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Prevalence, Genotype Diversity, and Distinct Pathogenicity of 205 Gammacoronavirus Infectious Bronchitis Virus Isolates in China during 2019-2023

Viruses, 2024-06, Vol.16 (6), p.930

2024

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MOS RF reliability subject to dynamic voltage stress-modeling and analysis

IEEE transactions on electron devices, 2005-08, Vol.52 (8), p.1751-1758

2005

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Electrical and Temperature Stress Effects on Class-AB Power Amplifier Performances

IEEE transactions on electron devices, 2007-06, Vol.54 (6), p.1346-1350

2007

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A Nectin1 Mutant Mouse Model Is Resistant to Pseudorabies Virus Infection

Viruses, 2022-04, Vol.14 (5), p.874

2022

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[Formula Omitted] Gate Breakdown and Channel Hot Electron Effect on MOSFET Third-Order Intermodulation

IEEE transactions on electron devices, 2008-10, Vol.55 (10), p.2790

2008

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Channel hot-electron degradation or 60-nm HfO2-gated nMOSFET DC and RF performances

IEEE transactions on electron devices, 2006-05, Vol.53 (5), p.1065-1072

2006

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hbox Gate Breakdown and Channel Hot Electron Effect on MOSFET Third-Order Intermodulation

IEEE transactions on electron devices, 2008-10, Vol.55 (10), p.2790-2794

2008

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CMOS device and circuit degradations subject to HfO2 gate breakdown and transient charge-trapping effect

IEEE transactions on electron devices, 2007, Vol.54 (1), p.59-67

2007

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A multiband multimode transmitter without driver amplifier

2012 IEEE International Solid-State Circuits Conference, 2012, p.164-166

2012

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HfO2 Gate Breakdown and Channel Hot Electron Effect on MOSFET Third-Order Intermodulation

IEEE transactions on electron devices, 2008-10, Vol.55 (10), p.2790-2794

2008

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Establishment of a pig CRISPR/Cas9 knockout library for functional gene screening in pig cells

Biotechnology journal, 2022-07, Vol.17 (7), p.e2100408-n/a

2022

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Activated mammalian target of rapamycin is associated with T regulatory cell insufficiency in nasal polyps

Respiratory research, 2009-02, Vol.10 (1), p.13-13, Article 13

2009

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Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring

IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 2005-12, Vol.52 (12), p.2539-2551

2005

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Dynamic voltage stress effects on nMOS varactor

Microelectronics and reliability, 2006-09, Vol.46 (9), p.1812-1816

2006

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Evaluation of RF Capacitance Extraction for Ultrathin Ultraleaky SOI MOS Devices

IEEE electron device letters, 2007-01, Vol.28 (1), p.45-47

2007

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Dynamic stress-induced high-frequency noise degradations in nMOSFETs

Microelectronics and reliability, 2005-09, Vol.45 (9), p.1794-1799

2005

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Hot Carrier-Induced Degradation on High-K Trnasistors and Low Noise Amplifier

2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.707-708

2006

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Voltage stress-induced hot carrier effects on SiGe HBT VCO

Microelectronics and reliability, 2005-09, Vol.45 (9), p.1402-1405

2005

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CMOS Device and Circuit Degradations Subject to \hbox Gate Breakdown and Transient Charge-Trapping Effect

IEEE transactions on electron devices, 2007-01, Vol.54 (1), p.59-67

2007

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RF reliability subject to dynamic voltage stress in NMOS circuits [power amplifier example]

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.431-434

2005

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Channel hot-electron degradation on 60-nm HfO/sub 2/-gated nMOSFET DC and RF performances

IEEE transactions on electron devices, 2006-05, Vol.53 (5), p.1065-1072

2006

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Analysis and modeling of LNA circuit reliability

2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers, 2005, p.69-72

2005

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Channel hot-electron degradation on 60-nm HfO sub(2)-gated nMOSFET DC and RF performances

IEEE transactions on electron devices, 2006-01, Vol.53 (5)

2006

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Study of nanoscale CMOS device and circuit reliability

Yu, Chuanzhao

2006

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RF performance degradation in pMOS transistors due to hot carrier and soft breakdown effects

Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004, 2004, p.309-310

2004

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Prevalence, Genotype Diversity, and Distinct Pathogenicity of 205 Gammacoronavirus Infectious Bronchitis Virus Isolates in China during 2019-2023

MOS RF reliability subject to dynamic voltage stress-modeling and analysis

Electrical and Temperature Stress Effects on Class-AB Power Amplifier Performances

A Nectin1 Mutant Mouse Model Is Resistant to Pseudorabies Virus Infection

[Formula Omitted] Gate Breakdown and Channel Hot Electron Effect on MOSFET Third-Order Intermodulation

Channel hot-electron degradation or 60-nm HfO2-gated nMOSFET DC and RF performances

hbox Gate Breakdown and Channel Hot Electron Effect on MOSFET Third-Order Intermodulation

CMOS device and circuit degradations subject to HfO2 gate breakdown and transient charge-trapping effect

A multiband multimode transmitter without driver amplifier

HfO2 Gate Breakdown and Channel Hot Electron Effect on MOSFET Third-Order Intermodulation

Establishment of a pig CRISPR/Cas9 knockout library for functional gene screening in pig cells

Activated mammalian target of rapamycin is associated with T regulatory cell insufficiency in nasal polyps

Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring

Dynamic voltage stress effects on nMOS varactor

Evaluation of RF Capacitance Extraction for Ultrathin Ultraleaky SOI MOS Devices

Dynamic stress-induced high-frequency noise degradations in nMOSFETs

Hot Carrier-Induced Degradation on High-K Trnasistors and Low Noise Amplifier

Voltage stress-induced hot carrier effects on SiGe HBT VCO

CMOS Device and Circuit Degradations Subject to \hbox Gate Breakdown and Transient Charge-Trapping Effect

RF reliability subject to dynamic voltage stress in NMOS circuits [power amplifier example]

Channel hot-electron degradation on 60-nm HfO/sub 2/-gated nMOSFET DC and RF performances

Analysis and modeling of LNA circuit reliability

Channel hot-electron degradation on 60-nm HfO sub(2)-gated nMOSFET DC and RF performances

Study of nanoscale CMOS device and circuit reliability

RF performance degradation in pMOS transistors due to hot carrier and soft breakdown effects

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