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Measurement. Sensors, 2021-12, Vol.18, p.100293, Article 100293
2021
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Monthly notices of the Royal Astronomical Society, 2024-04, Vol.530 (2), p.2378-2419
- Schaller, Matthieu
- Borrow, Josh
- Draper, Peter W
- Ivkovic, Mladen
- McAlpine, Stuart
- Vandenbroucke, Bert
- Bahé, Yannick
- Chaikin, Evgenii
- Chalk, Aidan B G
- Chan, Tsang Keung
- Correa, Camila
- van Daalen, Marcel
- Elbers, Willem
- Gonnet, Pedro
- Hausammann, Loïc
- Helly, John
- Huško, Filip
- Kegerreis, Jacob A
- Nobels, Folkert S J
- Ploeckinger, Sylvia
- Revaz, Yves
- Roper, William J
- Ruiz-Bonilla, Sergio
- Sandnes, Thomas D
- Uyttenhove, Yolan
- Willis, James S
- Xiang, Zhen
2024
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Journal of electronic testing, 2004-02, Vol.20 (1), p.11-23
2004
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Molecular and cellular endocrinology, 1989-08, Vol.65 (1), p.35-41
1989
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1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 1997, p.100-108
1997
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Molecular and cellular endocrinology, 1989-08, Vol.65 (1-2), p.35-41
1989
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Analytical chemistry (Washington), 1984-11, Vol.56 (13), p.2367-2368
1984
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