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Converters dedicated to long-term monitoring of strain gauge transducers

IEEE journal of solid-state circuits, 1997-03, Vol.32 (3), p.349-356

1997

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A wafer level reliability method for short-loop processing

Microelectronics and reliability, 1996-11, Vol.36 (11-12), p.1859-1862

1996

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Numerical modelling of mechanisms involved in latchup triggering by a laser beam

IEEE transactions on nuclear science, 1996-06, Vol.43 (3), p.944-951

1996

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Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

Quality and reliability engineering international, 1993-07, Vol.9 (4), p.303-308

1993

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Ratiometric temperature stable current reference

Electronics letters, 1993, Vol.29 (14), p.1284-1285

1993

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Localization and characterization of latch-up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology

Quality and reliability engineering international, 1993-11, Vol.9 (6), p.477-482

1993

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Implementation of laser beam sensitive cells: A new approach for integrated circuits testing

Quality and reliability engineering international, 1994, Vol.10 (4), p.273-277

1994

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New current-mode synthesis method for dynamic translinear filters and its applications in hearing instruments

Analog integrated circuits and signal processing, 2000, Vol.22 (2), p.221-229

2000

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Augmentation of Cancer Cachexia Components With Targeted Acupuncture in Patients With Gastrointestinal Cancers: A Randomized Controlled Pilot Study

Integrative cancer therapies, 2019-01, Vol.18, p.1534735418823269

2019

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Analysis of Latchup susceptibility to internal logical states by using a Laser beam

Microelectronic engineering, 1996, Vol.31 (1), p.79-86

1996

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Logic state analysis using a laser beam

Microelectronic engineering, 1992-03, Vol.16 (1), p.287-294

1992

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Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing

Quality and reliability engineering international, 1992, Vol.8 (3), p.213-217

1992

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Simple determination of BJT extrinsic base resistance

Electronics letters, 1991, Vol.27 (21), p.1895

1991

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A 1-Volt 300 MHz fully integrated oscillator

Proceedings of the 24th European Solid-State Circuits Conference, 1998, p.388-391

1998

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ASICs failure analysis using two complementary techniques : external electrical testing and internal contactless laser beam testing: Quality and reliability of electronic devices

Quality and reliability engineering international, 1992, Vol.8 (3), p.213-217

1992

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Practical supergain head sized arrays

1997

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Localization of faulty operators on an ASIC by the use of a laser beam

Proceedings Euro ASIC '92, 1992, p.412-413

1992

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Accurate analog VLSI model of calcium-dependent bursting neurons

Proceedings of International Conference on Neural Networks (ICNN'97), 1997, Vol.2, p.882-887 vol.2

1997

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Method for determining the effective base resistance of bipolar transistors

Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting, 1996, p.122-125

1996

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A new current mode synthesis method for dynamic translinear filters and its application in hearing aids

1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196), 1998, Vol.2, p.337-340 vol.2

1998

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A BiCMOS ASIC for modeling biological neurons

Proceedings of the Fourth International Conference on Microelectronics for Neural Networks and Fuzzy Systems, 1994, p.202-206

1994

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Project on an electrically reprogrammable fast read-out memory using bipolar tetrode transistors

ESSCIRC 76: 2nd European Solid State Circuits Conference, 1976, p.46-47

1976

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A BiCMOS implementation of the Hodgkin-Huxley formalism

Proceedings of Fifth International Conference on Microelectronics for Neural Networks, 1996, p.311-316

1996

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A low voltage and low power voltage/frequency converter with automatic offset compensation for biomedical telemetry

1997 2nd IEEE-CAS Region 8 Workshop on Analog and Mixed IC Design, 1997, p.32-35

1997

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A new approach to determine active doping profiles of bipolar transistors using electrical measurements and a physical device simulator

Proceedings of International Conference on Microelectronic Test Structures, 1996, p.291-295

1996

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Converters dedicated to long-term monitoring of strain gauge transducers

A wafer level reliability method for short-loop processing

Numerical modelling of mechanisms involved in latchup triggering by a laser beam

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

Ratiometric temperature stable current reference

Localization and characterization of latch-up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology

Implementation of laser beam sensitive cells: A new approach for integrated circuits testing

New current-mode synthesis method for dynamic translinear filters and its applications in hearing instruments

Augmentation of Cancer Cachexia Components With Targeted Acupuncture in Patients With Gastrointestinal Cancers: A Randomized Controlled Pilot Study

Analysis of Latchup susceptibility to internal logical states by using a Laser beam

Logic state analysis using a laser beam

Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing

Simple determination of BJT extrinsic base resistance

A 1-Volt 300 MHz fully integrated oscillator

ASICs failure analysis using two complementary techniques : external electrical testing and internal contactless laser beam testing: Quality and reliability of electronic devices

Practical supergain head sized arrays

Localization of faulty operators on an ASIC by the use of a laser beam

Accurate analog VLSI model of calcium-dependent bursting neurons

Method for determining the effective base resistance of bipolar transistors

A new current mode synthesis method for dynamic translinear filters and its application in hearing aids

A BiCMOS ASIC for modeling biological neurons

Project on an electrically reprogrammable fast read-out memory using bipolar tetrode transistors

A BiCMOS implementation of the Hodgkin-Huxley formalism

A low voltage and low power voltage/frequency converter with automatic offset compensation for biomedical telemetry

A new approach to determine active doping profiles of bipolar transistors using electrical measurements and a physical device simulator

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