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Effects of Particle Size and Density on the Packed-Bed Pyrolysis of Wood

Energy & fuels, 2013-11, Vol.27 (11), p.6781-6791

2013

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Effects of Particle Size and Density on the Packed-Bed Pyrolysis of Wood

Energy & fuels, 2013, Vol.27 (NOVDEC), p.6781-6791

2013

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Some reliability aspects of IGBT modules for high-power applications

Ciappa, Mauro P. M

2000

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Backtrack modeling to locate the origin of tar balls depositing along the west coast of India

The Science of the total environment, 2016-11, Vol.569-570, p.31-39

2016

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A unified model for TCAD simulation of the charge generated in semiconductors by low-energy alpha particles and protons

Microelectronics and reliability, 2022-11, Vol.138, p.114725, Article 114725

2022

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Simulations of dredged sediment spreading on a Posidonia oceanica meadow off the Ligurian coast, Northwestern Mediterranean

Marine pollution bulletin, 2014-02, Vol.79 (1-2), p.196-204

2014

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A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors

Microelectronics and reliability, 2002-09, Vol.42 (9), p.1653-1658

2002

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Association between the APOE genotype and psychopathologic symptoms in Alzheimer's disease

Neurology, 2002-04, Vol.58 (8), p.1182-1188

2002

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Fine mapping of 10q and 18q for familial Alzheimer's disease in Caribbean Hispanics

Molecular psychiatry, 2004-11, Vol.9 (11), p.1042-1051

2004

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Two-dimensional dopant imaging of silicon carbide devices by secondary electron potential contrast

Microelectronic engineering, 2007-03, Vol.84 (3), p.413-418

2007

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A founder mutation in presenilin 1 causing early-onset Alzheimer disease in unrelated Caribbean Hispanic families

JAMA : the journal of the American Medical Association, 2001-11, Vol.286 (18), p.2257

2001

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Chromosome-12 Mapping of Late-Onset Alzheimer Disease among Caribbean Hispanics

American journal of human genetics, 2002-01, Vol.70 (1), p.237-243

2002

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Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy

2014 44th European Solid State Device Research Conference (ESSDERC), 2014, p.357-360

2014

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Virtual reliability assessment of integrated power switches based on multi-domain simulation approach

Microelectronics and reliability, 2007-09, Vol.47 (9), p.1343-1348

2007

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Altered PET Functional Brain Responses in Cognitively Intact Elderly Persons at Risk for Alzheimer Disease (Carriers of the 4 Allele)

The American journal of geriatric psychiatry, 2004-12, Vol.12 (6), p.596-605

Scarmeas, N.

2004

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23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2012)

Microelectronics and reliability, 2012, Vol.52 (9-10)

2012

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Computational investigation of the accuracy of constant-dC scanning capacitance microscopy for ultra-shallow doping profile characterization

Solid-state electronics, 2002-03, Vol.46 (3), p.445-449

2002

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Altered PET functional brain responses in cognitively intact elderly persons at risk for Alzheimer disease (carriers of the epsilon4 allele)

The American journal of geriatric psychiatry, 2004-11, Vol.12 (6), p.596-605

2004

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Quantification of scanning capacitance microscopy measurements for 2D dopant profiling

Microelectronics and reliability, 2000-08, Vol.40 (8-10), p.1395-1399

2000

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Plastic-strain of aluminium interconnections during pulsed operation of IGBT multichip modules

Quality and reliability engineering international, 1996-07, Vol.12 (4), p.297-303

1996

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Overstress and electrostatic discharge in CMOS and BCD integrated circuits

Microelectronics and reliability, 2000-08, Vol.40 (8-10), p.1739-1746

2000

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Lifetime prediction and design of reliability tests for high-power devices in automotive applications

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual, 2003, p.523-528

2003

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Lifetime extrapolation for IGBT modules under realistic operation conditions

Microelectronics and reliability, 1999, Vol.39 (6), p.1131-1136

1999

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Thermal characterization of IGBT power modules

Microelectronics and reliability, 1997-10, Vol.37 (10), p.1731-1734

1997

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Modeling of Cross-Talk Effects in Floating-Gate Devices Using TCAD Simulations

2006 International Conference on Simulation of Semiconductor Processes and Devices, 2006, p.224-227

2006

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Effects of Particle Size and Density on the Packed-Bed Pyrolysis of Wood

Effects of Particle Size and Density on the Packed-Bed Pyrolysis of Wood

Some reliability aspects of IGBT modules for high-power applications

Backtrack modeling to locate the origin of tar balls depositing along the west coast of India

A unified model for TCAD simulation of the charge generated in semiconductors by low-energy alpha particles and protons

Simulations of dredged sediment spreading on a Posidonia oceanica meadow off the Ligurian coast, Northwestern Mediterranean

A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors

Association between the APOE genotype and psychopathologic symptoms in Alzheimer's disease

Fine mapping of 10q and 18q for familial Alzheimer's disease in Caribbean Hispanics

Two-dimensional dopant imaging of silicon carbide devices by secondary electron potential contrast

A founder mutation in presenilin 1 causing early-onset Alzheimer disease in unrelated Caribbean Hispanic families

Chromosome-12 Mapping of Late-Onset Alzheimer Disease among Caribbean Hispanics

Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy

Virtual reliability assessment of integrated power switches based on multi-domain simulation approach

Altered PET Functional Brain Responses in Cognitively Intact Elderly Persons at Risk for Alzheimer Disease (Carriers of the 4 Allele)

23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2012)

Computational investigation of the accuracy of constant-dC scanning capacitance microscopy for ultra-shallow doping profile characterization

Altered PET functional brain responses in cognitively intact elderly persons at risk for Alzheimer disease (carriers of the epsilon4 allele)

Quantification of scanning capacitance microscopy measurements for 2D dopant profiling

Plastic-strain of aluminium interconnections during pulsed operation of IGBT multichip modules

Overstress and electrostatic discharge in CMOS and BCD integrated circuits

Lifetime prediction and design of reliability tests for high-power devices in automotive applications

Lifetime extrapolation for IGBT modules under realistic operation conditions

Thermal characterization of IGBT power modules

Modeling of Cross-Talk Effects in Floating-Gate Devices Using TCAD Simulations

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