UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Tpeak-to-Tend interval corrected for heart rate: A more precise measure of increased sudden death risk?

Heart rhythm, 2016-11, Vol.13 (11), p.2181-2185

2016

Volltextzugriff (PDF)

Prevalence of Brugada Syndrome in a Large Population of Young Singaporean Men

Circulation (New York, N.Y.), 2020-01, Vol.141 (2), p.155-157

2020

Volltextzugriff (PDF)

ELECTROANATOMIC CHARACTERIZATION OF HYPOPLASTIC LEFT HEART VENTRICULAR TACHYCARDIA: TRANSAORTIC TRANSMEMBRANOUS VENTRICULAR SEPTAL APPROACH VIA MAGNETIC NAVIGATION

Journal of the American College of Cardiology, 2017-03, Vol.69 (11), p.2292-2292

2017

Volltextzugriff (PDF)

Implantation of a dual-chamber permanent pacemaker in a pregnant patient guided by intracardiac echocardiography and electroanatomic mapping

HeartRhythm case reports, 2017-11, Vol.3 (11), p.542-545

2017

Volltextzugriff (PDF)

Risk markers of sudden death on the 12-lead ECG: Tpeak-Tend interval makes the cut

Heart rhythm, 2015-08, Vol.12 (8), p.1798-1799

2015

Volltextzugriff (PDF)

Lower versus higher starting tacrolimus dosing in kidney transplant recipients

Clinical transplantation, 2022-06, Vol.36 (6), p.e14606-n/a

2022

Volltextzugriff (PDF)

Variation in approaches to acute ANCA‐associated vasculitis in Australia and New Zealand: rituximab, plasma exchange and glucocorticoids

Internal medicine journal, 2024-07, Vol.54 (7), p.1097-1105

2024

Volltextzugriff (PDF)

Inappropriate subcutaneous implantable cardioverter-defibrillator shocks for bradycardia

HeartRhythm case reports, 2021-04, Vol.7 (4), p.237-241

2021

Volltextzugriff (PDF)

Wide QRS-T Angle on the 12-Lead ECG as a Predictor of Sudden Death Beyond the LV Ejection Fraction

Journal of cardiovascular electrophysiology, 2016-07, Vol.27 (7), p.833-839

2016

Volltextzugriff (PDF)

Through silicon in-circuit logic analysis for localizing logic pattern failures

Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2043-2049

2012

Volltextzugriff (PDF)

Negative backside thermoreflectance modulation of microscale metal interconnects

Electronics letters, 2011-07, Vol.47 (14), p.821-822

2011

Volltextzugriff (PDF)

Tpeak-to-Tend interval corrected for heart rate: A more precise measure of increased sudden death risk?: Towards an improved sudden death risk prediction

Heart rhythm, 2016-08, Vol.13 (11), p.2181-2185

2016

Volltextzugriff (PDF)

An implantable cardioverter defibrillator in a patient with triple mechanical valves

Clinical case reports, 2018-09, Vol.6 (9), p.1795-1800

2018

Volltextzugriff (PDF)

Determination of Intrinsic Spectra from Frontside & Backside Photon Emission Spectroscopy

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual, 2007, p.620-621

2007

Volltextzugriff (PDF)

Take a Closer Look at Electrically-Enhanced LADA: Setup

Electronic device failure analysis, 2016-08, Vol.18 (3), p.10-16

2016

Volltextzugriff (PDF)

Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysis

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2009, p.11-18

2009

Volltextzugriff (PDF)

A review of near infrared photon emission microscopy and spectroscopy

Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005, 2005, p.275-281

2005

Volltextzugriff (PDF)

Combining Refractive Solid Immersion Lens and Pulsed Laser-Induced Technique for Integrated Circuit Failure Analysis

Electronic device failure analysis, 2010-08, Vol.12 (3), p.20-27

2010

Volltextzugriff (PDF)

Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniques

2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2008, p.1-6

2008

Volltextzugriff (PDF)

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2008, p.1-5

2008

Volltextzugriff (PDF)

A review of laser induced techniques for microelectronic failure analysis

Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743), 2004, p.255-261

2004

Volltextzugriff (PDF)

Demographic, Clinical and Microbiological Characteristics of Maternity Patients: A Canadian Clinical Cohort Study

The Canadian journal of infectious diseases & medical microbiology, 2002, Vol.13 (5), p.311-318

2002

Volltextzugriff (PDF)

DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis

2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2006, p.327-332

2006

Volltextzugriff (PDF)

Detectivity Optimization of InGaAs Photon Emission Microscope Systems

2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2006, p.315-319

2006

Volltextzugriff (PDF)

A new type of local defects in very thin silicon dioxide films on arsenic-implanted p-type silicon

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1995, p.135-139

1995

Volltextzugriff (PDF)

1 – 25 von 117

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(97)
Mit Volltextzugriff
(102)

Publikationsform

Sprache

Englisch
(117)

Erscheinungsjahr

n.n

Thema

Science & Technology
(85)
Technology
(51)
Engineering
(42)
Life Sciences & Biomedicine
(36)
Humans
(31)
Physical Sciences
(25)
Exact Sciences And Technology
(20)
Physics
(20)
Biological And Medical Sciences
(17)
Engineering, Biomedical
(14)
Male
(12)
Medical Sciences
(12)
Female
(11)
Engineering, Electrical & Electronic
(10)
Fluid Dynamics
(10)
Rapid Prototyping
(10)
Applied Sciences
(9)
Failure Analysis
(9)
Fundamental Areas Of Phenomenology
(9)
Mechanics
(9)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Tpeak-to-Tend interval corrected for heart rate: A more precise measure of increased sudden death risk?

Prevalence of Brugada Syndrome in a Large Population of Young Singaporean Men

ELECTROANATOMIC CHARACTERIZATION OF HYPOPLASTIC LEFT HEART VENTRICULAR TACHYCARDIA: TRANSAORTIC TRANSMEMBRANOUS VENTRICULAR SEPTAL APPROACH VIA MAGNETIC NAVIGATION

Implantation of a dual-chamber permanent pacemaker in a pregnant patient guided by intracardiac echocardiography and electroanatomic mapping

Risk markers of sudden death on the 12-lead ECG: Tpeak-Tend interval makes the cut

Lower versus higher starting tacrolimus dosing in kidney transplant recipients

Variation in approaches to acute ANCA‐associated vasculitis in Australia and New Zealand: rituximab, plasma exchange and glucocorticoids

Inappropriate subcutaneous implantable cardioverter-defibrillator shocks for bradycardia

Wide QRS-T Angle on the 12-Lead ECG as a Predictor of Sudden Death Beyond the LV Ejection Fraction

Through silicon in-circuit logic analysis for localizing logic pattern failures

Negative backside thermoreflectance modulation of microscale metal interconnects

Tpeak-to-Tend interval corrected for heart rate: A more precise measure of increased sudden death risk?: Towards an improved sudden death risk prediction

An implantable cardioverter defibrillator in a patient with triple mechanical valves

Determination of Intrinsic Spectra from Frontside & Backside Photon Emission Spectroscopy

Take a Closer Look at Electrically-Enhanced LADA: Setup

Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysis

A review of near infrared photon emission microscopy and spectroscopy

Combining Refractive Solid Immersion Lens and Pulsed Laser-Induced Technique for Integrated Circuit Failure Analysis

Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniques

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

A review of laser induced techniques for microelectronic failure analysis

Demographic, Clinical and Microbiological Characteristics of Maternity Patients: A Canadian Clinical Cohort Study

DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis

Detectivity Optimization of InGaAs Photon Emission Microscope Systems

A new type of local defects in very thin silicon dioxide films on arsenic-implanted p-type silicon

Suchergebnisse filtern