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Ultra-Narrow-Band Filter Based on High Q Factor in Metallic Nanoslit Arrays

Sensors (Basel, Switzerland), 2020-09, Vol.20 (18), p.5205

2020

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A Novel Arc Fault Detector for Early Detection of Electrical Fires

Sensors (Basel, Switzerland), 2016-04, Vol.16 (4), p.500-500

2016

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Parameter selection algorithm of DBSCAN based on K-means two classification algorithm

Journal of engineering (Stevenage, England), 2019-12, Vol.2019 (23), p.8676-8679

2019

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Design of data collection box based on NRF24L01

MATEC Web of Conferences, 2018-01, Vol.173, p.1006

2018

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A Measurement of Non-Coaxial RF Devices with Improved TRL Calibration Algorithm

MATEC Web of Conferences, 2018-01, Vol.173, p.1005

2018

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Series Arc Fault Detection Algorithm Based on Autoregressive Bispectrum Analysis

Algorithms, 2015-12, Vol.8 (4), p.929-950

2015

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A Multi-exposure Image Fusion Method with Detail Preservation

MATEC Web of Conferences, 2018-01, Vol.173, p.3009

2018

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Classification of wafer map defect based on ResNeSt

Journal of physics. Conference series, 2024-04, Vol.2741 (1), p.12019

2024

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Wafer map failure pattern recognition based on deep convolutional neural network

Expert systems with applications, 2022-12, Vol.209, p.118254, Article 118254

2022

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Mixed-type wafer defect detection based on multi-branch feature enhanced residual module

Expert systems with applications, 2024-05, Vol.242, p.122795, Article 122795

2024

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Electronic and Optical Properties of Al, Eu Single-Doped and Al-Eu Co-Doped ZnO

JOM (1989), 2021, Vol.73 (1), p.373-379

2021

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Detection method of Golden Chip-Free Hardware Trojan based on the combination of ResNeXt structure and attention mechanism

Computers & security, 2023-11, Vol.134, p.103428, Article 103428

2023

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Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi Path DCNN

IEEE transactions on semiconductor manufacturing, 2024-06, p.1-1

2024

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Wafer map defect pattern detection method based on improved attention mechanism

Expert systems with applications, 2023-11, Vol.230, p.120544, Article 120544

2023

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Wafer map defect recognition based on multi-scale feature fusion and attention spatial pyramid pooling

Journal of intelligent manufacturing, 2023-11

2023

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AI classification of wafer map defect patterns by using dual-channel convolutional neural network

Engineering failure analysis, 2021-12, Vol.130, p.105756, Article 105756

2021

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Research on the Drag Polishing of Irregular Seals Based on the Self-Developed Sol-Gel Ball Tools

Journal of materials engineering and performance, 2023-05, Vol.32 (9), p.4229-4236

2023

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High Resolution and Stability Self-Reference Plasmonic Sensor With Metallic Grating on Multilayered Dielectric Cavity Substrate

IEEE sensors journal, 2022-10, Vol.22 (20), p.19301-19307

2022

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IEEE_Xplore

Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field

Journal of electronic testing, 2023-12, Vol.39 (5-6), p.621-629

2023

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Topology Modeling for Reconfigurable Scan Networks in IEEE 1687 Networks

Journal of physics. Conference series, 2022-05, Vol.2221 (1), p.12055

2022

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A self-adaptive DBSCAN-based method for wafer bin map defect pattern classification

Microelectronics and reliability, 2021-08, Vol.123, p.114183, Article 114183

2021

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Research on coupling property of side-coupled asymmetric square-ring resonator in a plasmonic waveguide

Journal of physics. Conference series, 2020-08, Vol.1592 (1), p.12026

2020

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Study on the surface quality of marble tiles polished with Sol-Gel derived pads

Journal of sol-gel science and technology, 2019-09, Vol.91 (3), p.485-495

2019

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Optical Properties of Periodic Metallic Slits with Asymmetric Binary Grooves

Plasmonics (Norwell, Mass.), 2019-12, Vol.14 (6), p.1467-1471

2019

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Optical Transmission in Arrayed Asymmetric Multilayered Ultra-Thin Metal Stripes

Plasmonics (Norwell, Mass.), 2018-12, Vol.13 (6), p.1941-1946

2018

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Ultra-Narrow-Band Filter Based on High Q Factor in Metallic Nanoslit Arrays

A Novel Arc Fault Detector for Early Detection of Electrical Fires

Parameter selection algorithm of DBSCAN based on K-means two classification algorithm

Design of data collection box based on NRF24L01

A Measurement of Non-Coaxial RF Devices with Improved TRL Calibration Algorithm

Series Arc Fault Detection Algorithm Based on Autoregressive Bispectrum Analysis

A Multi-exposure Image Fusion Method with Detail Preservation

Classification of wafer map defect based on ResNeSt

Wafer map failure pattern recognition based on deep convolutional neural network

Mixed-type wafer defect detection based on multi-branch feature enhanced residual module

Electronic and Optical Properties of Al, Eu Single-Doped and Al-Eu Co-Doped ZnO

Detection method of Golden Chip-Free Hardware Trojan based on the combination of ResNeXt structure and attention mechanism

Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi Path DCNN

Wafer map defect pattern detection method based on improved attention mechanism

Wafer map defect recognition based on multi-scale feature fusion and attention spatial pyramid pooling

AI classification of wafer map defect patterns by using dual-channel convolutional neural network

Research on the Drag Polishing of Irregular Seals Based on the Self-Developed Sol-Gel Ball Tools

High Resolution and Stability Self-Reference Plasmonic Sensor With Metallic Grating on Multilayered Dielectric Cavity Substrate

Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field

Topology Modeling for Reconfigurable Scan Networks in IEEE 1687 Networks

A self-adaptive DBSCAN-based method for wafer bin map defect pattern classification

Research on coupling property of side-coupled asymmetric square-ring resonator in a plasmonic waveguide

Study on the surface quality of marble tiles polished with Sol-Gel derived pads

Optical Properties of Periodic Metallic Slits with Asymmetric Binary Grooves

Optical Transmission in Arrayed Asymmetric Multilayered Ultra-Thin Metal Stripes

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