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Measurement science and technology-essential fundamentals of mechatronics

Measurement science & technology, 1994-12, Vol.5 (12), p.1415-1428

1994

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Testing analogue circuits by power supply voltage control

Electronics letters, 1994-02, Vol.30 (3), p.214-215

1994

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Class AB regulated cascode current memory cell

Electronics letters, 1994-10, Vol.30 (22), p.1821-1822, Article 1821

1994

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Supply current monitoring in cmos circuits for reliability prediction and test

Quality and reliability engineering international, 1992, Vol.8 (6), p.543-548

1992

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Design-for-test structure to facilitate test vector application with low performance loss in non-test mode

Electronics letters, 1993, Vol.29 (16), p.1438-1440

1993

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Design and testing of a PI controller ASIC

Microprocessors and microsystems, 1995, Vol.19 (1), p.15-22

1995

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A conceptual study for a computer-based tool to support electronics design in a mechatronic environment

Microprocessors and microsystems, 2000-04, Vol.24 (2), p.51-61

2000

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A design-for-test structure for optimising analogue and mixed signal IC test

European Design and Test Conference: Proceedings of the 1995 European conference on Design and Test; 06-09 Mar. 1995, 1995, p.24-24

1995

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Pascal for Electronic Engineers

Second edition., 1988

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Sensors for microprocessor-based applications

Journal of physics. E, Scientific instruments, 1983-10, Vol.16 (10), p.952-958

1983

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Engineering solutions to the A-level physics problem

Physics education, 1983-01, Vol.18 (1), p.31-34, Article 311

Dorey, A P

1983

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Basic Electromagnetism and its Applications

Compton, A. J

1st edition., 1986

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Feedback Circuits and Op. Amps

Horrocks, D. H

Second edition., 1990

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A fault simulation methodology for MEMS

Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 27-30 Mar. 2000, 2000, p.476-485

2000

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Instrumentation: Transducers and Interfacing

New edition., 1990

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Electronic sensors

Physics in technology, 1980-07, Vol.11 (4), p.158-159

Dorey, A P

1980

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A review of testing methods for mixed-signal ICs

Microelectronics, 1993-10, Vol.24 (6), p.663-674

1993

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Measurement science and technology-essential fundamentals of mechatronics: review article

Measurement science & technology, 1994-12, Vol.5 (12), p.1415-1428

1994

Volltextzugriff (PDF)

A fault simulation methodology for MEMS

Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537), 2000, p.476-483

2000

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Semiconductor and microelectronic sensors

Physics in technology, 1981-01, Vol.12 (1), p.24-28

Dorey, A.P

1981

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Heat transfer at low temperatures

Cryogenics (Guildford), 1965-01, Vol.5 (3), p.146-151

Dorey, A.P

1965

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The effect of strain on MOS transistors

Solid-state electronics, 1969-01, Vol.12 (3), p.185-189

1969

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Frequency output piezoresistive pressure sensor

Sensors and actuators, 1983, Vol.4, p.77-83

1983

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A mark-to-period encoder/decoder for low-level sensor communications

Sensors and actuators, 1989-05, Vol.17 (3), p.601-608

1989

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Exposing floating gate defects in analogue CMOS circuits by power supply voltage control testing technique

Proceedings of the 8th International Conference on VLSI Design, 1995, p.239-242

1995

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Measurement science and technology-essential fundamentals of mechatronics

Testing analogue circuits by power supply voltage control

Class AB regulated cascode current memory cell

Supply current monitoring in cmos circuits for reliability prediction and test

Design-for-test structure to facilitate test vector application with low performance loss in non-test mode

Design and testing of a PI controller ASIC

A conceptual study for a computer-based tool to support electronics design in a mechatronic environment

A design-for-test structure for optimising analogue and mixed signal IC test

Pascal for Electronic Engineers

Sensors for microprocessor-based applications

Engineering solutions to the A-level physics problem

Basic Electromagnetism and its Applications

Feedback Circuits and Op. Amps

A fault simulation methodology for MEMS

Instrumentation: Transducers and Interfacing

Electronic sensors

A review of testing methods for mixed-signal ICs

Measurement science and technology-essential fundamentals of mechatronics: review article

A fault simulation methodology for MEMS

Semiconductor and microelectronic sensors

Heat transfer at low temperatures

The effect of strain on MOS transistors

Frequency output piezoresistive pressure sensor

A mark-to-period encoder/decoder for low-level sensor communications

Exposing floating gate defects in analogue CMOS circuits by power supply voltage control testing technique

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