UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Heavy Ion, High-Energy, and Low-Energy Proton SEE Sensitivity of 90-nm RHBD SRAMs

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3493-3499

2010

Volltextzugriff (PDF)

SEMM-2: a modeling system for single event upset analysis

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3342-3348

2004

Volltextzugriff (PDF)

Clock and Reset Transients in a 90 nm RHBD Single-Core Tilera Processor

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3505-3510

2009

Volltextzugriff (PDF)

Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3145-3151

2009

Volltextzugriff (PDF)

Alpha-particle-induced upsets in advanced CMOS circuits and technology

IBM journal of research and development, 2008-05, Vol.52 (3), p.225-232

2008

Volltextzugriff (PDF)

Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3512-3517

2006

Volltextzugriff (PDF)

Circuit design and modeling for soft errors

IBM journal of research and development, 2008-05, Vol.52 (3), p.255-263

2008

Volltextzugriff (PDF)

VASE-Containing N-CAM Isoforms Are Increased in the Hippocampus in Bipolar Disorder but Not Schizophrenia

Experimental neurology, 1998-11, Vol.154 (1), p.1-11

1998

Volltextzugriff (PDF)

Fractional and unquantized dc voltage generation in THz-driven semiconductor superlattices

Europhysics letters, 2001-12, Vol.56 (6), p.842-848

2001

Volltextzugriff (PDF)

Phaser: Phased methodology for modeling the system-level effects of soft errors

IBM journal of research and development, 2008-05, Vol.52 (3), p.293-306

2008

Volltextzugriff (PDF)

Single-event-upset and alpha-particle emission rate measurement techniques

IBM journal of research and development, 2008-05, Vol.52 (3), p.265-273

2008

Volltextzugriff (PDF)

Abnormal Expression of Cell Recognition Molecules in Schizophrenia

Experimental neurology, 1998-02, Vol.149 (2), p.424-432

1998

Volltextzugriff (PDF)

Heavy Ion and High Energy Proton-Induced Single Event Transients in 90 nm Inverter, NAND and NOR Gates

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3511-3518

2009

Volltextzugriff (PDF)

Fractional and unquantized dc voltage generation in THz-driven semiconductor superlattices

Europhysics letters, 2004-12, Vol.68 (5), p.753-753

2004

Volltextzugriff (PDF)

Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2726-2733

2011

Volltextzugriff (PDF)

Intrastriatal adrenal medulla grafts in rats. Long-term survival and behavioral effects

Journal of neurosurgery, 1986-11, Vol.65 (5), p.664-670

1986

Volltextzugriff (PDF)

Soft errors from neutron and proton-induced multiple-node events

2010 IEEE International Reliability Physics Symposium, 2010, p.1019-1025

Cannon, E H

2010

Volltextzugriff (PDF)

Impaired olfactory behavior in mice deficient in the α subunit of Go

Brain research, 2002-06, Vol.941 (1-2), p.62-71

2002

Volltextzugriff (PDF)

Design Implications of Single Event Transients in a Commercial 45 nm SOI Device Technology

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3461-3466

2008

Volltextzugriff (PDF)

Normalization of Spiroperidol Binding in the Denervated Rat Striatum by Homologous Grafts of Substantia Nigra

Science (American Association for the Advancement of Science), 1983-11, Vol.222 (4626), p.937-939

1983

Volltextzugriff (PDF)

Kainic acid lesions increase reafferentation of the striatum by substantia nigra grafts

Brain research, 1993-09, Vol.621 (1), p.71-78

1993

Volltextzugriff (PDF)

Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3375-3380

2008

Volltextzugriff (PDF)

Measurement of Premorbid Adjustment in Chronic Schizophrenia

Schizophrenia bulletin, 1982, Vol.8 (3), p.470-484

1982

Volltextzugriff (PDF)

Latch Design Techniques for Mitigating Single Event Upsets in 65 nm SOI Device Technology

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2021-2027

2007

Volltextzugriff (PDF)

Dissipative chaos and symmetry breaking in ac-driven nanostructures

Microelectronic engineering, 1999-06, Vol.47 (1), p.337-339

1999

Volltextzugriff (PDF)

1 – 25 von 1.610

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(1.438)
Mit Volltextzugriff
(1.357)

Publikationsform

3 weitere anzeigen...

Weniger anzeigen...

Sprache

1 weiteren anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Thema

Science & Technology
(1.113)
Life Sciences & Biomedicine
(844)
Humans
(706)
Male
(470)
Female
(467)
Biological And Medical Sciences
(330)
Medical Sciences
(283)
Middle Aged
(250)
Adult
(248)
Physical Sciences
(189)
Aged
(183)
Psychiatry
(183)
Adolescent
(161)
Cardiovascular System & Cardiology
(150)
Cardiac & Cardiovascular Systems
(140)
Psychosis
(127)
Risk Factors
(125)
Animals
(119)
Young Adult
(115)
Astronomy & Astrophysics
(112)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

Menü

Weitere Dienste

Einstellungen

Heavy Ion, High-Energy, and Low-Energy Proton SEE Sensitivity of 90-nm RHBD SRAMs

SEMM-2: a modeling system for single event upset analysis

Clock and Reset Transients in a 90 nm RHBD Single-Core Tilera Processor

Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

Alpha-particle-induced upsets in advanced CMOS circuits and technology

Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells

Circuit design and modeling for soft errors

VASE-Containing N-CAM Isoforms Are Increased in the Hippocampus in Bipolar Disorder but Not Schizophrenia

Fractional and unquantized dc voltage generation in THz-driven semiconductor superlattices

Phaser: Phased methodology for modeling the system-level effects of soft errors

Single-event-upset and alpha-particle emission rate measurement techniques

Abnormal Expression of Cell Recognition Molecules in Schizophrenia

Heavy Ion and High Energy Proton-Induced Single Event Transients in 90 nm Inverter, NAND and NOR Gates

Fractional and unquantized dc voltage generation in THz-driven semiconductor superlattices

Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor

Intrastriatal adrenal medulla grafts in rats. Long-term survival and behavioral effects

Soft errors from neutron and proton-induced multiple-node events

Impaired olfactory behavior in mice deficient in the α subunit of Go

Design Implications of Single Event Transients in a Commercial 45 nm SOI Device Technology

Normalization of Spiroperidol Binding in the Denervated Rat Striatum by Homologous Grafts of Substantia Nigra

Kainic acid lesions increase reafferentation of the striatum by substantia nigra grafts

Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology

Measurement of Premorbid Adjustment in Chronic Schizophrenia

Latch Design Techniques for Mitigating Single Event Upsets in 65 nm SOI Device Technology

Dissipative chaos and symmetry breaking in ac-driven nanostructures

Suchergebnisse filtern