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A Charge-Based Model for Long-Channel Cylindrical Surrounding-Gate MOSFETs From Intrinsic Channel to Heavily Doped Body

IEEE transactions on electron devices, 2008-08, Vol.55 (8), p.2187-2194

2008

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Predictive Value of Machine Learning for Recurrence of Atrial Fibrillation after Catheter Ablation: A Systematic Review and Meta-Analysis

Reviews in cardiovascular medicine, 2023-11, Vol.24 (11), p.315

2023

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Effects of labeling on wildlife conservation education

Global ecology and conservation, 2022-01, Vol.33, p.e01997, Article e01997

2022

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Universal framework for temperature dependence prediction of the negative bias temperature instability based on microscope pictures

Japanese Journal of Applied Physics, 2016-04, Vol.55 (4), p.44201, Article 044201

2016

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A universal approach for signal dependent circuit reliability simulation

2017 IEEE 12th International Conference on ASIC (ASICON), 2017, p.476-479

2017

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ON-state critical gate overdrive voltage for fluorine-implanted enhancement-mode AlGaN/GaN high electron mobility transistors

Journal of applied physics, 2011-12, Vol.110 (11), p.114514-114514-7

2011

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Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET

Solid-state electronics, 2010-08, Vol.54 (8), p.806-808

2010

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Zero-Mask Contact Fuse for One-Time-Programmable Memory in Standard CMOS Processes

IEEE electron device letters, 2011-07, Vol.32 (7), p.955-957

2011

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Circuit-aging modeling based on dynamic MOSFET degradation and its verification

2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2017, p.97-100

2017

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The Adaptiveness of Emotion Regulation Variability and Interoceptive Attention in Daily Life

Psychosomatic medicine, 2024-09, Vol.86 (7), p.640-647

2024

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The implementation of a least square support vector regression model utilizing meta-heuristic algorithms for predicting undrained shear strength

Multiscale and Multidisciplinary Modeling, Experiments and Design, 2024-07, Vol.7 (3), p.1843-1856

2024

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Correction to: The implementation of a least square support vector regression model utilizing meta-heuristic algorithms for predicting undrained shear strength

Multiscale and Multidisciplinary Modeling, Experiments and Design, 2024-07, Vol.7 (3), p.3083-3083

2024

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Investigation of nitrogen enhanced NBTI effect using the universal prediction model

2015 IEEE International Reliability Physics Symposium, 2015, p.XT.5.1-XT.5.4

2015

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A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection

Microelectronics and reliability, 2011-02, Vol.51 (2), p.337-341

2011

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Incremental 3-D Global Routing Considering Cell Movement and Complex Routing Constraints

IEEE transactions on computer-aided design of integrated circuits and systems, 2023-06, Vol.42 (6), p.2016-2029

2023

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Reciprocal effects between negative affect and emotion regulation in daily life

Behaviour research and therapy, 2024-05, Vol.176, p.104518, Article 104518

2024

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Modeling of NBTI Stress Induced Hole-Trapping and Interface-State-Generation Mechanisms under a Wide Range of Bias Conditions

IEICE transactions on electronics, 2013, Vol.E96.C (10), p.1339-1347

2013

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Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device

Microelectronics and reliability, 2010-08, Vol.50 (8), p.1077-1080

2010

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Unified Reaction--Diffusion Model for Accurate Prediction of Negative Bias Temperature Instability Effect

Japanese Journal of Applied Physics, 2012-02, Vol.51 (2), p.02BC07-02BC07-5

2012

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Comparison and improvement of two core compact models for double-gate MOSFETs

Solid-state electronics, 2010-11, Vol.54 (11), p.1444-1446

2010

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A Dynamic Time Evolution Method for Concurrent Device-Circuit Aging Simulations

IEEE transactions on electron devices, 2019-01, Vol.66 (1), p.184-190

2019

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Diode parameter extraction by a linear cofactor difference operation method

Journal of semiconductors, 2010-11, Vol.31 (11), p.43-46

2010

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Compact Negative Bias Temperature Instability Model for Silicon Nanowire MOSFET (SNWT) and Application in Circuit Performance Simulation

Journal of computational and theoretical nanoscience, 2010-01, Vol.7 (1), p.107-114

2010

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Late Breaking Results: Incremental 3D Global Routing Considering Cell Movement

2021 58th ACM/IEEE Design Automation Conference (DAC), 2021, p.1366-1367

2021

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CongestNN: An Bi-Directional Congestion Prediction Framework for Large-Scale Heterogeneous FPGAs

2021 IEEE 14th International Conference on ASIC (ASICON), 2021, p.1-4

2021

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A Charge-Based Model for Long-Channel Cylindrical Surrounding-Gate MOSFETs From Intrinsic Channel to Heavily Doped Body

Predictive Value of Machine Learning for Recurrence of Atrial Fibrillation after Catheter Ablation: A Systematic Review and Meta-Analysis

Effects of labeling on wildlife conservation education

Universal framework for temperature dependence prediction of the negative bias temperature instability based on microscope pictures

A universal approach for signal dependent circuit reliability simulation

ON-state critical gate overdrive voltage for fluorine-implanted enhancement-mode AlGaN/GaN high electron mobility transistors

Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET

Zero-Mask Contact Fuse for One-Time-Programmable Memory in Standard CMOS Processes

Circuit-aging modeling based on dynamic MOSFET degradation and its verification

The Adaptiveness of Emotion Regulation Variability and Interoceptive Attention in Daily Life

The implementation of a least square support vector regression model utilizing meta-heuristic algorithms for predicting undrained shear strength

Correction to: The implementation of a least square support vector regression model utilizing meta-heuristic algorithms for predicting undrained shear strength

Investigation of nitrogen enhanced NBTI effect using the universal prediction model

A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection

Incremental 3-D Global Routing Considering Cell Movement and Complex Routing Constraints

Reciprocal effects between negative affect and emotion regulation in daily life

Modeling of NBTI Stress Induced Hole-Trapping and Interface-State-Generation Mechanisms under a Wide Range of Bias Conditions

Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device

Unified Reaction--Diffusion Model for Accurate Prediction of Negative Bias Temperature Instability Effect

Comparison and improvement of two core compact models for double-gate MOSFETs

A Dynamic Time Evolution Method for Concurrent Device-Circuit Aging Simulations

Diode parameter extraction by a linear cofactor difference operation method

Compact Negative Bias Temperature Instability Model for Silicon Nanowire MOSFET (SNWT) and Application in Circuit Performance Simulation

Late Breaking Results: Incremental 3D Global Routing Considering Cell Movement

CongestNN: An Bi-Directional Congestion Prediction Framework for Large-Scale Heterogeneous FPGAs

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