UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Raised Source/Drain (RSD) and Vertical Lightly Doped Drain (LDD) Poly-Si Thin-Film Transistor

Membranes (Basel), 2021-02, Vol.11 (2), p.103

2021

Volltextzugriff (PDF)

A High-Current Kink Effect Free Z-Gate Poly-Si Thin-Film Transistor

IEEE electron device letters, 2016-07, Vol.37 (7), p.886-889

2016

Volltextzugriff (PDF)

150-200 V Split-Gate Trench Power MOSFETs with Multiple Epitaxial Layers

Micromachines (Basel), 2020-05, Vol.11 (5), p.504

2020

Volltextzugriff (PDF)

A Novel Self-Aligned Double-Channel Polysilicon Thin-Film Transistor

IEEE transactions on electron devices, 2013-02, Vol.60 (2), p.799-804

2013

Volltextzugriff (PDF)

Dependence of Device Performances on Fin Ratios of AlGaN/GaN Nanoscale Fin-HEMTs

ECS journal of solid state science and technology, 2023-09, Vol.12 (9), p.95001

2023

Volltextzugriff (PDF)

Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure

IEEE transactions on electron devices, 2010-06, Vol.57 (6), p.1355-1361

2010

Volltextzugriff (PDF)

A Novel Self-Aligned Raised Source/Drain Polysilicon Thin-Film Transistor With a High-Current Structure

IEEE electron device letters, 2011-08, Vol.32 (8), p.1080-1082

2011

Volltextzugriff (PDF)

Q-Factor Performance of 28 nm-Node High-K Gate Dielectric under DPN Treatment at Different Annealing Temperatures

Electronics (Basel), 2020-12, Vol.9 (12), p.2086

2020

Volltextzugriff (PDF)

GaN on Silicon Substrate With Various SiC Buffer Layer for UV Detecting Applications

IEEE sensors journal, 2010-08, Vol.10 (8), p.1291-1296

2010

Volltextzugriff (PDF)

Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs

Electronics (Basel), 2020-12, Vol.9 (12), p.2095

2020

Volltextzugriff (PDF)

A novel thin-film transistor with step gate-overlapped lightly doped drain and raised source/drain design

Solid-state electronics, 2017-11, Vol.137, p.10-15

2017

Volltextzugriff (PDF)

Thermal stress probing the channel-length modulation effect of nano n-type FinFETs

Microelectronics and reliability, 2018-04, Vol.83, p.260-270

2018

Volltextzugriff (PDF)

Resistance of Outmost Shell- and Embedded-End Contacts of Single- and Multi-Bridged Carbon Nanotubes

Journal of nanoscience and nanotechnology, 2014-03, Vol.14 (3), p.2663-2666

2014

Volltextzugriff (PDF)

A Novel High-Performance Poly-Silicon Thin-Film Transistor With a Double-Channel Structure

IEEE electron device letters, 2008-11, Vol.29 (11), p.1229-1231

2008

Volltextzugriff (PDF)

Effects of ultra-thin Si-fin body widths upon SOI PMOS FinFETs

Modern physics letters. B, Condensed matter physics, statistical physics, applied physics, 2018-05, Vol.32 (15), p.1850157

2018

Volltextzugriff (PDF)

Performance characteristics of p-channel FinFETs with varied Si-fin extension lengths for source and drain contacts

Semiconductors (Woodbury, N.Y.), 2017-12, Vol.51 (12), p.1650-1655

2017

Volltextzugriff (PDF)

A novel InGaAs photodiode fabrication and its application

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.495-497

2013

Volltextzugriff (PDF)

Study of Drain Alloy for Antimony Substrate Vertical High Voltage Power Metal Oxide Semiconductor Field Effect Transistors

Japanese Journal of Applied Physics, 2008-04, Vol.47 (4R), p.2122

2008

Volltextzugriff (PDF)

The effect of post-hydrogen annealing and multilayer channel structure on nano-crystalline silicon thin film transistor performance

Journal of physics. D, Applied physics, 2010-05, Vol.43 (19), p.195102-195102

2010

Volltextzugriff (PDF)

The impacts of control gate voltage on the cycling endurance of split gate flash memory

IEEE electron device letters, 2000-07, Vol.21 (7), p.359-361

2000

Volltextzugriff (PDF)

High performance power VDMOSFETs with a split-gate floating np-well design

Semiconductor science and technology, 2008-12, Vol.23 (12), p.122001

2008

Volltextzugriff (PDF)

Effect of Ge Composition on Infrared Detecting Performance of Strain Si/ -} Heterojunction on Preferentially Etched Silicon Substrate

IEEE sensors journal, 2010-08, Vol.10 (8), p.1337-1341

2010

Volltextzugriff (PDF)

CIP metrology improving the bump yield in photo-lithography process

2015 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015, p.386-389

2015

Volltextzugriff (PDF)

Reducing the rework in the photo-lithography process of wafer-bump assembly with quality management

2015 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015, p.351-354

2015

Volltextzugriff (PDF)

Effect of substrate bias on the performance and reliability of the split-gate source-side injected flash memory

IEEE electron device letters, 1999-08, Vol.20 (8), p.412-414

1999

Volltextzugriff (PDF)

1 – 25 von 337

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(294)
Mit Volltextzugriff
(283)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(248)
Life Sciences & Biomedicine
(141)
Humans
(116)
Female
(94)
Physical Sciences
(76)
Technology
(72)
Male
(67)
Adult
(57)
Middle Aged
(56)
Physics
(46)
Biological And Medical Sciences
(42)
Aged
(40)
Physics, Applied
(40)
Engineering
(33)
Medical Sciences
(33)
Science & Technology - Other Topics
(33)
Obstetrics & Gynecology
(31)
Materials Science
(30)
Chemistry
(27)
Materials Science, Multidisciplinary
(27)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(1)
... seit 90 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Raised Source/Drain (RSD) and Vertical Lightly Doped Drain (LDD) Poly-Si Thin-Film Transistor

A High-Current Kink Effect Free Z-Gate Poly-Si Thin-Film Transistor

150-200 V Split-Gate Trench Power MOSFETs with Multiple Epitaxial Layers

A Novel Self-Aligned Double-Channel Polysilicon Thin-Film Transistor

Dependence of Device Performances on Fin Ratios of AlGaN/GaN Nanoscale Fin-HEMTs

Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure

A Novel Self-Aligned Raised Source/Drain Polysilicon Thin-Film Transistor With a High-Current Structure

Q-Factor Performance of 28 nm-Node High-K Gate Dielectric under DPN Treatment at Different Annealing Temperatures

GaN on Silicon Substrate With Various SiC Buffer Layer for UV Detecting Applications

Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs

A novel thin-film transistor with step gate-overlapped lightly doped drain and raised source/drain design

Thermal stress probing the channel-length modulation effect of nano n-type FinFETs

Resistance of Outmost Shell- and Embedded-End Contacts of Single- and Multi-Bridged Carbon Nanotubes

A Novel High-Performance Poly-Silicon Thin-Film Transistor With a Double-Channel Structure

Effects of ultra-thin Si-fin body widths upon SOI PMOS FinFETs

Performance characteristics of p-channel FinFETs with varied Si-fin extension lengths for source and drain contacts

A novel InGaAs photodiode fabrication and its application

Study of Drain Alloy for Antimony Substrate Vertical High Voltage Power Metal Oxide Semiconductor Field Effect Transistors

The effect of post-hydrogen annealing and multilayer channel structure on nano-crystalline silicon thin film transistor performance

The impacts of control gate voltage on the cycling endurance of split gate flash memory

High performance power VDMOSFETs with a split-gate floating np-well design

Effect of Ge Composition on Infrared Detecting Performance of Strain Si/ -} Heterojunction on Preferentially Etched Silicon Substrate

CIP metrology improving the bump yield in photo-lithography process

Reducing the rework in the photo-lithography process of wafer-bump assembly with quality management

Effect of substrate bias on the performance and reliability of the split-gate source-side injected flash memory

Suchergebnisse filtern