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A study of radiation vulnerability of ferroelectric material and devices
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-06, Vol.41 (3), p.495-502
1994
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Charge collection mechanisms in MOS/SOI transistors irradiated by energetic heavy ions
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1226-1233
1991
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From substrate to VLSI: investigation of hardened SIMOX without epitaxy, for dose, dose rate and SEU phenomena
IEEE transactions on nuclear science, 1988-12, Vol.35 (6), p.1355-1360
1988
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Induction of a Melanoma‐Specific Antibody Response by a Monovalent, but not a Divalent, Synthetic GM2 Neoglycopeptide
ChemMedChem, 2009-04, Vol.4 (4), p.582-587
2009
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SEU in SOI SRAMs-a static model
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-06, Vol.41 (3), p.607-612
1994
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CMOS/SOI hardening at 100 Mrad (SiO/sub 2/)
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1990-12, Vol.37 (6), p.2013-2019
1990
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Comparison of the sensitivity to heavy ions of SRAM's in different SIMOX technologies
IEEE electron device letters, 1994-03, Vol.15 (3), p.82-84
1994
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Comparison of the Sensitivity to Heavy Ions of Sram in Different Simox Technologies
1992 IEEE International SOI Conference, 1992, p.60-61
1992
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Insulator photocurrents: application to dose rate hardening of CMOS/SOI integrated circuits
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294), 1997, p.133-140
1997
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Ionizing effects in vitreous silica and SOI SIMOX buried oxide by study of trapped charges and paramagnetic defect creation
RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems, 1991, p.168-172
1991
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1H- and 2H-NMR studies of a fragment of PMP1, a regulatory subunit associated with the yeast plasma membrane H +-ATPase. Conformational properties and lipid-peptide interactions
Biochimie, 1998-05, Vol.80 (5), p.451-459
1998
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Heavy ion sensitivity of a SRAM in SOI bulk-like technology
RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3), 1993, p.571-576
1993
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Insulator photocurrents: application to dose rate hardening of CMOS/SOI integrated circuits
IEEE transactions on nuclear science, 1998-06, Vol.45 (3), p.1412-1419
1998
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Vulnerability analysis of DT fusion diagnostics for laser megajoule facility a new tool: Diacad
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471), 1999, p.44-49
1999
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