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Monitoring, Diagnosis, and Power Forecasting for Photovoltaic Fields: A Review

International Journal of Photoenergy, 2017-01, Vol.2017 (2017), p.1-13

2017

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Graphene applications in Schottky barrier solar cells

Thin solid films, 2012-11, Vol.522, p.390-394

2012

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Closed-Form Analytical Expression for the Conductive and Dissipative Parameters of the MOS-C Equivalent Circuit

IEEE transactions on electron devices, 2011-10, Vol.58 (10), p.3643-3646

2011

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Experimental Study on Power Consumption in Lifetime Engineered Power Diodes

IEEE transactions on electron devices, 2009-11, Vol.56 (11), p.2819-2824

2009

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Approximate Closed-Form Analytical Solution for Minority Carrier Transport in Opaque Heavily Doped Regions Under Illuminated Conditions

IEEE transactions on electron devices, 2006-11, Vol.53 (11), p.2837-2839

2006

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Thermal feedback blocks for fast and reliable electrothermal circuit simulation of power circuits at module level

2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2016, p.187-190

2016

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Experimental measurements of majority and minority carrier lifetime profile in SI epilayers by the use of an improved OCVD method

IEEE electron device letters, 2005-07, Vol.26 (7), p.501-503

2005

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Capacitance-Voltage Investigation of Encapsulated Graphene/Silicon Solar Cells

IEEE transactions on electron devices, 2023-08, Vol.70 (8), p.4243-4250

2023

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Thermo-Electrochemical Simulations in SPICE of Li-Ion Batteries under Active Charge Balancing

2023 International Conference on Clean Electrical Power (ICCEP), 2023, p.8-12

2023

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Determining the shunt resistance of individual subcell in Tandem Perovskite solar cells

2023 International Conference on Clean Electrical Power (ICCEP), 2023, p.924-928

2023

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Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique

IEEE electron device letters, 2004-09, Vol.25 (9), p.602-604

2004

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An improved model for extraction of strongly spatial dependent lifetimes with the AC lifetime profiling technique

IEEE transactions on electron devices, 1999-08, Vol.46 (8), p.1808-1810

1999

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All electrical resistivity profiling technique for ion implanted semiconductor materials

Materials science & engineering. B, Solid-state materials for advanced technology, 2005-12, Vol.124, p.310-313

2005

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Diagnosis of power losses in PV plants by means of UAV thermography

2019 International Conference on Clean Electrical Power (ICCEP), 2019, p.306-310

2019

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An electrical technique for the measurement of the interface recombination velocity based on a three-terminal test structure

Materials science & engineering. B, Solid-state materials for advanced technology, 2003-09, Vol.102 (1), p.198-202

2003

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Single-Panel Voltage Zeroing System for Safe Access on PV Plants

IEEE journal of photovoltaics, 2015-09, Vol.5 (5), p.1428-1434

2015

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Electrical measurement of the lattice damage induced by α -particle implantation in silicon

Vacuum, 2005-05, Vol.78 (2), p.623-626

2005

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A new bypass circuit for hot spot mitigation

2016 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM), 2016, p.1067-1072

2016

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Modelling and characterisation of the input I– V curves of bipolar JFET structures showing a negative resistance behaviour

Solid-state electronics, 2001-03, Vol.45 (3), p.483-488

2001

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A power line communication on DC bus with photovoltaic strings

3rd Renewable Power Generation Conference (RPG 2014), 2014, p.8.16

2014

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Parametric description of the effect of electron irradiation on recombination lifetime in silicon layers: an experimental approach

IEEE transactions on power electronics, 1999-01, Vol.14 (1), p.117-123

1999

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An optical technique to measure the bulk lifetime and the surface recombination velocity in silicon samples based on a laser diode probe system

Solid-state electronics, 1998-06, Vol.42 (6), p.1035-1038

1998

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A measurement method of the ideal I– V characteristics of diodes up to the built-in voltage limit

Solid-state electronics, 1999, Vol.43 (7), p.1201-1207

1999

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An improved test structure for recombination lifetime profile measurements in very thick silicon wafers

IEEE electron device letters, 1999-01, Vol.20 (1), p.45-47

1999

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Modulation technique for grid-tied PV multilevel inverter

2016 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM), 2016, p.923-928

2016

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Monitoring, Diagnosis, and Power Forecasting for Photovoltaic Fields: A Review

Graphene applications in Schottky barrier solar cells

Closed-Form Analytical Expression for the Conductive and Dissipative Parameters of the MOS-C Equivalent Circuit

Experimental Study on Power Consumption in Lifetime Engineered Power Diodes

Approximate Closed-Form Analytical Solution for Minority Carrier Transport in Opaque Heavily Doped Regions Under Illuminated Conditions

Thermal feedback blocks for fast and reliable electrothermal circuit simulation of power circuits at module level

Experimental measurements of majority and minority carrier lifetime profile in SI epilayers by the use of an improved OCVD method

Capacitance-Voltage Investigation of Encapsulated Graphene/Silicon Solar Cells

Thermo-Electrochemical Simulations in SPICE of Li-Ion Batteries under Active Charge Balancing

Determining the shunt resistance of individual subcell in Tandem Perovskite solar cells

Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique

An improved model for extraction of strongly spatial dependent lifetimes with the AC lifetime profiling technique

All electrical resistivity profiling technique for ion implanted semiconductor materials

Diagnosis of power losses in PV plants by means of UAV thermography

An electrical technique for the measurement of the interface recombination velocity based on a three-terminal test structure

Single-Panel Voltage Zeroing System for Safe Access on PV Plants

Electrical measurement of the lattice damage induced by α -particle implantation in silicon

A new bypass circuit for hot spot mitigation

Modelling and characterisation of the input I– V curves of bipolar JFET structures showing a negative resistance behaviour

A power line communication on DC bus with photovoltaic strings

Parametric description of the effect of electron irradiation on recombination lifetime in silicon layers: an experimental approach

An optical technique to measure the bulk lifetime and the surface recombination velocity in silicon samples based on a laser diode probe system

A measurement method of the ideal I– V characteristics of diodes up to the built-in voltage limit

An improved test structure for recombination lifetime profile measurements in very thick silicon wafers

Modulation technique for grid-tied PV multilevel inverter

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