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Understanding the effects of chemical reactions at the cathode-electrolyte interface in sulfide based all-solid-state batteries

Journal of materials chemistry. A, Materials for energy and sustainability, 2019, Vol.7 (4), p.22967-22976

2019

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Bandgap measurement of thin dielectric films using monochromated STEM-EELS

Ultramicroscopy, 2009-08, Vol.109 (9), p.1183-1188

2009

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Low temperature growth of complete monolayer graphene films on Ni-doped copper and gold catalysts by a self-limiting surface reaction

Carbon (New York), 2013-11, Vol.64, p.315-323

2013

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Anion control as a strategy to achieve high-mobility and high-stability oxide thin-film transistors

Scientific reports, 2013-03, Vol.3 (1), p.1459-1459, Article 1459

2013

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Changes in Chemical and Structural Properties of Phase-Change Material GeTe with Nitrogen Doping and Annealing

Japanese Journal of Applied Physics, 2010-06, Vol.49 (6), p.061801-061801-4

2010

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Electronic and optical properties of Al2O3/SiO2 thin films grown on Si substrate

Journal of physics. D, Applied physics, 2010-06, Vol.43 (25), p.255301-255301

2010

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Understanding the structural, electrical, and optical properties of monolayer h-phase RuO2 nanosheets: a combined experimental and computational study

NPG Asia materials, 2018-04, Vol.10 (4), p.266-276

2018

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Band alignment of atomic layer deposited (HfZrO4) 1−x (SiO2) x gate dielectrics on Si (100)

Applied physics letters, 2015-11, Vol.107 (18)

2015

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Electrical, electronic and optical properties of amorphous indium zinc tin oxide thin films

Applied surface science, 2014-10, Vol.315, p.454-458

2014

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Reflection electron energy loss spectroscopy for ultrathin gate oxide materials

Surface and interface analysis, 2012-06, Vol.44 (6), p.623-627

2012

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Direct characterization of the energy level alignments and molecular components in an organic hetero-junction by integrated photoemission spectroscopy and reflection electron energy loss spectroscopy analysis

Nanotechnology, 2016-08, Vol.27 (34), p.345704-345704

2016

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Determination of the Energy Band Gap Depending on the Oxidized Structures of Quantum Dots

Journal of physical chemistry. C, 2012-05, Vol.116 (21), p.11792-11796

2012

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Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS

Journal of electron spectroscopy and related phenomena, 2012-03, Vol.185 (1-2), p.18-22

2012

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Band alignment of atomic layer deposited (ZrO2)x(SiO2)1−x gate dielectrics on Si (100)

Applied physics letters, 2009-05, Vol.94 (21), p.212902

2009

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Nitrogen-Doping Effect on Ge2Sb2Te5 Chalcogenide Alloy Films during Annealing

Jpn J Appl Phys, 2010-10, Vol.49 (10), p.101201-101201-4

2010

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Observation of molecular nitrogen in N-doped Ge2Sb2Te5

Applied physics letters, 2006-12, Vol.89 (24)

2006

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Damage profiles of Si (001) surface via Ar cluster beam sputtering

Surface and interface analysis, 2013-01, Vol.45 (1), p.150-153

2013

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Effects of gas environment on electronic and optical properties of amorphous indium zinc tin oxide thin films

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2013-05, Vol.31 (3)

2013

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Electronic and optical properties of La-aluminate dielectric thin films on Si (100)

Surface and interface analysis, 2010-10, Vol.42 (10-11), p.1566-1569

2010

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A High-Density Array of Size-Controlled Silicon Nanodots in a Silicon Oxide Nanowire by Electron-Stimulated Oxygen Expulsion

Nano letters, 2009-05, Vol.9 (5), p.1780-1786

2009

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Local oxidation states of Ni, Co, and Mn atoms within pristine and charged LixNi0.88Co0.08Mn0.04O2 primary particles

The Journal of physics and chemistry of solids, 2021-01, Vol.148, Article 109732

2021

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Band alignment and optical properties of (ZrO2)0.66(HfO2)0.34 gate dielectrics thin films on p-Si (100)

Journal of surface analysis, 2011, Vol.17 (3), p.203-207

2011

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Effect of oxygen deficiency on electronic properties and local structure of amorphous tantalum oxide thin films

Materials research bulletin, 2016-10, Vol.82, p.1-6

2016

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In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron Spectroscopy

ACS applied materials & interfaces, 2020-11, Vol.12 (45), p.50628-50637

2020

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Direct characterization of vertical molecular distributions of organic bulk heterojunction structure by photoemission spectroscopy combined with argon gas cluster ion beam sputtering

Applied surface science, 2020-06, Vol.515, p.146102, Article 146102

2020

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Understanding the effects of chemical reactions at the cathode-electrolyte interface in sulfide based all-solid-state batteries

Bandgap measurement of thin dielectric films using monochromated STEM-EELS

Low temperature growth of complete monolayer graphene films on Ni-doped copper and gold catalysts by a self-limiting surface reaction

Anion control as a strategy to achieve high-mobility and high-stability oxide thin-film transistors

Changes in Chemical and Structural Properties of Phase-Change Material GeTe with Nitrogen Doping and Annealing

Electronic and optical properties of Al2O3/SiO2 thin films grown on Si substrate

Understanding the structural, electrical, and optical properties of monolayer h-phase RuO2 nanosheets: a combined experimental and computational study

Band alignment of atomic layer deposited (HfZrO4) 1−x (SiO2) x gate dielectrics on Si (100)

Electrical, electronic and optical properties of amorphous indium zinc tin oxide thin films

Reflection electron energy loss spectroscopy for ultrathin gate oxide materials

Direct characterization of the energy level alignments and molecular components in an organic hetero-junction by integrated photoemission spectroscopy and reflection electron energy loss spectroscopy analysis

Determination of the Energy Band Gap Depending on the Oxidized Structures of Quantum Dots

Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS

Band alignment of atomic layer deposited (ZrO2)x(SiO2)1−x gate dielectrics on Si (100)

Nitrogen-Doping Effect on Ge2Sb2Te5 Chalcogenide Alloy Films during Annealing

Observation of molecular nitrogen in N-doped Ge2Sb2Te5

Damage profiles of Si (001) surface via Ar cluster beam sputtering

Effects of gas environment on electronic and optical properties of amorphous indium zinc tin oxide thin films

Electronic and optical properties of La-aluminate dielectric thin films on Si (100)

A High-Density Array of Size-Controlled Silicon Nanodots in a Silicon Oxide Nanowire by Electron-Stimulated Oxygen Expulsion

Local oxidation states of Ni, Co, and Mn atoms within pristine and charged LixNi0.88Co0.08Mn0.04O2 primary particles

Band alignment and optical properties of (ZrO2)0.66(HfO2)0.34 gate dielectrics thin films on p-Si (100)

Effect of oxygen deficiency on electronic properties and local structure of amorphous tantalum oxide thin films

In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron Spectroscopy

Direct characterization of vertical molecular distributions of organic bulk heterojunction structure by photoemission spectroscopy combined with argon gas cluster ion beam sputtering

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