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European journal of plant pathology, 2020-02, Vol.156 (2), p.635-646
2020
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2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.8A.2-1-8A.2-4
2022
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2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6
2021
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2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2016, p.107-110
2016
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2016 IEEE 34th VLSI Test Symposium (VTS), 2016, p.1-4
2016
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2015 IEEE 24th Asian Test Symposium (ATS), 2015, p.211-216
2015
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2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022, p.1-4
2022
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2022 IEEE European Test Symposium (ETS), 2022, p.1-6
2022
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2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2022, p.1-10
2022
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2016 IEEE 25th Asian Test Symposium (ATS), 2016, p.119-124
2016
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2022 IEEE European Test Symposium (ETS), 2022, p.1-10
2022
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2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019, p.920-923
2019
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Microprocessors and microsystems, 2016-11, Vol.47, p.392-403
2016
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2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017, p.1-4
2017
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2017 18th IEEE Latin American Test Symposium (LATS), 2017, p.1-6
2017
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2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 2015, p.34-35
2015
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2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014, p.299-304
2014
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2016 21th IEEE European Test Symposium (ETS), 2016, p.1-2
2016
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2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS), 2015, p.1-4
2015
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2015 16th Latin-American Test Symposium (LATS), 2015, p.1-6
2015
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2015 Conference on Design of Circuits and Integrated Systems (DCIS), 2015, p.1-6
2015
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2023 26th Euromicro Conference on Digital System Design (DSD), 2023, p.214-219
2023
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2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2018, p.129-134
2018
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2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 2018, p.59-64
2018
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2018 IEEE 19th Latin-American Test Symposium (LATS), 2018, p.1-6
2018
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