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In situ control of oxygen vacancies in TiO2 by atomic layer deposition for resistive switching devices

Nanotechnology, 2013-07, Vol.24 (29), p.295202-295202

2013

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A Review of Thin-film Thickness Measurements using Optical Methods

International journal of precision engineering and manufacturing, 2024-08, Vol.25 (8), p.1725-1737

2024

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Fourier analysis for rotating-element ellipsometers

Optics letters, 2011-01, Vol.36 (2), p.118

2011

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Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometers

Optics express, 2021-11, Vol.29 (24), p.39428-39448

2021

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Partially Spatial Coherent Thermal Emitter Based on an Epsilon-and-mu-near-zero Metamaterial

Journal of the Korean Physical Society, 2020, 76(10), , pp.889-894

2020

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Change in electrical resistance and thermal stability of nitrogen incorporated Ge2Sb2Te5 films

Applied physics letters, 2007-01, Vol.90 (2)

2007

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Ultrasensitive detection of beta-amyloid 1–42 as a relevant biomarker for Alzheimer's disease in serum

Sensors and actuators. B, Chemical, 2023-12, Vol.396, p.134588, Article 134588

2023

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Analysis of Guided-mode Resonant Grating Filters by Using a Rigorous Coupled-wave Method

Journal of the Korean Physical Society, 2011, 59(2), , pp.326-331

2011

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High-speed 2D materials inspection using a microscopic dynamic spectroscopic imaging ellipsometer

Applied optics (2004), 2024-09, Vol.63 (27), p.7135

2024

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Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry

Optics express, 2023-12, Vol.31 (26), p.44364-44374

2023

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ALD and MOCVD of Ga2O3 Thin Films Using the New Ga Precursor Dimethylgallium Isopropoxide, Me2GaOiPr

Chemical vapor deposition, 2011-09, Vol.17 (7-9), p.191-197

2011

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Discharge physics and atomic layer etching in Ar/C4F6 inductively coupled plasmas with a radio frequency bias

Physics of plasmas, 2021-06, Vol.28 (6)

2021

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Temperature-Dependent Plasmonic Response of Graphene Nanoresonators

ACS photonics, 2022-07, Vol.9 (7), p.2256-2262

2022

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Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometers

Optics express, 2016-11, Vol.24 (23), p.26215-26227

2016

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Normal-incidence type solution immersed silicon (SIS) biosensor for ultra-sensitive, label-free detection of cardiac troponin I

Biosensors & bioelectronics, 2020-11, Vol.168, p.112525-112525, Article 112525

2020

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Ultrasensitive, label-free detection of cardiac biomarkers with optical SIS sensor

Biosensors & bioelectronics, 2017-01, Vol.87, p.242-248

2017

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Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometers

Optics express, 2015-06, Vol.23 (12), p.16481-16491

2015

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Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry

Current Applied Physics, 2017, 17(10), , pp.1329-1334

2017

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Calibration method for rotating-analyser-type spectral imaging ellipsometers

Measurement science & technology, 2005-03, Vol.16 (3), p.716-722

2005

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Technical refinement preserving segment 4 to donor in extended right hepatectomy

Hepato-gastroenterology, 2006-03, Vol.53 (68), p.253

2006

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CHARACTERIZATION OF TRIS (8-HYDROXYQUINOLINE) ALUMINUM ( Alq 3 ) FILM USING SPECTROSCOPIC ELLIPSOMETRY

International journal of modern physics. B, Condensed matter physics, statistical physics, applied physics, 2006-10, Vol.20 (25n27), p.4353-4358

2006

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Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept

Optics express, 2011-11, Vol.19 (24), p.23790-23799

2011

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Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer

Journal of the Optical Society of America. A, Optics, image science, and vision, 2013-07, Vol.30 (7), p.1310

2013

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Characterization of wafer-scale MoS 2 and WSe 2 2D films by spectroscopic ellipsometry

Current applied physics, 2017-10, Vol.17 (10), p.1329-1334

2017

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A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films

Japanese Journal of Applied Physics, 2004-09, Vol.43 (9R), p.6475

2004

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In situ control of oxygen vacancies in TiO2 by atomic layer deposition for resistive switching devices

A Review of Thin-film Thickness Measurements using Optical Methods

Fourier analysis for rotating-element ellipsometers

Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometers

Partially Spatial Coherent Thermal Emitter Based on an Epsilon-and-mu-near-zero Metamaterial

Change in electrical resistance and thermal stability of nitrogen incorporated Ge2Sb2Te5 films

Ultrasensitive detection of beta-amyloid 1–42 as a relevant biomarker for Alzheimer's disease in serum

Analysis of Guided-mode Resonant Grating Filters by Using a Rigorous Coupled-wave Method

High-speed 2D materials inspection using a microscopic dynamic spectroscopic imaging ellipsometer

Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry

ALD and MOCVD of Ga2O3 Thin Films Using the New Ga Precursor Dimethylgallium Isopropoxide, Me2GaOiPr

Discharge physics and atomic layer etching in Ar/C4F6 inductively coupled plasmas with a radio frequency bias

Temperature-Dependent Plasmonic Response of Graphene Nanoresonators

Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometers

Normal-incidence type solution immersed silicon (SIS) biosensor for ultra-sensitive, label-free detection of cardiac troponin I

Ultrasensitive, label-free detection of cardiac biomarkers with optical SIS sensor

Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometers

Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry

Calibration method for rotating-analyser-type spectral imaging ellipsometers

Technical refinement preserving segment 4 to donor in extended right hepatectomy

CHARACTERIZATION OF TRIS (8-HYDROXYQUINOLINE) ALUMINUM ( Alq 3 ) FILM USING SPECTROSCOPIC ELLIPSOMETRY

Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept

Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer

Characterization of wafer-scale MoS 2 and WSe 2 2D films by spectroscopic ellipsometry

A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films

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