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On the suitability of non-hardened high density SRAMs for space applications

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1507-1513

1991

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Human astrovirus coat protein binds C1q and MBL inhibiting the classical and the lectin pathways of complement activation

Molecular immunology, 2009-09, Vol.46 (14), p.2824-2824

2009

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Confirmation of the Luminous Blue Variable Status of MWC 930

Advances in Astronomy, 2014-01, Vol.2014 (2014), p.i1-9

2014

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Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2325-2332

1997

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Update on parts SEE suspectibility from heavy ions

IEEE transactions on nuclear science, 1991-12, Vol.38 (6), p.1529-1539

1991

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Observation of single event upsets in analog microcircuits

IEEE transactions on nuclear science, 1993-12, Vol.40 (6), p.1838-1844

1993

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Comparative SEU sensitivities to relativistic heavy ions

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2475-2482

1998

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Single event effects in pulse width modulation controllers

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2968-2973

1996

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Single event burnout sensitivity of embedded field effect transistors

IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1395-1402

1999

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Single-word multiple-bit upsets in static random access devices

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1993-12, Vol.40 (6), p.1941-1946

1993

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The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2982-2989

1996

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Serendipitous SEU hardening of resistive load SRAMs

IEEE transactions on nuclear science, 1996-06, Vol.43 (3), p.931-935

1996

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Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices

IEEE transactions on nuclear science, 1995-12, Vol.42 (6), p.1823-1828

1995

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The impact of ASIC devices on the SEU vulnerability of space-borne computers

IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.1685-1692

1992

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Update on parts SEE susceptibility from heavy ions

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1529-1539

1991

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SEU and latchup tolerant advanced CMOS technology

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1990-12, Vol.37 (6), p.1869-1875

1990

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SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588), 2001, p.182-189

2001

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SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2000, p.45-52

2000

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Permanent single event functional interrupts (SEFIs) in 128- and 256-megabit synchronous dynamic random access memories (SDRAMs)

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588), 2001, p.6-13

2001

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Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2000, p.53-60

2000

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Single event functional interrupt (SEFI) sensitivity in microcircuits

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294), 1997, p.311-318

1997

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Serendipitous SEU hardening of resistive load SRAMs

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems, 1995, p.354-358

1995

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The SEU in pulse width modulation controllers with soft start and shutdown circuits

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference, 1997, p.73-79

1997

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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385), 1998, p.51-57

1998

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Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527), 2000, p.85-88

2000

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On the suitability of non-hardened high density SRAMs for space applications

Human astrovirus coat protein binds C1q and MBL inhibiting the classical and the lectin pathways of complement activation

Confirmation of the Luminous Blue Variable Status of MWC 930

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

Update on parts SEE suspectibility from heavy ions

Observation of single event upsets in analog microcircuits

Comparative SEU sensitivities to relativistic heavy ions

Single event effects in pulse width modulation controllers

Single event burnout sensitivity of embedded field effect transistors

Single-word multiple-bit upsets in static random access devices

The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space

Serendipitous SEU hardening of resistive load SRAMs

Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices

The impact of ASIC devices on the SEU vulnerability of space-borne computers

Update on parts SEE susceptibility from heavy ions

SEU and latchup tolerant advanced CMOS technology

SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

Permanent single event functional interrupts (SEFIs) in 128- and 256-megabit synchronous dynamic random access memories (SDRAMs)

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

Single event functional interrupt (SEFI) sensitivity in microcircuits

Serendipitous SEU hardening of resistive load SRAMs

The SEU in pulse width modulation controllers with soft start and shutdown circuits

Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor

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