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Structural and electrical characterization of heteroepitaxial lead zirconate titanate thin films

Journal of applied physics, 1996-01, Vol.79 (1), p.393-402

1996

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Inverted spin valves for magnetic heads and sensors

Journal of applied physics, 1997-04, Vol.81 (8), p.4915-4917

1997

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‘3-Dimensional’ TEM silicon-device analysis by combining plan-view and FIB sample preparation

Materials science & engineering. B, Solid-state materials for advanced technology, 2003-09, Vol.102 (1), p.63-69

De Veirman, A.E.M.

2003

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi5

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1994-11, Vol.70 (5), p.837-849

1994

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Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N)

Thin solid films, 1992-02, Vol.208 (2), p.181-188

1992

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The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition

Thin solid films, 1995-10, Vol.266 (2), p.157-167

1995

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On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers

IEEE transactions on magnetics, 1995-11, Vol.31 (6), p.3918-3920

1995

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AlSiV and AlSiVPd films as alternatives for AlSiCu interconnect: microstructure and its impact on reliability

Thin solid films, 1994-01, Vol.246 (1), p.164-171

1994

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Transmission electron microscopy study of PbTiO3 and PbZrxTi1−xO3 films

Ferroelectrics, 1996-08, Vol.184 (1), p.51-59

1996

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MBE Growth of CoO and Fe3O4 films and CoO/Fe3O4 multilayers

MRS proceedings, 1994, Vol.341

1994

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Hetero-epitaxial oxidic conductor La1-xSrxCoO3 prepared by pulsed laser deposition

Applied surface science, 1993-05, Vol.69 (1-4), p.212-215

1993

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Quasicrystalline (Al,Pd)-phase in dilute AlSiVPd films for use as reliable metallizations in ultralarge scale integration

Scripta metallurgica et materialia, 1993-10, Vol.29 (8), p.1017-1022

1993

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Transmission electron microscopy study of PbTiO 3 and PbZr x Ti 1−x O 3 films

Ferroelectrics, 1996-08, Vol.184 (1), p.51-59

1996

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Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films

Thin solid films, 1996-07, Vol.280 (1-2), p.136-141

1996

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Influence of grain size on the transport properties of Ni(80 )Fe(20) and Cu thin films

IEEE transactions on magnetics, 1995-11, Vol.31 (6), p.3865-3867

1995

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A new diamond-related compound in the system Al2O3-Al4C3-AlN

Journal of solid state chemistry, 1995-12, Vol.120 (2), p.211-215

1995

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Reliability, Properties and Microstructure of W 80 Ti 20 Diffusion Barriers Between Al-Based Metallizations and Si

MRS proceedings, 1992, Vol.260, Article 787

1992

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Cross-sectional transmission electron microscopy studies of metallic multilayers

Ultramicroscopy, 1993-06, Vol.51 (1), p.306-315

1993

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi\+v\5\-v

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1994-11, Vol.70 (5), p.837-849

1994

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi 5

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1994-11, Vol.70 (5), p.837-849

1994

Volltextzugriff (PDF)

Transmission electron microsocopy study of unhydrided, dehydrided and annealed LaNi sub 5

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1994-11, Vol.70 (5), p.837-849

1994

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PbTiO3 and PbZrxTi1-zO3 Films:Microstructure and Properties

MRS proceedings, 1994, Vol.341

1994

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PbTiO 3 and PbZr x Ti 1-z O 3 Films:Microstructure and Properties

MRS proceedings, 1994, Vol.341, Article 329

1994

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MBE Growth of CoO and Fe 3 O 4 films and CoO/Fe 3 O 4 multilayers

MRS proceedings, 1994, Vol.341, Article 23

1994

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Reliability, Properties and Microstructure of W80Ti20 Diffusion Barriers Between Al-Based Metallizations and Si

MRS proceedings, 1992, Vol.260

1992

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Structural and electrical characterization of heteroepitaxial lead zirconate titanate thin films

Inverted spin valves for magnetic heads and sensors

‘3-Dimensional’ TEM silicon-device analysis by combining plan-view and FIB sample preparation

Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi5

Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N)

The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition

On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers

AlSiV and AlSiVPd films as alternatives for AlSiCu interconnect: microstructure and its impact on reliability

Transmission electron microscopy study of PbTiO3 and PbZrxTi1−xO3 films

MBE Growth of CoO and Fe3O4 films and CoO/Fe3O4 multilayers

Hetero-epitaxial oxidic conductor La1-xSrxCoO3 prepared by pulsed laser deposition

Quasicrystalline (Al,Pd)-phase in dilute AlSiVPd films for use as reliable metallizations in ultralarge scale integration

Transmission electron microscopy study of PbTiO 3 and PbZr x Ti 1−x O 3 films

Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films

Influence of grain size on the transport properties of Ni(80 )Fe(20) and Cu thin films

A new diamond-related compound in the system Al2O3-Al4C3-AlN

Reliability, Properties and Microstructure of W 80 Ti 20 Diffusion Barriers Between Al-Based Metallizations and Si

Cross-sectional transmission electron microscopy studies of metallic multilayers

Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi\+v\5\-v

Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi 5

Transmission electron microsocopy study of unhydrided, dehydrided and annealed LaNi sub 5

PbTiO3 and PbZrxTi1-zO3 Films:Microstructure and Properties

PbTiO 3 and PbZr x Ti 1-z O 3 Films:Microstructure and Properties

MBE Growth of CoO and Fe 3 O 4 films and CoO/Fe 3 O 4 multilayers

Reliability, Properties and Microstructure of W80Ti20 Diffusion Barriers Between Al-Based Metallizations and Si

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