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Lipase-catalyzed synthesis of butyl propionate in solvent-free system: Optimization by response surface methodology

Journal of the Taiwan Institute of Chemical Engineers, 2014-09, Vol.45 (5), p.2233-2237

2014

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Using High-Speed ADC in Frequency Offset and Phase Noise Measurement

2006 IEEE International Frequency Control Symposium and Exposition, 2006, p.255-259

2006

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ADEV Calculated from Phase Noise Measurements and Its Possible Errors Due to FFT Sampling

2006 IEEE International Frequency Control Symposium and Exposition, 2006, p.587-590

2006

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Wire-arc spray directed energy deposition: Correlation of chamber kits refurbishing and particle defects reduction in Ta/TaN thin-film physical deposition processes

Journal of materials research and technology, 2024-05, Vol.30, p.2754-2767

2024

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A multi-step deposited AlN films in a DC pulsed sputtering and film characteristics classification with principal component analysis of OES data

International journal of advanced manufacturing technology, 2023-07, Vol.127 (5-6), p.2955-2967

2023

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Visible Photoluminescence of Ultrathin ZnO Nanowire at Room Temperature

Crystal growth & design, 2006-08, Vol.6 (8), p.1951-1955

2006

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A New and Simple Means for Self-Assembled Nanostructure: Facilitated by Buffer Layer

The journal of physical chemistry. B, 2004-12, Vol.108 (49), p.18799-18803

2004

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Minimizing residual stress of aluminum nitride (AlN) thin films using multi-step deposition of DC pulsed sputtering

2022 China Semiconductor Technology International Conference (CSTIC), 2022, p.1-4

2022

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Lipase-catalyzed synthesis of butyl propionate in solvent-free system: Optimization by response surface methodology

Using High-Speed ADC in Frequency Offset and Phase Noise Measurement

ADEV Calculated from Phase Noise Measurements and Its Possible Errors Due to FFT Sampling

Wire-arc spray directed energy deposition: Correlation of chamber kits refurbishing and particle defects reduction in Ta/TaN thin-film physical deposition processes

A multi-step deposited AlN films in a DC pulsed sputtering and film characteristics classification with principal component analysis of OES data

Visible Photoluminescence of Ultrathin ZnO Nanowire at Room Temperature

A New and Simple Means for Self-Assembled Nanostructure: Facilitated by Buffer Layer

Minimizing residual stress of aluminum nitride (AlN) thin films using multi-step deposition of DC pulsed sputtering

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