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Atom Probe Tomography Analysis of Boron and/or Phosphorus Distribution in Doped Silicon Nanocrystals

Journal of physical chemistry. C, 2016-08, Vol.120 (31), p.17845-17852

2016

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3D microstructure analysis of silicon-boron phosphide mixed nanocrystals

Nanoscale, 2020-04, Vol.12 (13), p.7256-7262

2020

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Atomically resolved tomography to directly inform simulations for structure–property relationships

Nature communications, 2014-11, Vol.5 (1), p.5501-5501, Article 5501

2014

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Atom Probe Tomography of Aluminium Alloys: A Systematic Meta-Analysis Review of 2018

Metals (Basel ), 2019-10, Vol.9 (10), p.1071

2019

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New insights into the phase transformations to isothermal ω and ω-assisted α in near β-Ti alloys

Acta materialia, 2016-03, Vol.106, p.353-366

2016

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Quantitative dopant distributions in GaAs nanowires using atom probe tomography

Ultramicroscopy, 2013-09, Vol.132, p.186-192

2013

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EDP2PDF: a computer program for extracting a pair distribution function from an electron diffraction pattern for the structural analysis of materials

Journal of applied crystallography, 2023-06, Vol.56 (3), p.889-902

2023

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Effects of thermal annealing on the distribution of boron and phosphorus in p-i-n structured silicon nanocrystals embedded in silicon dioxide

Nanotechnology, 2022-02, Vol.33 (7), p.75709

2022

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Atom Probe Analysis of a Zr-based Bulk Metallic Glass

Microscopy and microanalysis, 2022-08, Vol.28 (4), p.1348-1358

2022

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Quantitative binomial distribution analyses of nanoscale like-solute atom clustering and segregation in atom probe tomography data

Microscopy research and technique, 2008-07, Vol.71 (7), p.542-550

2008

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Community-Driven Methods for Open and Reproducible Software Tools for Analyzing Datasets from Atom Probe Microscopy

Microscopy and microanalysis, 2022-08, Vol.28 (4), p.1038-1053

2022

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Distribution of boron and phosphorus and roles of co-doping in colloidal silicon nanocrystals

Acta materialia, 2019-10, Vol.178, p.186-193

2019

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Assessing the Spatial Accuracy of the Reconstruction in Atom Probe Tomography and a New Calibratable Adaptive Reconstruction

Microscopy and microanalysis, 2019-04, Vol.25 (2), p.309-319

2019

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On the retrieval of crystallographic information from atom probe microscopy data via signal mapping from the detector coordinate space

Ultramicroscopy, 2018-06, Vol.189, p.65-75

2018

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Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography

Microscopy and microanalysis, 2021-02, Vol.27 (1), p.140-148

2021

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Introducing a Crystallography-Mediated Reconstruction (CMR) Approach to Atom Probe Tomography

Microscopy and microanalysis, 2019-04, Vol.25 (2), p.288-300

2019

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A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers

Langmuir, 2017-09, Vol.33 (38), p.9573-9581

2017

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A nexus between 3D atomistic data hybrids derived from atom probe microscopy and computational materials science: A new analysis of solute clustering in Al-alloys

Scripta materialia, 2017-04, Vol.131, p.93-97

2017

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Interpreting atom probe data from chromium oxide scales

Ultramicroscopy, 2015-12, Vol.159, p.354-359

2015

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Interpreting the Simplified Multicomponent Short-Range Order Parameter

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.332-333

2019

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Point-by-point compositional analysis for atom probe tomography

MethodsX, 2014-01, Vol.1 (C), p.12-18

2014

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Sydney Nano: small matters for big impact

Biophysical reviews, 2018-02, Vol.10 (1), p.101-103

2018

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A new systematic framework for crystallographic analysis of atom probe data

Ultramicroscopy, 2015-07, Vol.154, p.7-14

2015

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Restoring the lattice of Si-based atom probe reconstructions for enhanced information on dopant positioning

Ultramicroscopy, 2015-12, Vol.159, p.314-323

2015

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Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals

Physica status solidi. PSS-RRL. Rapid research letters, 2017-01, Vol.11 (1), p.np-n/a

2017

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Atom Probe Tomography Analysis of Boron and/or Phosphorus Distribution in Doped Silicon Nanocrystals

3D microstructure analysis of silicon-boron phosphide mixed nanocrystals

Atomically resolved tomography to directly inform simulations for structure–property relationships

Atom Probe Tomography of Aluminium Alloys: A Systematic Meta-Analysis Review of 2018

New insights into the phase transformations to isothermal ω and ω-assisted α in near β-Ti alloys

Quantitative dopant distributions in GaAs nanowires using atom probe tomography

EDP2PDF: a computer program for extracting a pair distribution function from an electron diffraction pattern for the structural analysis of materials

Effects of thermal annealing on the distribution of boron and phosphorus in p-i-n structured silicon nanocrystals embedded in silicon dioxide

Atom Probe Analysis of a Zr-based Bulk Metallic Glass

Quantitative binomial distribution analyses of nanoscale like-solute atom clustering and segregation in atom probe tomography data

Community-Driven Methods for Open and Reproducible Software Tools for Analyzing Datasets from Atom Probe Microscopy

Distribution of boron and phosphorus and roles of co-doping in colloidal silicon nanocrystals

Assessing the Spatial Accuracy of the Reconstruction in Atom Probe Tomography and a New Calibratable Adaptive Reconstruction

On the retrieval of crystallographic information from atom probe microscopy data via signal mapping from the detector coordinate space

Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography

Introducing a Crystallography-Mediated Reconstruction (CMR) Approach to Atom Probe Tomography

A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers

A nexus between 3D atomistic data hybrids derived from atom probe microscopy and computational materials science: A new analysis of solute clustering in Al-alloys

Interpreting atom probe data from chromium oxide scales

Interpreting the Simplified Multicomponent Short-Range Order Parameter

Point-by-point compositional analysis for atom probe tomography

Sydney Nano: small matters for big impact

A new systematic framework for crystallographic analysis of atom probe data

Restoring the lattice of Si-based atom probe reconstructions for enhanced information on dopant positioning

Atom probe tomography of size‐controlled phosphorus doped silicon nanocrystals

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