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Effects of Post-Deposition Thermal Annealing Temperature on Electrical Properties of ZnON Thin-Film Transistors

IEEE electron device letters, 2016-06, Vol.37 (6), p.747-750

2016

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Water-Mediated Photochemical Treatments for Low-Temperature Passivation of Metal-Oxide Thin-Film Transistors

ACS applied materials & interfaces, 2016-04, Vol.8 (16), p.10403-10412

2016

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Enhancing Thermal Oxidation Stability of Silver Nanowire Transparent Electrodes by Using a Cesium Carbonate-Incorporated Overcoating Layer

Materials, 2019-04, Vol.12 (7), p.1140

2019

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Electrical Instability of p-Channel SnO Thin-Film Transistors Under Light Illumination

IEEE electron device letters, 2016-03, Vol.37 (3), p.295-298

2016

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Investigation of Carrier Transport Mechanism in High Mobility ZnON Thin-Film Transistors

IEEE electron device letters, 2016-12, Vol.37 (12), p.1570-1573

2016

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Charge Transport Mechanism in p-Channel Tin Monoxide Thin-Film Transistors

IEEE electron device letters, 2017-04, Vol.38 (4), p.473-476

2017

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Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors

IEEE electron device letters, 2015-05, Vol.36 (5), p.466-468

2015

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Determination of Interface and Bulk Trap Densities in High-Mobility p-type WSe2 Thin-Film Transistors

IEEE electron device letters, 2017-04, Vol.38 (4), p.481-484

2017

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Low-Frequency Noise Properties in Double-Gate Amorphous InGaZnO Thin-Film Transistors Fabricated by Back-Channel-Etch Method

IEEE electron device letters, 2015-12, Vol.36 (12), p.1332-1335

2015

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Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

Applied physics letters, 2013-02, Vol.102 (8)

2013

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Subgap states in p-channel tin monoxide thin-film transistors from temperature-dependent field-effect characteristics

Semiconductor science and technology, 2015-08, Vol.30 (8), p.85004

2015

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Effect of Temperature and Electric Field on Degradation in Amorphous InGaZnO TFTs Under Positive Gate and Drain Bias Stress

IEEE electron device letters, 2014-04, Vol.35 (4), p.458-460

2014

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A study on the degradation mechanism of InGaZnO thin-film transistors under simultaneous gate and drain bias stresses based on the electronic trap characterization

Semiconductor science and technology, 2014-04, Vol.29 (4), p.45023

2014

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Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress

IEEE electron device letters, 2015-06, Vol.36 (6), p.579-581

2015

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Investigation of Low-Frequency Noise Properties in High-Mobility ZnON Thin-Film Transistors

IEEE electron device letters, 2016-06, Vol.37 (6), p.739-742

2016

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Thermoreflectance microscopy analysis on self-heating effect of short-channel amorphous In-Ga-Zn-O thin film transistors

Applied physics letters, 2014-07, Vol.105 (4)

2014

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Effects of oxygen flow rate on the electrical stability of zinc oxynitride thin-film transistors

Japanese Journal of Applied Physics, 2017-02, Vol.56 (2), p.20301-020301

2017

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Intra-octahedral proton transfer in bulk orthorhombic perovskite barium cerate

Solid state ionics, 2012-10, Vol.226, p.71-75

2012

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Fabrication of amorphous InGaZnO thin-film transistor-driven flexible thermal and pressure sensors

Semiconductor science and technology, 2012-10, Vol.27 (10), p.105019

2012

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Experimental Investigation of Physical Mechanism for Asymmetrical Degradation in Amorphous InGaZnO Thin-film Transistors under Simultaneous Gate and Drain Bias Stresses

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2017, 17(2), 74, pp.239-244

2017

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Effects of Potassium Ion Substitution on Lattice Parameters and Proton Migration in Barium Phosphate

Japanese Journal of Applied Physics, 2013-11, Vol.52 (11), p.117101-117101-5

2013

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Extraction of bulk and interface trap densities in amorphous InGaZnO thin-film transistors

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2016-11, Vol.34 (6)

2016

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Proton migration in bulk orthorhombic barium cerate using density functional theory

Solid state ionics, 2014-06, Vol.259, p.1-8

2014

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Passivation of the Exposed Silver Electrodes on a Tuning Fork Crystal Oscillator by Chronoamperometry

Japanese Journal of Applied Physics, 2012-09, Vol.51 (9), p.090202-090202-3

2012

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Effects of various bias and temperature stresses on low-frequency noise properties of amorphous InGaZnO thin-film transistors

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2017-01, Vol.35 (1)

2017

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Effects of Post-Deposition Thermal Annealing Temperature on Electrical Properties of ZnON Thin-Film Transistors

Water-Mediated Photochemical Treatments for Low-Temperature Passivation of Metal-Oxide Thin-Film Transistors

Enhancing Thermal Oxidation Stability of Silver Nanowire Transparent Electrodes by Using a Cesium Carbonate-Incorporated Overcoating Layer

Electrical Instability of p-Channel SnO Thin-Film Transistors Under Light Illumination

Investigation of Carrier Transport Mechanism in High Mobility ZnON Thin-Film Transistors

Charge Transport Mechanism in p-Channel Tin Monoxide Thin-Film Transistors

Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors

Determination of Interface and Bulk Trap Densities in High-Mobility p-type WSe2 Thin-Film Transistors

Low-Frequency Noise Properties in Double-Gate Amorphous InGaZnO Thin-Film Transistors Fabricated by Back-Channel-Etch Method

Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

Subgap states in p-channel tin monoxide thin-film transistors from temperature-dependent field-effect characteristics

Effect of Temperature and Electric Field on Degradation in Amorphous InGaZnO TFTs Under Positive Gate and Drain Bias Stress

A study on the degradation mechanism of InGaZnO thin-film transistors under simultaneous gate and drain bias stresses based on the electronic trap characterization

Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress

Investigation of Low-Frequency Noise Properties in High-Mobility ZnON Thin-Film Transistors

Thermoreflectance microscopy analysis on self-heating effect of short-channel amorphous In-Ga-Zn-O thin film transistors

Effects of oxygen flow rate on the electrical stability of zinc oxynitride thin-film transistors

Intra-octahedral proton transfer in bulk orthorhombic perovskite barium cerate

Fabrication of amorphous InGaZnO thin-film transistor-driven flexible thermal and pressure sensors

Experimental Investigation of Physical Mechanism for Asymmetrical Degradation in Amorphous InGaZnO Thin-film Transistors under Simultaneous Gate and Drain Bias Stresses

Effects of Potassium Ion Substitution on Lattice Parameters and Proton Migration in Barium Phosphate

Extraction of bulk and interface trap densities in amorphous InGaZnO thin-film transistors

Proton migration in bulk orthorhombic barium cerate using density functional theory

Passivation of the Exposed Silver Electrodes on a Tuning Fork Crystal Oscillator by Chronoamperometry

Effects of various bias and temperature stresses on low-frequency noise properties of amorphous InGaZnO thin-film transistors

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