UB Paderborn / Katalog / Suche / in CDI

An Optical Imaging Technique Using Deep Illumination in the Angular Domain

IEEE journal of selected topics in quantum electronics, 2007-11, Vol.13 (6), p.1610-1620

2007

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IEEE_Xplore

Angular domain imaging of objects within highly scattering media using silicon micromachined collimating arrays

IEEE journal of selected topics in quantum electronics, 2003-03, Vol.9 (2), p.257-266

2003

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IEEE_Xplore

Temporary extrusion failures in accelerated lifetime tests of copper interconnects

IEEE electron device letters, 2005-09, Vol.26 (9), p.622-624

2005

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IEEE_Xplore

Automatic Detection of In-field Defect Growth in Image Sensors

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008, p.305-313

2008

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IEEE_Xplore

Quantitative analysis of in-field defects in image sensor arrays

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007, p.526-534

2007

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IEEE_Xplore

Transparent conducting indium bismuth oxide

Thin solid films, 2007-02, Vol.515 (7), p.3760-3765

2007

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Defect Tolerance for a Capacitance Based Nanoscale Biosensor

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008, p.220-228

2008

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IEEE_Xplore

Characterization of Gain Enhanced In-Field Defects in Digital Imagers

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009, p.155-163

2009

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IEEE_Xplore

Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006, p.157-165

2006

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IEEE_Xplore

Guest Editorial Foreword to the Special Section on WSI'95

IEEE transactions on very large scale integration (VLSI) systems, 1997-03, Vol.5 (1), p.1-2

1997

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IEEE_Xplore

A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor

Proceedings. (ICASSP '05). IEEE International Conference on Acoustics, Speech, and Signal Processing, 2005, 2005, Vol.5, p.v/77-v/80 Vol. 5

2005

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IEEE_Xplore

Inter-plane via defect detection using the sensor plane in 3D heterogeneous sensor systems

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005, p.158-166

2005

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IEEE_Xplore

A self-correcting active pixel sensor using hardware and software correction

IEEE design & test of computers, 2004-11, Vol.21 (6), p.544-551

2004

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IEEE_Xplore

A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot-Pixel Defects

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007, p.517-525

2007

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IEEE_Xplore

On-Line Mapping of In-Field Defects in Image Sensor Arrays

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006, p.439-447

2006

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IEEE_Xplore

Laser processes for defect correction in large area VLSI systems

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1994, p.106-114

Chapman, G.H.

1994

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IEEE_Xplore

Defect avoidance in a 3-D heterogeneous sensor [acoustic/seismic/active pixel/IR imaging sensor array]

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.67-75

2004

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IEEE_Xplore

Design of a self-correcting active pixel sensor

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2001, p.18-26

2001

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IEEE_Xplore

On-line identification of faults in fault-tolerant imagers

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005, p.149-157

2005

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IEEE_Xplore

Noise analysis of fault tolerant active pixel sensors

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005, p.140-148

2005

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IEEE_Xplore

Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS)

Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, 2003, p.53-60

2003

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IEEE_Xplore

Yield improvement of a large area magnetic field sensor array using redundancy schemes

IEEE transactions on very large scale integration (VLSI) systems, 1997-03, Vol.5 (1), p.28-33

1997

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IEEE_Xplore

FPGA design for decimeter scale integration (DMSI)

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223), 1998, p.64-72

Chapman, G.H.

1998

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IEEE_Xplore

Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.58-66

2004

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IEEE_Xplore

Macroscopic fluorescent lifetime imaging in turbid media using angular filter arrays

2009 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2009-01, Vol.2009, p.5364-5368

2009

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An Optical Imaging Technique Using Deep Illumination in the Angular Domain

Angular domain imaging of objects within highly scattering media using silicon micromachined collimating arrays

Temporary extrusion failures in accelerated lifetime tests of copper interconnects

Automatic Detection of In-field Defect Growth in Image Sensors

Quantitative analysis of in-field defects in image sensor arrays

Transparent conducting indium bismuth oxide

Defect Tolerance for a Capacitance Based Nanoscale Biosensor

Characterization of Gain Enhanced In-Field Defects in Digital Imagers

Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC

Guest Editorial Foreword to the Special Section on WSI'95

A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor

Inter-plane via defect detection using the sensor plane in 3D heterogeneous sensor systems

A self-correcting active pixel sensor using hardware and software correction

A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot-Pixel Defects

On-Line Mapping of In-Field Defects in Image Sensor Arrays

Laser processes for defect correction in large area VLSI systems

Defect avoidance in a 3-D heterogeneous sensor [acoustic/seismic/active pixel/IR imaging sensor array]

Design of a self-correcting active pixel sensor

On-line identification of faults in fault-tolerant imagers

Noise analysis of fault tolerant active pixel sensors

Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS)

Yield improvement of a large area magnetic field sensor array using redundancy schemes

FPGA design for decimeter scale integration (DMSI)

Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

Macroscopic fluorescent lifetime imaging in turbid media using angular filter arrays

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