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IEEE journal of solid-state circuits, 2010-04, Vol.45 (4), p.731-740
2010

IEEE transactions on microwave theory and techniques, 2017-07, Vol.65 (7), p.2496-2507
2017

IEEE transactions on very large scale integration (VLSI) systems, 2013-03, Vol.21 (3), p.584-588
2013

IEEE transactions on circuits and systems. I, Regular papers, 2013-03, Vol.60 (3), p.570-581
2013

IEEE transactions on instrumentation and measurement, 2016-08, Vol.65 (8), p.1804-1817
2016


IEEE transactions on very large scale integration (VLSI) systems, 2013-04, Vol.21 (4), p.624-635
2013

IEEE transactions on very large scale integration (VLSI) systems, 2016-05, Vol.24 (5), p.1835-1848
2016

IEEE transactions on instrumentation and measurement, 2008-02, Vol.57 (2), p.420-427
2008

IEEE transactions on circuits and systems. II, Express briefs, 2012-11, Vol.59 (11), p.746-750
2012

IEEE transactions on computer-aided design of integrated circuits and systems, 2016-10, Vol.35 (10), p.1730-1743
2016

IEEE transactions on circuits and systems. I, Regular papers, 2010-08, Vol.57 (8), p.1829-1837
2010

IEEE transactions on computer-aided design of integrated circuits and systems, 2012-12, Vol.31 (12), p.1789-1802
2012

IEEE transactions on very large scale integration (VLSI) systems, 2010-03, Vol.18 (3), p.509-513
2010

IEEE transactions on very large scale integration (VLSI) systems, 2017-02, Vol.25 (2), p.621-634
2017

IEEE journal of solid-state circuits, 2012-11, Vol.47 (11), p.2783-2795
2012
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2017 International Test Conference in Asia (ITC-Asia), 2017, p.8-13
2017

IEEE transactions on very large scale integration (VLSI) systems, 2011-12, Vol.19 (12), p.2158-2169
2011

International journal of circuit theory and applications, 2015-10, Vol.43 (10), p.1333-1350
2015
Link zum Volltext

2023 IEEE International Solid- State Circuits Conference (ISSCC), 2023, p.16-18
2023

IEEE transactions on circuits and systems. II, Express briefs, 2010-03, Vol.57 (3), p.163-167
2010

2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), 2017, p.1-6
2017
Link zum Volltext

IEEE sensors journal, 2020-10, Vol.20 (19), p.11138-11155
2020

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