UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

High-resolution electron microscopy of diamond hexagonal silicon in low pressure chemical vapor deposited polycrystalline silicon

Journal of materials research, 1991-11, Vol.6 (11), p.2324-2336

Cerva, Hans

1991

Volltextzugriff (PDF)

Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects

Solid state phenomena, 2002-01, Vol.85-86, p.67-144

2002

Volltextzugriff (PDF)

Microstructure and Crystal Structure of Bismuth Oxide Phases in Zinc Oxide Varistor Ceramics

Journal of the American Ceramic Society, 1988-07, Vol.71 (7), p.522-530

1988

Volltextzugriff (PDF)

On the role of nanocavities in suppressing boron transient enhanced diffusion and deactivation in F + coimplanted silicon

Journal of applied physics, 2008-05, Vol.103 (10), p.103525-103525-8

2008

Volltextzugriff (PDF)

Application of Selected Electron Microscopy Methods to Materials Analysis Problems

ECS transactions, 2007, Vol.10 (1), p.97-108

2007

Volltextzugriff (PDF)

Organic Peracid Etches: A New Class of Chromium Free Etch Solutions for the Delineation of Defects in Different Semiconducting Materials

ECS transactions, 2007, Vol.10 (1), p.21-31

2007

Volltextzugriff (PDF)

Properties of SrBi2Ta2O9 thin films grown by MOCVD for high density FeRAM applications

Integrated ferroelectrics, 1998-09, Vol.21 (1-4), p.367-379

1998

Volltextzugriff (PDF)

Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability

Materials Science Forum, 2005-05, Vol.483-485, p.925-928

2005

Volltextzugriff (PDF)

Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations

Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum, 1997-01, Vol.148-149, p.103-121

Cerva, Hans

1997

Volltextzugriff (PDF)

Effect of compressive and tensile strain on misfit dislocation injection in SiGe epitaxial layers

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1993-05, Vol.11 (3), p.1056-1063

1993

Volltextzugriff (PDF)

Identification of Microdefects Induced in Si after Hydrogen and Helium Plasma Treatments

Materials science forum, 1989-01, Vol.38-41, p.1033-1038

1989

Volltextzugriff (PDF)

Defects and Contamination in Microelectronic Device Production: State-of-the-Art and Prospects

Solid state phenomena, 2001-01, Vol.76-77, p.1-6

2001

Volltextzugriff (PDF)

Interfacial layers and their effect on leakage current in mocvd-deposited SBT thin films

Integrated ferroelectrics, 2001-01, Vol.39 (1-4), p.189-198

2001

Volltextzugriff (PDF)

High-Resolution Electron Microscopy of Process-Induced Defects in Silicon

MRS proceedings, 1990, Vol.183, Article 67

1990

Volltextzugriff (PDF)

Two-dimensional delineation of shallow junctions in silicon by selective etching of transmission electron microscopy cross sections

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1992, Vol.10 (1), p.491-495

Cerva, Hans

1992

Volltextzugriff (PDF)

Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates

Solid state phenomena, 1996-05, Vol.51-52, p.295-300

1996

Volltextzugriff (PDF)

Process-Induced Defects in Silicon Technology

Solid state phenomena, 1993-12, Vol.32-33, p.231-246

1993

Volltextzugriff (PDF)

Properties of SrBi 2 Ta 2 O 9 thin films grown by MOCVD for high density FeRAM applications

Integrated ferroelectrics, 1998-09, Vol.21 (1-4), p.367-379

1998

Volltextzugriff (PDF)

Accident Analysis to Avoid PPM Peaks on Purchased Semiconductors Components

2006 1st Electronic Systemintegration Technology Conference, 2006, Vol.2, p.848-853

2006

Volltextzugriff (PDF)

Comparison of Growth and Strain Relaxation of Si/Ge Superlattices Under Compressive and Tensile Strain Field

MRS proceedings, 1991, Vol.220, Article 135

1991

Volltextzugriff (PDF)

New Relaxation Mechanism in Short Period Si/Ge Strained-Layer Superlattices

MRS proceedings, 1990, Vol.183, Article 155

1990

Volltextzugriff (PDF)

An analytical characterization and reliability testing of an adhesion enhancing Zn-Cr leadframe coating for popcorn prevention

1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206), 1998, p.1154-1161

1998

Volltextzugriff (PDF)

1 – 22 von 22

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(13)
Mit Volltextzugriff
(9)

Publikationsform

Artikel
(17)
Tagungsberichte
(5)

Sprache

Englisch
(22)
Japanisch
(5)

Erscheinungsjahr

n.n

Thema

Science & Technology
(14)
Technology
(13)
Materials Science
(10)
Physics
(10)
Physical Sciences
(9)
Physics, Applied
(8)
Engineering
(7)
Engineering, Electrical & Electronic
(7)
Materials Science, Multidisciplinary
(7)
Physics, Condensed Matter
(4)
Dislocations
(3)
Exact Sciences And Technology
(2)
Materials Science, Ceramics
(2)
Microscopy
(2)
Stacking Faults
(2)
Transmission Electron Microscopy
(2)
Accidents
(1)
Adhesives
(1)
Amorphe Dünne Schicht
(1)
Amorphes Silicium
(1)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

High-resolution electron microscopy of diamond hexagonal silicon in low pressure chemical vapor deposited polycrystalline silicon

Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects

Microstructure and Crystal Structure of Bismuth Oxide Phases in Zinc Oxide Varistor Ceramics

On the role of nanocavities in suppressing boron transient enhanced diffusion and deactivation in F + coimplanted silicon

Application of Selected Electron Microscopy Methods to Materials Analysis Problems

Organic Peracid Etches: A New Class of Chromium Free Etch Solutions for the Delineation of Defects in Different Semiconducting Materials

Properties of SrBi2Ta2O9 thin films grown by MOCVD for high density FeRAM applications

Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability

Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations

Effect of compressive and tensile strain on misfit dislocation injection in SiGe epitaxial layers

Identification of Microdefects Induced in Si after Hydrogen and Helium Plasma Treatments

Defects and Contamination in Microelectronic Device Production: State-of-the-Art and Prospects

Interfacial layers and their effect on leakage current in mocvd-deposited SBT thin films

High-Resolution Electron Microscopy of Process-Induced Defects in Silicon

Two-dimensional delineation of shallow junctions in silicon by selective etching of transmission electron microscopy cross sections

Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates

Process-Induced Defects in Silicon Technology

Properties of SrBi 2 Ta 2 O 9 thin films grown by MOCVD for high density FeRAM applications

Accident Analysis to Avoid PPM Peaks on Purchased Semiconductors Components

Comparison of Growth and Strain Relaxation of Si/Ge Superlattices Under Compressive and Tensile Strain Field

New Relaxation Mechanism in Short Period Si/Ge Strained-Layer Superlattices

An analytical characterization and reliability testing of an adhesion enhancing Zn-Cr leadframe coating for popcorn prevention

Suchergebnisse filtern