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A cyclometallated iridium(III) complex as a c-myc G-quadruplex stabilizer and down-regulator of c-myc oncogene expression

Current medicinal chemistry, 2013-02, Vol.20 (4), p.576

2013

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Identification of a natural product-like STAT3 dimerization inhibitor by structure-based virtual screening

Cell death & disease, 2014-06, Vol.5 (6), p.e1293-e1293

2014

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Electrically Bistable Thin-Film Device Based on PVK and GNPs Polymer Material

IEEE electron device letters, 2007-02, Vol.28 (2), p.107-110

2007

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Non-Volatile Polymer Memory Device Based on a Novel Copolymer of N-Vinylcarbazole and Eu-Complexed Vinylbenzoate

Advanced materials (Weinheim), 2005-02, Vol.17 (4), p.455-459

2005

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Simple tandem organic photovoltaic cells for improved energy conversion efficiency

Applied physics letters, 2008-02, Vol.92 (8), p.083310-083310-3

2008

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Efficient multilayer organic solar cells using the optical interference peak

Applied physics letters, 2008-07, Vol.93 (4), p.043307-043307-3

2008

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Non-volatile WORM memory device based on an acrylate polymer with electron donating carbazole pendant groups

Organic electronics, 2006-06, Vol.7 (3), p.173-180

2006

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Effect of surface NH3 anneal on the physical and electrical properties of HfO2 films on Ge substrate

Applied physics letters, 2004-05, Vol.84 (19), p.3741-3743

2004

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Enhancement in open circuit voltage induced by deep interface hole traps in polymer-fullerene bulk heterojunction solar cells

Applied physics letters, 2009-03, Vol.94 (10), p.103305-103305-3

2009

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Memory performance of a thin-film device based on a conjugated copolymer containing fluorene and chelated europium complex

IEEE electron device letters, 2006-03, Vol.27 (3), p.154-156

2006

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Ge-Rich (70%) SiGe Nanowire MOSFET Fabricated Using Pattern-Dependent Ge-Condensation Technique

IEEE electron device letters, 2008-06, Vol.29 (6), p.595-598

2008

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Omega-Gate p-MOSFET With Nanowirelike SiGe/Si Core/Shell Channel

IEEE electron device letters, 2009-04, Vol.30 (4), p.392-394

2009

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Gate-first germanium nMOSFET with CVD HfO2 gate dielectric and silicon surface passivation

IEEE electron device letters, 2006-06, Vol.27 (6), p.479-481

2006

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Work function tuning of metal nitride electrodes for advanced CMOS devices

Thin solid films, 2006-05, Vol.504 (1), p.174-177

2006

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Flicker Noise and Its Degradation Characteristics Under Electrical Stress in MOSFETs With Thin Strained-Si/SiGe Dual-Quantum Well

IEEE electron device letters, 2007-07, Vol.28 (7), p.603-605

2007

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Work-Function Tuning of TaN by High-Temperature Metal Intermixing Technique for Gate-First CMOS Process

IEEE electron device letters, 2006-10, Vol.27 (10), p.811-813

2006

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Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics

IEEE transactions on electron devices, 1987-02, Vol.34 (2), p.286-293

1987

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Reduction of Leakage and Low-Frequency Noise in MOS Transistors Through Two-Step RTA of NiSi-Silicide Technology

IEEE electron device letters, 2006-10, Vol.27 (10), p.824-826

2006

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Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

Journal of applied physics, 1997-02, Vol.81 (4), p.1992-2001

1997

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Performance Improvement in Charge-Trap Flash Memory Using Lanthanum-Based High- \kappa Blocking Oxide

IEEE transactions on electron devices, 2009-11, Vol.56 (11), p.2746-2751

2009

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Electronic and optical properties of carbon nitride thin films synthesized by laser ablation under ion beam bombardment

Journal of applied physics, 1998-08, Vol.84 (4), p.2133-2137

1998

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Improvement in the hole collection of polymer solar cells by utilizing gold nanoparticle buffer layer

Chemical physics letters, 2008-02, Vol.453 (1), p.73-76

2008

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True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide films

Applied physics letters, 1993-10, Vol.63 (16), p.2240-2242

1993

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High-Performance MIM Capacitors Using HfLaO-Based Dielectrics

IEEE electron device letters, 2010-01, Vol.31 (1), p.17-19

2010

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A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

IEEE transactions on electron devices, 1995-05, Vol.42 (5), p.963-968

1995

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A cyclometallated iridium(III) complex as a c-myc G-quadruplex stabilizer and down-regulator of c-myc oncogene expression

Identification of a natural product-like STAT3 dimerization inhibitor by structure-based virtual screening

Electrically Bistable Thin-Film Device Based on PVK and GNPs Polymer Material

Non-Volatile Polymer Memory Device Based on a Novel Copolymer of N-Vinylcarbazole and Eu-Complexed Vinylbenzoate

Simple tandem organic photovoltaic cells for improved energy conversion efficiency

Efficient multilayer organic solar cells using the optical interference peak

Non-volatile WORM memory device based on an acrylate polymer with electron donating carbazole pendant groups

Effect of surface NH3 anneal on the physical and electrical properties of HfO2 films on Ge substrate

Enhancement in open circuit voltage induced by deep interface hole traps in polymer-fullerene bulk heterojunction solar cells

Memory performance of a thin-film device based on a conjugated copolymer containing fluorene and chelated europium complex

Ge-Rich (70%) SiGe Nanowire MOSFET Fabricated Using Pattern-Dependent Ge-Condensation Technique

Omega-Gate p-MOSFET With Nanowirelike SiGe/Si Core/Shell Channel

Gate-first germanium nMOSFET with CVD HfO2 gate dielectric and silicon surface passivation

Work function tuning of metal nitride electrodes for advanced CMOS devices

Flicker Noise and Its Degradation Characteristics Under Electrical Stress in MOSFETs With Thin Strained-Si/SiGe Dual-Quantum Well

Work-Function Tuning of TaN by High-Temperature Metal Intermixing Technique for Gate-First CMOS Process

Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics

Reduction of Leakage and Low-Frequency Noise in MOS Transistors Through Two-Step RTA of NiSi-Silicide Technology

Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

Performance Improvement in Charge-Trap Flash Memory Using Lanthanum-Based High- \kappa Blocking Oxide

Electronic and optical properties of carbon nitride thin films synthesized by laser ablation under ion beam bombardment

Improvement in the hole collection of polymer solar cells by utilizing gold nanoparticle buffer layer

True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide films

High-Performance MIM Capacitors Using HfLaO-Based Dielectrics

A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

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