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A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2322-2329

2007

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Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

IEEE transactions on nuclear science, 2000-12, Vol.47 (6), p.2669-2674

2000

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A study of the SEU performance of InP and SiGe shift registers

IEEE transactions on nuclear science, 2005-08, Vol.52 (4), p.1140-1147

2005

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Characteristics of single-event upsets in a fabric switch (AD8151)

IEEE transactions on nuclear science, 2004-10, Vol.51 (5), p.2840-2845

2004

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Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3280-3284

2009

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Single event upsets in the dual-port-board SRAMs of the MPTB experiment

IEEE transactions on nuclear science, 2000-06, Vol.47 (3), p.712-717

2000

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An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3166-3174

2006

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Re-Examining TID Hardness Assurance Test Protocols for SiGe HBTs

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3318-3325

2009

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Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3400-3407

2006

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SEU Error Signature Analysis of Gbit/s SiGe Logic Circuits Using a Pulsed Laser Microprobe

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3277-3284

2006

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Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA

2008 IEEE Radiation Effects Data Workshop, 2008, p.11-20

2008

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Heavy ion and proton-induced single event multiple upset

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2224-2229

1997

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Particle-induced bit errors in high performance fiber optic data links for satellite data management

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.1958-1965

1994

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Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA

2008 IEEE Radiation Effects Data Workshop, 2008, p.5-10

2008

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Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2833-2841

1998

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TID and SEE Response of Advanced 4G NAND Flash Memories

2008 IEEE Radiation Effects Data Workshop, 2008, p.31-37

2008

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Single Event Upset cross sections at various data rates

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.2862-2867

1996

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Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-[micro]m SiGe heterojunction bipolar transistors and circuits

IEEE transactions on nuclear science, 2003-12, Vol.50 (6), p.2184

2003

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Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

IEEE transactions on nuclear science, 2003-12, Vol.50 (6), p.2184-2190

2003

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Proton-induced transient effects in a metal-semiconductor-metal (MSM) photodetector for optical-based data transfer

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2842-2848

1998

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Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA

2006 IEEE Radiation Effects Data Workshop, 2006, p.19-25

2006

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Single event test methodology and test results of commercial gigabit per second Fiber Channel hardware

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.1878-1884

1997

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Validation and testing of design hardening for single event effects using the 8051 microcontroller

IEEE Radiation Effects Data Workshop, 2005, 2005, p.85-92

2005

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Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

IEEE Radiation Effects Data Workshop, 2005, 2005, p.149-155

2005

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Recent single event effects results for candidate spacecraft electronics for NASA

IEEE Radiation Effects Data Workshop, 2005, 2005, p.26-35

2005

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A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

A study of the SEU performance of InP and SiGe shift registers

Characteristics of single-event upsets in a fabric switch (AD8151)

Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs

Re-Examining TID Hardness Assurance Test Protocols for SiGe HBTs

Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits

SEU Error Signature Analysis of Gbit/s SiGe Logic Circuits Using a Pulsed Laser Microprobe

Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Heavy ion and proton-induced single event multiple upset

Particle-induced bit errors in high performance fiber optic data links for satellite data management

Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA

Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

TID and SEE Response of Advanced 4G NAND Flash Memories

Single Event Upset cross sections at various data rates

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-[micro]m SiGe heterojunction bipolar transistors and circuits

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Proton-induced transient effects in a metal-semiconductor-metal (MSM) photodetector for optical-based data transfer

Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Single event test methodology and test results of commercial gigabit per second Fiber Channel hardware

Validation and testing of design hardening for single event effects using the 8051 microcontroller

Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

Recent single event effects results for candidate spacecraft electronics for NASA

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