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Volume polarization holographic recording in thick phenanthrenequinone-doped poly(methyl methacrylate) photopolymer

Optics letters, 2011-08, Vol.36 (16), p.3039

2011

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Photoelastic modulated imaging ellipsometry by stroboscopic illumination technique

Review of scientific instruments, 2006-02, Vol.77 (2)

2006

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Real-time measurement of photo-induced effects in 9,10-phenanthrenequinone-doped poly(methyl methacrylate) photopolymer by phase-modulated ellipsometry

Optics communications, 2010-09, Vol.283 (17), p.3279-3283

2010

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Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry

Applied Optics, 2005-12, Vol.44 (35), p.7509

2005

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Determining thickness of films on a curved substrate by use of ellipsometric measurements

Applied Optics, 2009-06, Vol.48 (17), p.3139

2009

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Index Profile of Radial Gradient Index Lens Measured by Imaging Ellipsometric Technique

Japanese Journal of Applied Physics, 2005-02, Vol.44 (2R), p.1111

2005

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Rapid and accurate extraction of optical parameters for uniaxial bulk media by phase modulated ellipsometry

Optics and lasers in engineering, 2013-07, Vol.51 (7), p.861-866

2013

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Optimization of a four-temporal phase lock for photoelastic-modulated polarimetry

Optics letters, 2009-08, Vol.34 (15), p.2279

2009

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Dynamic characterization of photo-alignment of azo-dye-doped polymer using phase modulated polarimetry

Optical materials, 2013-01, Vol.35 (3), p.366-371

2013

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Calibrations of Phase Modulation Amplitude of Photoelastic Modulator

Japanese Journal of Applied Physics, 2004-02, Vol.43 (2), p.827-832

2004

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The Ellipsometric Measurements of a Curved Surface

Japanese Journal of Applied Physics, 2005-01, Vol.44 (7L), p.L1015

2005

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Ultra fast self-corrected polarization modulated ellipsometer

Thin solid films, 2011-02, Vol.519 (9), p.2746-2749

2011

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Deassociate the initial temporal phase deviation provided by photoelastic modulator for stroboscopic illumination polarization modulated ellipsometry

Review of scientific instruments, 2011-03, Vol.82 (3), p.035117-035117-5

2011

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Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate–lead titanate single crystal

Thin solid films, 2011-02, Vol.519 (9), p.2867-2869

2011

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Assessment of interface roughness during plasma etching through the use of real-time ellipsometry

Applied surface science, 2011-01, Vol.257 (7), p.2536-2539

2011

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A Direct Determination Technique for Azimuth Alignment in Photoelastic Modulation Ellipsometry

Japanese Journal of Applied Physics, 1999-12, Vol.38 (12R), p.6919

1999

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Azimuth Alignment in Photoelastic Modulation Ellipsometry at a Fixed Incident Angle

Japanese Journal of Applied Physics, 2002, Vol.41 (Part 1, No. 6A), p.3981-3986

2002

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Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry

Sensors and actuators. B, Chemical, 2007-02, Vol.121 (2), p.490-495

2007

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Measurement of Optical Activity using a Photoelastic Modulator System

Japanese Journal of Applied Physics, 1999-02, Vol.38 (2R), p.941

1999

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Direct Determination of Azimuth Angles in Photoelastic Modulator System

Japanese Journal of Applied Physics, 1998-06, Vol.37 (6R), p.3558

1998

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Ellipsometric measurements and its alignment : using the intensity ratio technique

Japanese Journal of Applied Physics, 1995-09, Vol.34 (9A), p.5016-5019

1995

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Photoelastic modulated imaging ellipsometry by stroboscopicillumination technique

Review of scientific instruments, 2006-02, Vol.77 (2), p.023107-023107-5

2006

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Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry

Applied Optics, 2006-06, Vol.45 (17), p.3935

2006

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The Development of Three-Intensity Measurement in PSA Ellipsometry and Photoelastic Modulation Ellipsometry

Chao, Yu-Faye

2017

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Determining thickness of films on a curved substrate by use of ellipsometric measurements

Applied Optics, 2009-06, Vol.48 (17), p.3140

2009

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Volume polarization holographic recording in thick phenanthrenequinone-doped poly(methyl methacrylate) photopolymer

Photoelastic modulated imaging ellipsometry by stroboscopic illumination technique

Real-time measurement of photo-induced effects in 9,10-phenanthrenequinone-doped poly(methyl methacrylate) photopolymer by phase-modulated ellipsometry

Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry

Determining thickness of films on a curved substrate by use of ellipsometric measurements

Index Profile of Radial Gradient Index Lens Measured by Imaging Ellipsometric Technique

Rapid and accurate extraction of optical parameters for uniaxial bulk media by phase modulated ellipsometry

Optimization of a four-temporal phase lock for photoelastic-modulated polarimetry

Dynamic characterization of photo-alignment of azo-dye-doped polymer using phase modulated polarimetry

Calibrations of Phase Modulation Amplitude of Photoelastic Modulator

The Ellipsometric Measurements of a Curved Surface

Ultra fast self-corrected polarization modulated ellipsometer

Deassociate the initial temporal phase deviation provided by photoelastic modulator for stroboscopic illumination polarization modulated ellipsometry

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate–lead titanate single crystal

Assessment of interface roughness during plasma etching through the use of real-time ellipsometry

A Direct Determination Technique for Azimuth Alignment in Photoelastic Modulation Ellipsometry

Azimuth Alignment in Photoelastic Modulation Ellipsometry at a Fixed Incident Angle

Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry

Measurement of Optical Activity using a Photoelastic Modulator System

Direct Determination of Azimuth Angles in Photoelastic Modulator System

Ellipsometric measurements and its alignment : using the intensity ratio technique

Photoelastic modulated imaging ellipsometry by stroboscopicillumination technique

Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry

The Development of Three-Intensity Measurement in PSA Ellipsometry and Photoelastic Modulation Ellipsometry

Determining thickness of films on a curved substrate by use of ellipsometric measurements

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