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Applied physics letters, 2016-02, Vol.108 (8)
2016
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IEEE electron device letters, 2011-08, Vol.32 (8), p.1113-1115
2011
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IEEE transactions on electron devices, 2013-06, Vol.60 (6), p.2031-2037
2013
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2012 IEEE International Solid-State Circuits Conference, 2012, p.392-394
2012
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IEEE transactions on electron devices, 2012-12, Vol.59 (12), p.3503-3509
2012
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2012 Symposium on VLSI Technology (VLSIT), 2012, p.21-22
2012
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IEEE electron device letters, 2012-02, Vol.33 (2), p.242-244
2012
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IEEE journal of solid-state circuits, 2010-10, Vol.45 (10), p.2165-2172
2010
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2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.MY.5.1-MY.5.4
2012
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2010 IEEE International Reliability Physics Symposium, 2010, p.599-603
2010
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2011 9th IEEE International Conference on ASIC, 2011, p.279-282
2011
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2011 Symposium on VLSI Technology - Digest of Technical Papers, 2011, p.32-33
2011
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Japanese Journal of Applied Physics, 2011-04, Vol.50 (4), p.04DD12-04DD12-3
2011
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Japanese Journal of Applied Physics, 2011-04, Vol.50 (4S), p.4
2011
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2010 Symposium on VLSI Technology, 2010, p.173-174
2010
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2012 SEMI Advanced Semiconductor Manufacturing Conference, 2012, p.198-200
2012
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2011 International Reliability Physics Symposium, 2011, p.3E.2.1-3E.2.5
2011
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2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2012, p.149-152
2012
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2010 International Conference on Simulation of Semiconductor Processes and Devices, 2010, p.233-236
2010
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2010 Symposium on VLSI Technology, 2010, p.127-128
2010
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68th Device Research Conference, 2010, p.99-100
2010
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2010 IEEE International Conference on Integrated Circuit Design and Technology, 2010, p.63-66
2010
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2012 International Electron Devices Meeting, 2012, p.20.8.1-20.8.4
2012
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2010 IEEE International Reliability Physics Symposium, 2010, p.611-614
2010
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Microelectronic engineering, 2013-04, Vol.104, p.33-36
2013
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- Ieee Electron Device Letters
- Ieee Transactions On Electron Devices
- Japanese Journal Of Applied Physics
- Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
- Applied Physics Letters
- Chemical Physics
- Ieee Journal Of Solid-State Circuits
- Journal Of Semiconductor Technology And Science
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures Processing, Measurement, And Phenomena