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Single-Event Effects on Commercial-Off-the Shelf Edge-Processing Artificial Intelligence ASICs

IEEE transactions on nuclear science, 2023-08, Vol.70 (8), p.1-1

2023

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Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory

IEEE transactions on nuclear science, 2021-04, Vol.68 (4), p.402-409

2021

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Space Radiation Effects on SiC Power Device Reliability

2021 IEEE International Reliability Physics Symposium (IRPS), 2021, p.1-8

2021

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Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.835-841

2021

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Schottky Diode Derating for Survivability in a Heavy Ion Environment

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2482-2489

2015

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Failure Analysis of Heavy Ion-Irradiated Schottky Diodes

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.269-279

2018

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NASA Goddard Space Flight Center's Current Radiation Effects Test Results

2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023, p.1-13

2023

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NASA Goddard Space Flight Center's Recent Radiation Effects Test Results

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC), 2022, p.1-7

2022

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NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020, p.1-12

2020

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A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3447-3455

2008

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NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, p.1-7

2018

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NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, p.1-8

2018

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Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2021, p.1-5

2021

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NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop, 2019, p.1-10

2019

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Recent Radiation Test Results for Trench Power MOSFETs

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-8

2017

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Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

2015 IEEE Radiation Effects Data Workshop (REDW), 2015, p.1-9

2015

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Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-9

2017

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Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

2015 IEEE Radiation Effects Data Workshop (REDW), 2015, p.1-9

2015

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Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-11

2017

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Simulation Study on the Effect of Multiple Node Charge Collection on Error Cross-Section in CMOS Sequential Logic

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3136-3140

2008

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Recent Radiation Test Results for Power MOSFETs

2013 IEEE Radiation Effects Data Workshop (REDW), 2013, p.1-6

2013

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Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3262-3266

2009

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Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic Gates

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3386-3391

2006

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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

2014 IEEE Radiation Effects Data Workshop (REDW), 2014, p.1-12

2014

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Laser Verification of On-Chip Charge-Collection Measurement Circuit

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3309-3313

2008

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Single-Event Effects on Commercial-Off-the Shelf Edge-Processing Artificial Intelligence ASICs

Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory

Space Radiation Effects on SiC Power Device Reliability

Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

Schottky Diode Derating for Survivability in a Heavy Ion Environment

Failure Analysis of Heavy Ion-Irradiated Schottky Diodes

NASA Goddard Space Flight Center's Current Radiation Effects Test Results

NASA Goddard Space Flight Center's Recent Radiation Effects Test Results

NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Recent Radiation Test Results for Trench Power MOSFETs

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Simulation Study on the Effect of Multiple Node Charge Collection on Error Cross-Section in CMOS Sequential Logic

Recent Radiation Test Results for Power MOSFETs

Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power

Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic Gates

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Laser Verification of On-Chip Charge-Collection Measurement Circuit

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