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Sensibilisation au développement d’accélérateurs matériels sur FPGA

Journal sur l'enseignement des sciences et technologies de l'information et des systèmes, 2012-01, Vol.11 (2012), p.3

2012

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Architectures de mémoire

Les Presses du réel, 2019

2019

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Frequency estimation via weighted multipoint interpolated DFT

IET science, measurement & technology, 2008-01, Vol.2 (1), p.1-8

2008

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Amplitude Estimation by a Multipoint Interpolated DFT Approach

IEEE transactions on instrumentation and measurement, 2009-05, Vol.58 (5), p.1316-1323

2009

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IEEE_Xplore

A Disruptive Receiver Architecture Dedicated to Software-Defined Radio

IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 2008-04, Vol.55 (4), p.344-348

2008

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IEEE_Xplore

Accuracy of Sine Wave Frequency Estimation by Multipoint Interpolated DFT Approach

IEEE transactions on instrumentation and measurement, 2010-11, Vol.59 (11), p.2808-2815

2010

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IEEE_Xplore

A distributed test system for pipelined ADCs

Measurement : journal of the International Measurement Confederation, 2009, Vol.42 (1), p.38-43

2009

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Internal jitter noise measurement procedure of a switched capacitor circuit

Measurement : journal of the International Measurement Confederation, 2009, Vol.42 (1), p.1-8

2009

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Signal generation using single-bit sigma-delta techniques

IEEE transactions on instrumentation and measurement, 2004-08, Vol.53 (4), p.1240-1244

2004

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IEEE_Xplore

A Low Power and Low Signal 5-bit 25 MS/s Pipelined ADC for Monolithic Active Pixel Sensors

IEEE transactions on nuclear science, 2007-08, Vol.54 (4), p.1195-1200

2007

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IEEE_Xplore

Top-down design methodology of a multi-bit continuous-time delta–sigma modulator

Analog integrated circuits and signal processing, 2009-08, Vol.60 (1-2), p.145-153

2009

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Noncoherent spectral analysis of ADC using filter Bank

IEEE transactions on instrumentation and measurement, 2004-06, Vol.53 (3), p.652-660

2004

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IEEE_Xplore

Noise Power Estimation by the Three-Parameter and Four-Parameter Sine-Fit Algorithms

IEEE transactions on instrumentation and measurement, 2012-12, Vol.61 (12), p.3234-3240

2012

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IEEE_Xplore

[ADC Characterization in Time Domain] Frequency Estimation to Linearize Time-Domain Analysis of A/D Converters

IEEE transactions on instrumentation and measurement, 2006-10, Vol.55 (5), p.1536-1545

2006

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IEEE_Xplore

Accuracy of the Normalized Frequency Estimation of a Discrete-Time Sine-Wave by the Energy-Based Method

IEEE transactions on instrumentation and measurement, 2012-01, Vol.61 (1), p.111-121

2012

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IEEE_Xplore

Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform

Measurement : journal of the International Measurement Confederation, 2002-03, Vol.31 (2), p.77-91

2002

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Bandpass sampling Rx system design issues and architecture comparison for low power RF standards

2010 IEEE International Symposium on Circuits and Systems (ISCAS), 2010, p.3921-3924

2010

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IEEE_Xplore

A low power and low signal 4 bit 50MS/s double sampling pipelined ADC for Monolithic Active Pixel Sensors

Journal of instrumentation, 2008-03, Vol.3 (3), p.P03002-P03002, Article P03002

2008

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An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy

IEEE transactions on instrumentation and measurement, 2003-02, Vol.52 (1), p.135-142

2003

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IEEE_Xplore

A new orthogonal online digital calibration for time-interleaved analog-to-digital converters

2008 IEEE International Symposium on Circuits and Systems, 2008, p.576-579

2008

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IEEE_Xplore

Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter

IEEE transactions on instrumentation and measurement, 2011-03, Vol.60 (3), p.768-775

2011

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IEEE_Xplore

Modeling Methodology for Analog Front-End Circuits Dedicated to High-Temperature Instrumentation and Measurement Applications

IEEE transactions on instrumentation and measurement, 2011-05, Vol.60 (5), p.1555-1564

2011

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IEEE_Xplore

A survey on the dynamic characterization of A/D converters

Measurement : journal of the International Measurement Confederation, 1998-12, Vol.24 (4), p.263-279

1998

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Mixed Cartesian feedback for Zero-IF WCDMA transmitter

Analog integrated circuits and signal processing, 2012-12, Vol.73 (3), p.909-917

2012

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Localization of defects in die-attach assembly by continuous wavelet transform using scanning acoustic microscopy

Microelectronics and reliability, 1999, Vol.39 (6), p.1095-1101

1999

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Sensibilisation au développement d’accélérateurs matériels sur FPGA

Architectures de mémoire

Frequency estimation via weighted multipoint interpolated DFT

Amplitude Estimation by a Multipoint Interpolated DFT Approach

A Disruptive Receiver Architecture Dedicated to Software-Defined Radio

Accuracy of Sine Wave Frequency Estimation by Multipoint Interpolated DFT Approach

A distributed test system for pipelined ADCs

Internal jitter noise measurement procedure of a switched capacitor circuit

Signal generation using single-bit sigma-delta techniques

A Low Power and Low Signal 5-bit 25 MS/s Pipelined ADC for Monolithic Active Pixel Sensors

Top-down design methodology of a multi-bit continuous-time delta–sigma modulator

Noncoherent spectral analysis of ADC using filter Bank

Noise Power Estimation by the Three-Parameter and Four-Parameter Sine-Fit Algorithms

[ADC Characterization in Time Domain] Frequency Estimation to Linearize Time-Domain Analysis of A/D Converters

Accuracy of the Normalized Frequency Estimation of a Discrete-Time Sine-Wave by the Energy-Based Method

Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform

Bandpass sampling Rx system design issues and architecture comparison for low power RF standards

A low power and low signal 4 bit 50MS/s double sampling pipelined ADC for Monolithic Active Pixel Sensors

An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy

A new orthogonal online digital calibration for time-interleaved analog-to-digital converters

Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter

Modeling Methodology for Analog Front-End Circuits Dedicated to High-Temperature Instrumentation and Measurement Applications

A survey on the dynamic characterization of A/D converters

Mixed Cartesian feedback for Zero-IF WCDMA transmitter

Localization of defects in die-attach assembly by continuous wavelet transform using scanning acoustic microscopy

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