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Scalable Effort Hardware Design
IEEE transactions on very large scale integration (VLSI) systems, 2014-09, Vol.22 (9), p.2004-2016
2014

2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 2013, p.1-9
2013

2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC), 2015, p.1-6
2015

Design Automation Conference, 2010, p.865-870
2010


Proceedings of the 52nd Annual Design Automation Conference, 2015, p.1-6
2015
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2013 46th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO), 2013, p.1-12
2013
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IEEE embedded systems letters, 2011-03, Vol.3 (1), p.42-45
2011

2021 IEEE/ACM Symposium on Edge Computing (SEC), 2021, p.135-147
2021
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IEEE transactions on very large scale integration (VLSI) systems, 2007-06, Vol.15 (6), p.699-710
2007

Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 16-20 Apr. 2007, 2007, p.33-38
2007
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2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, p.748-751
2015

31st Design Automation Conference, 1994, p.81-86
1994

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015, p.748-751
2015
Link zum Volltext

2013 Asilomar Conference on Signals, Systems and Computers, 2013, p.111-117
2013



IEEE transactions on computer-aided design of integrated circuits and systems, 1993-07, Vol.12 (7), p.1015-1028
1993

IEEE transactions on computer-aided design of integrated circuits and systems, 1999-06, Vol.18 (6), p.669-684
1999

ACM transactions on embedded computing systems, 2013-05, Vol.12 (2s), p.1-23
2013
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2009 IEEE International Symposium on Parallel & Distributed Processing, 2009, p.1-12
2009

Proceedings of the seventeenth international conference on Architectural Support for Programming Languages and Operating Systems, 2012, p.61-74
2012
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Journal of Information Science and Engineering, 2000-09, Vol.16 (5), p.673-686
2000
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Energy models for delay testing
IEEE transactions on computer-aided design of integrated circuits and systems, 1995-06, Vol.14 (6), p.728-739
1995

Journal of electronic testing, 2000-10, Vol.16 (5), p.521
2000
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