the Avogadro Project

A hybrid scanning probe microscope (SPM) module based on a DVD optical head

Determination of the Avogadro constant via the silicon route

Simultaneous multiple degrees of freedom (DoF) measurement system

Optical study of single InAs on In0.12Ga0.88As self-assembled quantum dots: biexciton binding energy dependence on the dots size

Novel design for an ultra high precision 3D micro probe for CMM applications

Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size

Oxide layer mass determination at the silicon sphere of the Avogadro Project

Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures

Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings

Low‐temperature scanning system for near‐ and far‐field optical investigations

A compact sensor head for simultaneous scanning force and near-field optical microscopy

Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

Improving the performance of interferometers in metrological scanning probe microscopes

Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams

3D metrology with a compact scanning probe microscope based on self-sensing cantilever probes

Monolithic gallium arsenide cantilever for scanning near-field microscopy

Status of the international effort on the x-ray crystal density work and its progress towards a measurement of the Avogadro constant

Glass and silicon probes: A comparative theoretical study for near-field optical microscopy

Development of a scanning probe microscope compact sensor head featuring a diamond probe mounted on a quartz tuning fork

Near-field optoelectronic detector probes based on standard scanning force cantilevers

Cantilever temperature characterization in low temperature vacuum atomic force microscope

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