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PIX: An Instrument to Measure Atmospheric Ionizing Particles Based on a Single MiniPIX Sensor

IEEE transactions on nuclear science, 2024-08, Vol.71 (8), p.1527-1534

2024

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Physical Mechanisms Inducing Electron Single-Event Upset

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1759-1767

2018

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Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3055-3060

2014

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Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1516-1522

2019

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Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1768-1775

2018

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Dose Rate Switching Technique on ELDRS-Free Bipolar Devices

IEEE transactions on nuclear science, 2016-08, Vol.63 (4), p.2065-2071

2016

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The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3347-3353

2009

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EP-1139: Evaluation of Dosi-Secure® dosimeter for in vivo dosimetry in external radiotherapy

Radiotherapy and oncology, 2013-03, Vol.106, p.S429-S430

2013

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On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.2930-2935

2014

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Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4166-4174

2013

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Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1856-1864

2014

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Dosi-MeV® dosimeter used for in vivo dosimetry of electron beams in external radiotherapy

Physica medica, 2014-12, Vol.30, p.e143-e144

2014

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Analysis of single-event transients in analog circuits

IEEE transactions on nuclear science, 2000-12, Vol.47 (6), p.2616-2623

2000

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Evaluation of ELDRS Mechanisms Using Dose Rate Switching Experiments on Gated Lateral PNP Transistors

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2953-2960

2011

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Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2616-2621

2005

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Review of Deposited Dose Calculation Methods Using Ray Tracing Approximations

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3106-3113

2008

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Real-Time Fibered Optically Stimulated Luminescence Dosimeter Based on SrS:Ce,Sm Phosphor

IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.2154-2160

2008

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Contribution of the Proton Direct Ionization to the SEU rate for low-scale devices

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2020, p.1-8

2020

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Proton damage effects on GaAs/GaAlAs vertical cavity surface emitting lasers

Journal of applied physics, 2003-12, Vol.94 (12), p.7757-7763

2003

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Single event transient propagation through digital optocouplers

IEEE transactions on nuclear science, 2005-08, Vol.52 (4), p.1136-1139

2005

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High Current Event and Single Event Functional Interrupt in Non-Volatile Memories

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2018, p.1-8

2018

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Single Event Effect prediction early in the design phase and latchup case study on ASIC

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2018, p.1-8

2018

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Risk Assessment of Electron Induced SEE during the JUICE Mission

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2018, p.1-7

2018

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Proton-Induced SDRAM Cell Degradation

2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2015, p.1-4

2015

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CARMEN1 and CARMEN2 Experiment: Comparison between In-Flight Measured SEE Rates and Predictions

2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2015, p.1-6

2015

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PIX: An Instrument to Measure Atmospheric Ionizing Particles Based on a Single MiniPIX Sensor

Physical Mechanisms Inducing Electron Single-Event Upset

Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology

Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation

Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes

Dose Rate Switching Technique on ELDRS-Free Bipolar Devices

The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices

EP-1139: Evaluation of Dosi-Secure® dosimeter for in vivo dosimetry in external radiotherapy

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Dosi-MeV® dosimeter used for in vivo dosimetry of electron beams in external radiotherapy

Analysis of single-event transients in analog circuits

Evaluation of ELDRS Mechanisms Using Dose Rate Switching Experiments on Gated Lateral PNP Transistors

Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments

Review of Deposited Dose Calculation Methods Using Ray Tracing Approximations

Real-Time Fibered Optically Stimulated Luminescence Dosimeter Based on SrS:Ce,Sm Phosphor

Contribution of the Proton Direct Ionization to the SEU rate for low-scale devices

Proton damage effects on GaAs/GaAlAs vertical cavity surface emitting lasers

Single event transient propagation through digital optocouplers

High Current Event and Single Event Functional Interrupt in Non-Volatile Memories

Single Event Effect prediction early in the design phase and latchup case study on ASIC

Risk Assessment of Electron Induced SEE during the JUICE Mission

Proton-Induced SDRAM Cell Degradation

CARMEN1 and CARMEN2 Experiment: Comparison between In-Flight Measured SEE Rates and Predictions

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