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Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles

Nature communications, 2017-11, Vol.8 (1), p.1855-8, Article 1855

2017

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Practical estimation of XPS binding energies using widely available quantum chemistry software

Surface and interface analysis, 2018-01, Vol.50 (1), p.5-12

2018

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Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications

Surface and interface analysis, 2013-12, Vol.45 (13), p.1859-1868

2013

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Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships

Surface and interface analysis, 2001-01, Vol.31 (1), p.23-34

Cumpson, Peter J.

2001

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Water as a catalytic switch in the oxidation of aryl alcohols by polymer incarcerated rhodium nanoparticles

Catalysis science & technology, 2017, Vol.7 (18), p.3985-3998

2017

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Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers

Surface and interface analysis, 2013-02, Vol.45 (2), p.601-604

2013

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Argon cluster‐ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield

Surface and interface analysis, 2022-04, Vol.54 (4), p.341-348

2022

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The Thickogram: a method for easy film thickness measurement in XPS

Surface and interface analysis, 2000-06, Vol.29 (6), p.403-406

Cumpson, Peter J

2000

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Surface analysis characterisation of gum binders used in modern watercolour paints

Applied surface science, 2016-02, Vol.364, p.870-877

2016

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Observed damage during Argon gas cluster depth profiles of compound semiconductors

Journal of applied physics, 2014-08, Vol.116 (5)

2014

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Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration

Measurement science & technology, 2004-07, Vol.15 (7), p.1337-1346

2004

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Novel rhodium on carbon catalysts for the oxidation of benzyl alcohol to benzaldehyde: A study of the modification of metal/support interactions by acid pre-treatments

Applied catalysis. A, General, 2019-01, Vol.570, p.271-282

2019

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Conversion of glucose to fructose over Sn and Ga-doped zeolite Y in methanol and water media

Applied catalysis. A, General, 2022-07, Vol.642, p.118689, Article 118689

2022

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Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Journal of applied physics, 2013-09, Vol.114 (12)

2013

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Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis

Surface and interface analysis, 2016-12, Vol.48 (12), p.1328-1336

2016

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Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2013-03, Vol.31 (2)

2013

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Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method

Surface and interface analysis, 2015-10, Vol.47 (10), p.986-993

2015

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Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface

Surface and interface analysis, 2016-07, Vol.48 (7), p.575-579

2016

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Recent Developments in the Study of the Surface-Stability of Platinum and Platinum-Iridium Mass Standards: Quantifying mercury and carbon contamination on platinum-iridium alloy surfaces using XPS

Johnson Matthey technology review, 2014-10, Vol.58 (4), p.180-188

Cumpson, Peter J.

2014

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Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging

Surface and interface analysis, 2015-02, Vol.47 (2), p.173-175

2015

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A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration

Nanotechnology, 2013-08, Vol.24 (33), p.335706-335706

2013

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Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques

Microscopy and microanalysis, 2016-10, Vol.22 (5), p.939-947

2016

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Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI

Nanotechnology, 2003-12, Vol.14 (12), p.1279-1288

2003

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Reactive intercalation and oxidation at the buried graphene-germanium interface

APL materials, 2019-07, Vol.7 (7), p.071107-071107-8

2019

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Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

Journal of electron spectroscopy and related phenomena, 1995-05, Vol.73 (1), p.25-52

Cumpson, Peter J.

1995

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Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles

Practical estimation of XPS binding energies using widely available quantum chemistry software

Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications

Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships

Water as a catalytic switch in the oxidation of aryl alcohols by polymer incarcerated rhodium nanoparticles

Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers

Argon cluster‐ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield

The Thickogram: a method for easy film thickness measurement in XPS

Surface analysis characterisation of gum binders used in modern watercolour paints

Observed damage during Argon gas cluster depth profiles of compound semiconductors

Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration

Novel rhodium on carbon catalysts for the oxidation of benzyl alcohol to benzaldehyde: A study of the modification of metal/support interactions by acid pre-treatments

Conversion of glucose to fructose over Sn and Ga-doped zeolite Y in methanol and water media

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis

Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers

Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method

Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface

Recent Developments in the Study of the Surface-Stability of Platinum and Platinum-Iridium Mass Standards: Quantifying mercury and carbon contamination on platinum-iridium alloy surfaces using XPS

Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging

A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration

Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques

Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI

Reactive intercalation and oxidation at the buried graphene-germanium interface

Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

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