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Effects of surface oxidation on the crystallization characteristics of Ge-rich Ge-Sb-Te alloys thin films

Applied surface science, 2020-07, Vol.518, p.146227, Article 146227

2020

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Crucial role of oxygen on the bulk and surface electronic properties of stable β phase of tungsten

Scientific reports, 2022-03, Vol.12 (1), p.3865-3865, Article 3865

2022

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Optical visualization and electrical characterization of fast-rising pulsed dielectric barrier discharge for airflow control applications

Journal of applied physics, 2012-02, Vol.111 (3), p.033303-033303-13

2012

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Unravelling oxygen driven α to β phase transformation in tungsten

Scientific reports, 2020-09, Vol.10 (1), p.14718-14718, Article 14718

2020

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Atomic scale microstructural insights of superconducting β-tungsten thin films

Journal of materials research, 2022-12, Vol.37 (23), p.4338-4347

2022

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Surface self-diffusion of silicon during high temperature annealing

Journal of applied physics, 2014-04, Vol.115 (13), p.134903-333

2014

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Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy

Physical review letters, 2008-04, Vol.100 (15), p.156602-156602, Article 156602

2008

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Transmission Electron Microscopy in Micro-nanoelectronics

Claverie, Alain

1. Aufl., 2013

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Retraction: “Atomistic simulation of damage accumulation and amorphization in Ge” [J. Appl. Phys. 117, 055703 (2015)]

Journal of applied physics, 2017-01, Vol.121 (4)

2017

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Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique

APL materials, 2019-04, Vol.7 (4), p.041120-041120-6

2019

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An application of speckle-based background oriented schlieren for optical calorimetry

Experimental thermal and fluid science, 2018-02, Vol.91, p.470-478

2018

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Atomistic simulation of damage accumulation and amorphization in Ge

Journal of applied physics, 2015-02, Vol.117 (5), p.55703-55703

2015

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Modeling stress retarded self-limiting oxidation of suspended silicon nanowires for the development of silicon nanowire-based nanodevices

Journal of applied physics, 2011-08, Vol.110 (3), p.033524-033524-8

2011

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Characterization of the ECN spray A in different facilities. Part 2: spray vaporization and combustion

Oil & gas science and technology, 2020, Vol.75, p.78

2020

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Acute Aquatic Toxicity to Zebrafish and Bioaccumulation in Marine Mussels of Antimony Tin Oxide Nanoparticles

Nanomaterials (Basel, Switzerland), 2023-07, Vol.13 (14), p.2112

2023

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Tulip flame - the mechanism of flame front inversion

Combustion and flame, 2014-12, Vol.161 (12), p.3051-3062

2014

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On the origin of dislocation loops in irradiated materials: A point of view from silicon

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2016-05, Vol.374, p.82-89

2016

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Strain mapping in layers and devices by electron holography

Physica status solidi. A, Applications and materials science, 2011-03, Vol.208 (3), p.580-583

2011

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HCCI and SICI combustion modes analysis with simultaneous PLIF imaging of formaldehyde and high-speed chemiluminescence in a rapid compression machine

Combustion and flame, 2019-04, Vol.202, p.58-77

2019

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Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Materials science & engineering. B, Solid-state materials for advanced technology, 2008-12, Vol.154, p.221-224

2008

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An experimental study of Ge diffusion through Ge2Sb2Te5

Materials science in semiconductor processing, 2022-12, Vol.152, p.107101, Article 107101

2022

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A comparison of Ge, Sb and Te thermal diffusion through Ge2Sb2Te5

Materials science in semiconductor processing, 2023-09, Vol.164, p.107644, Article 107644

2023

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Revealing the Impact of Prestructural Ordering in GaSb Thin Films

Journal of physical chemistry. C, 2022-09, Vol.126 (36), p.15405-15414

2022

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Chemical phase segregation during the crystallization of Ge-rich GeSbTe alloys

Journal of materials chemistry. C, Materials for optical and electronic devices, 2019, Vol.7 (28), p.872-8729

2019

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Impact of He and H relative depth distributions on the result of sequential He+ and H+ ion implantation and annealing in silicon

Journal of applied physics, 2018-04, Vol.123 (16), p.161556-161559

2018

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Effects of surface oxidation on the crystallization characteristics of Ge-rich Ge-Sb-Te alloys thin films

Crucial role of oxygen on the bulk and surface electronic properties of stable β phase of tungsten

Optical visualization and electrical characterization of fast-rising pulsed dielectric barrier discharge for airflow control applications

Unravelling oxygen driven α to β phase transformation in tungsten

Atomic scale microstructural insights of superconducting β-tungsten thin films

Surface self-diffusion of silicon during high temperature annealing

Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy

Transmission Electron Microscopy in Micro-nanoelectronics

Retraction: “Atomistic simulation of damage accumulation and amorphization in Ge” [J. Appl. Phys. 117, 055703 (2015)]

Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique

An application of speckle-based background oriented schlieren for optical calorimetry

Atomistic simulation of damage accumulation and amorphization in Ge

Modeling stress retarded self-limiting oxidation of suspended silicon nanowires for the development of silicon nanowire-based nanodevices

Characterization of the ECN spray A in different facilities. Part 2: spray vaporization and combustion

Acute Aquatic Toxicity to Zebrafish and Bioaccumulation in Marine Mussels of Antimony Tin Oxide Nanoparticles

Tulip flame - the mechanism of flame front inversion

On the origin of dislocation loops in irradiated materials: A point of view from silicon

Strain mapping in layers and devices by electron holography

HCCI and SICI combustion modes analysis with simultaneous PLIF imaging of formaldehyde and high-speed chemiluminescence in a rapid compression machine

Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

An experimental study of Ge diffusion through Ge2Sb2Te5

A comparison of Ge, Sb and Te thermal diffusion through Ge2Sb2Te5

Revealing the Impact of Prestructural Ordering in GaSb Thin Films

Chemical phase segregation during the crystallization of Ge-rich GeSbTe alloys

Impact of He and H relative depth distributions on the result of sequential He+ and H+ ion implantation and annealing in silicon

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