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Atomic scale structure of sputtered metal multilayers

Acta materialia, 2001-11, Vol.49 (19), p.4005-4015

2001

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Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

Applied physics letters, 2006-04, Vol.88 (15), p.154103-154103-3

2006

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Toward atom probe tomography of microelectronic devices

Journal of physics. Conference series, 2011-11, Vol.326 (1), p.012030-4

2011

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Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice

Ultramicroscopy, 2011-02, Vol.111 (3), p.207-211

2011

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Three-dimensional atom probe analysis of green- and blue-emitting InxGa1−xN∕GaN multiple quantum well structures

Journal of applied physics, 2008-07, Vol.104 (1)

2008

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Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe

Ultramicroscopy, 2007-09, Vol.107 (9), p.720-725

2007

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Measurements of field enhancement introduced by a local electrode

Ultramicroscopy, 2001-10, Vol.89 (1), p.163-167

2001

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Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate

Applied physics letters, 2011-05, Vol.98 (19)

2011

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Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.1018-1019

2008

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Compositional inhomogeneity of a high-efficiency InxGa1−xN based multiple quantum well ultraviolet emitter studied by three dimensional atom probe

Applied physics letters, 2008-01, Vol.92 (4)

2008

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Performance Advances in LEAP systems

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1120-1121

2014

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Atom probe tomography of a commercial light emitting diode

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12030-4

2013

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Atom Probe Tomography Analysis of Grain Boundaries in CdTe

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.928-929

2012

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Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel

Materials science and technology, 2008-06, Vol.24 (6), p.641-650

2008

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High resolution structural characterization of giant magnetoresistance structures containing a nano-oxide layer

Applied physics letters, 2007-07, Vol.91 (1), p.011905-011905-3

2007

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Analysis of Bulk Dielectrics with Atom Probe Tomography

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.1254-1255

2008

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The Role of Atomic Scale Investigation in the Development of Nanoscale Materials for Information Storage Applications

Microscopy and microanalysis, 2004-06, Vol.10 (3), p.366-372

2004

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New Applications in Atom Probe Tomography

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.926-927

2012

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Atom probe reveals the structure of InxGa1-xN based quantum wells in three dimensions

Physica status solidi. B. Basic research, 2008, Vol.245 (5), p.861-867

2008

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Mg dopant distribution in an AlGaN/GaN p-type superlattice assessed using atom probe tomography, TEM and SIMS

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012014

2010

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Atom probe reveals the structure of Inx Ga1-x N based quantum wells in three dimensions

Physica Status Solidi (b), 2008-05, Vol.245 (5), p.861-867

2008

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Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces

Applied physics letters, 2000-07, Vol.77 (5), p.726-728

2000

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Atom Probe Tomography Studies of GaN-Based Semiconductor Materials

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.280-281

2009

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Arsenic Segregation to Dislocation Loops in Silicon

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.324-325

2008

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Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)

Journal of applied physics, 2001-06, Vol.89 (11), p.7517-7521

2001

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Atomic scale structure of sputtered metal multilayers

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe

Toward atom probe tomography of microelectronic devices

Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice

Three-dimensional atom probe analysis of green- and blue-emitting InxGa1−xN∕GaN multiple quantum well structures

Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe

Measurements of field enhancement introduced by a local electrode

Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate

Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy

Compositional inhomogeneity of a high-efficiency InxGa1−xN based multiple quantum well ultraviolet emitter studied by three dimensional atom probe

Performance Advances in LEAP systems

Atom probe tomography of a commercial light emitting diode

Atom Probe Tomography Analysis of Grain Boundaries in CdTe

Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel

High resolution structural characterization of giant magnetoresistance structures containing a nano-oxide layer

Analysis of Bulk Dielectrics with Atom Probe Tomography

The Role of Atomic Scale Investigation in the Development of Nanoscale Materials for Information Storage Applications

New Applications in Atom Probe Tomography

Atom probe reveals the structure of InxGa1-xN based quantum wells in three dimensions

Mg dopant distribution in an AlGaN/GaN p-type superlattice assessed using atom probe tomography, TEM and SIMS

Atom probe reveals the structure of Inx Ga1-x N based quantum wells in three dimensions

Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces

Atom Probe Tomography Studies of GaN-Based Semiconductor Materials

Arsenic Segregation to Dislocation Loops in Silicon

Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited)

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